Search Results for Measurement.

Skip to:Search Results

|

|

|

|

|

|

|

Select Language

|

|

Remember to clear the cache and close the browser window.

Smiley

Search Limit

Rooms Restriction Values

15

Search Field

Target Value

Limit Value

Restriction Value

Search For:

Advanced Search

Limit Search Results

Narrowed by:

+

Subject: Condensed Matter Physics.

Author

SpringerLink (Online service)

(25)

Cullis, A.G. editor.

(2)

Czichos, Horst. editor.

(2)

Saito, Tetsuya. editor.

(2)

Smith, Leslie E. editor.

(2)

Annenkov, Alexander. author.

(1)

Baryshevsky, Vladimir G. author.

(1)

Beaurepaire, Eric. editor.

(1)

Bulou, Hervé. editor.

(1)

Chang, Youn-Gyoung. author.

(1)

Chhabildas, L.C. editor.

(1)

Davison, Lee. editor.

(1)

Ebrahim-Zadeh, Majid. editor.

(1)

Eckold, Götz. editor.

(1)

Feranchuk, Ilya D. author.

(1)

Fraissard, Jacques. editor.

(1)

Furetta, Claudio. author.

(1)

Gektin, Alexander. author.

(1)

Gektin, Alexander. editor.

(1)

Grinyov, Boris. editor.

(1)

Hawkes, P.W. editor.

(1)

Hellborg, Ragnar. editor.

(1)

Hering, Ekbert. author.

(1)

Holze, Rudolf. author.

(1)

Horie, Y. editor.

(1)

Hutchison, John L. editor.

(1)

Hüfner, Stephan. editor.

(1)

Im, Seongil. author.

(1)

Kalvius, Michael. editor.

(1)

Kappler, Jean Paul. editor.

(1)

Kienle, Paul. editor.

(1)

Kim, Jae Hoon. author.

(1)

Kitis, George. author.

(1)

Komorsky-Lovric, Sebojka. author.

(1)

Korzhik, Mikhail. author.

(1)

Lapina, Olga. editor.

(1)

Lecoq, Paul. author.

(1)

Lovric, Milivoj. author.

(1)

Martin, Rolf. author.

(1)

Midgley, P.A. editor.

(1)

Mirceski, Valentin. author.

(1)

Mitani, Tomoaki. author.

(1)

Molinar Min Beciet, Gianfranco. author.

(1)

Moses, William W. editor.

(1)

Nagler, Stephen E. editor.

(1)

Pagonis, Vasilis. author.

(1)

Pavese, Franco. author.

(1)

Pedrini, Christian. author.

(1)

Scheurer, Fabrice. editor.

(1)

Schober, Helmut. editor.

(1)

Shimizu, Kenichi. author.

(1)

Sorokina, Irina T. editor.

(1)

Spence, John C.H. editor.

(1)

Stohrer, Martin. author.

(1)

Tavernier, Stefaan. editor.

(1)

Ulyanenkov, Alexander P. author.

(1)

Verma, Hem Raj. author.

(1)

Whitlow, Harry J. editor.

(1)

Yoshimura, Nagamitsu. author.

(1)

Zhang, Yanwen. editor.

(1)

Language

(24)

(1)

Publication Date

-

(5)

(5)

(3)

(3)

(3)

(2)

(2)

(1)

(1)

Subject

Condensed matter.

(25)

Measurement Science and Instrumentation.

(25)

(25)

Measuring instruments.

(25)

(15)

Spectrum analysis.

(15)

Characterization and Analytical Technique.

(8)

Materials-Analysis.

(8)

(4)

Materials science.

(4)

Physical chemistry.

(4)

Technology and Engineering.

(4)

Accelerator Physics.

(3)

Atomic, Molecular and Chemical Physics.

(3)

(3)

(3)

Nanotechnology.

(3)

Particle accelerators.

(3)

(3)

Surfaces (Technology).

(3)

Surfaces, Interfaces and Thin Film.

(3)

(3)

Analytical chemistry.

(2)

(2)

Chemistry, Technical.

(2)

Classical and Continuum Physics.

(2)

Electronic Circuits and Systems.

(2)

Electronic circuits.

(2)

Electronics and Microelectronics, Instrumentation.

(2)

(2)

Industrial Chemistry.

(2)

Machines, Tools, Processes.

(2)

(2)

Mechanics, Applied.

(2)

Nuclear medicine.

(2)

(2)

Security Science and Technology.

(2)

Security systems.

(2)

Applied and Technical Physics.

(1)

Atomic and Molecular Structure and Properties.

(1)

Atomic structure .

(1)

Bioanalysis and Bioimaging.

(1)

Classical Electrodynamics.

(1)

Crystallography and Scattering Methods.

(1)

Crystallography.

(1)

Electrochemistry.

(1)

Electrodynamics.

(1)

Engineering Mechanics.

(1)

Engineering Thermodynamics, Heat and Mass Transfer.

(1)

Environmental chemistry.

(1)

Heat engineering.

(1)

(1)

(1)

(1)

(1)

Machinery and Machine Elements.

(1)

(1)

(1)

(1)

Mathematical physics.

(1)

Mechanical engineering.

(1)

Microelectromechanical systems.

(1)

Microsystems and MEMS.

(1)

Microtechnology.

(1)

Molecular structure .

(1)

Philosophical Foundations of Physics and Astronomy.

(1)

Physics-Philosophy.

(1)

Solid Mechanics.

(1)

(1)

Theoretical, Mathematical and Computational Physics.

(1)

Thermodynamics.

(1)

Material Type

Shelf Location

Springer E-Book Collection

Library

Ferit Melen Library

{sortLabel}

	{facetName}	{results}

	{displayName}	{count}
{error}

Switch to list view

Switch to thumbnail view

25 Results Found

Subscribe to search results

1 2 3

000000000000DEFAULT

Print

Select a list

Make this your default list.

The following items were successfully added.

There was an error while adding the following items. Please try again.

One or more items could not be added because you are not logged in.

13.

Cover image for Mid-Infrared Coherent Sources and Applications

Mid-Infrared Coherent Sources and Applications

Mid-Infrared Coherent Sources and Applications

by

Ebrahim-Zadeh, Majid. editor.

https://doi.org/10.1007/978-1-4020-6463-0

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:155468

14.

Cover image for Very High Resolution Photoelectron Spectroscopy

Very High Resolution Photoelectron Spectroscopy

Very High Resolution Photoelectron Spectroscopy

by

Hüfner, Stephan. editor.

https://doi.org/10.1007/3-540-68133-7

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:151027

15.

Cover image for Science of Microscopy

Science of Microscopy

Science of Microscopy

by

Hawkes, P.W. editor.

https://doi.org/10.1007/978-0-387-49762-4

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:153249

16.

Cover image for Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques

Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques

Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques

by

Verma, Hem Raj. author.

https://doi.org/10.1007/978-3-540-30279-7

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:163383

17.

Cover image for Square-Wave Voltammetry Theory and Application

Square-Wave Voltammetry Theory and Application

Square-Wave Voltammetry Theory and Application

by

Mirceski, Valentin. author.

https://doi.org/10.1007/978-3-540-73740-7

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:141336

18.

Cover image for Physik für Ingenieure

Physik für Ingenieure

Physik für Ingenieure

by

Hering, Ekbert. author.

https://doi.org/10.1007/978-3-540-71856-7

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:191296

19.

Cover image for Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering

Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering

Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering

by

Lecoq, Paul. author.

https://doi.org/10.1007/3-540-27768-4

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:162583

20.

Cover image for Magnetism: A Synchrotron Radiation Approach

Magnetism: A Synchrotron Radiation Approach

Magnetism: A Synchrotron Radiation Approach

by

Beaurepaire, Eric. editor.

https://doi.org/10.1007/b11594864

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:162160

21.

Cover image for Numerical and Practical Exercises in Thermoluminescence

Numerical and Practical Exercises in Thermoluminescence

Numerical and Practical Exercises in Thermoluminescence

by

Pagonis, Vasilis. author.

https://doi.org/10.1007/0-387-30090-2

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:139563

22.

Cover image for Radiation Detectors for Medical Applications

Radiation Detectors for Medical Applications

Radiation Detectors for Medical Applications

by

Tavernier, Stefaan. editor.

https://doi.org/10.1007/1-4020-5093-3

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:140170

23.

Cover image for Parametric X-Ray Radiation in Crystals Theory, Experiment and Applications

Parametric X-Ray Radiation in Crystals Theory, Experiment and Applications

Parametric X-Ray Radiation in Crystals Theory, Experiment and Applications

by

Baryshevsky, Vladimir G. author.

https://doi.org/10.1007/b95327

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:151720

24.

Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

by

Cullis, A.G. editor.

https://doi.org/10.1007/3-540-31915-8

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:167149

1 2 3

Go to:Search Results

|

|

Copyright 2016 SirsiDynix - Portfolio Version 4.5 (36068)