Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

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Title:

Author:

Im, Seongil. author.

ISBN:

9789400763920

Personal Author:

Edition:

1st ed. 2013.

Physical Description:

XI, 101 p. 61 illus. online resource.

Series:

SpringerBriefs in Physics,

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Electronic Access:

Library	Material Type	Item Barcode	Shelf Number	Status
Searching... Ferit Melen Library	E-Book	136057-1001	TK7867 -7867.5	Searching... Unknown