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Subject: Condensed Matter Physics.

Author

SpringerLink (Online service)

(25)

Cullis, A.G. editor.

(2)

Czichos, Horst. editor.

(2)

Saito, Tetsuya. editor.

(2)

Smith, Leslie E. editor.

(2)

Annenkov, Alexander. author.

(1)

Baryshevsky, Vladimir G. author.

(1)

Beaurepaire, Eric. editor.

(1)

Bulou, Hervé. editor.

(1)

Chang, Youn-Gyoung. author.

(1)

Chhabildas, L.C. editor.

(1)

Davison, Lee. editor.

(1)

Ebrahim-Zadeh, Majid. editor.

(1)

Eckold, Götz. editor.

(1)

Feranchuk, Ilya D. author.

(1)

Fraissard, Jacques. editor.

(1)

Furetta, Claudio. author.

(1)

Gektin, Alexander. author.

(1)

Gektin, Alexander. editor.

(1)

Grinyov, Boris. editor.

(1)

Hawkes, P.W. editor.

(1)

Hellborg, Ragnar. editor.

(1)

Hering, Ekbert. author.

(1)

Holze, Rudolf. author.

(1)

Horie, Y. editor.

(1)

Hutchison, John L. editor.

(1)

Hüfner, Stephan. editor.

(1)

Im, Seongil. author.

(1)

Kalvius, Michael. editor.

(1)

Kappler, Jean Paul. editor.

(1)

Kienle, Paul. editor.

(1)

Kim, Jae Hoon. author.

(1)

Kitis, George. author.

(1)

Komorsky-Lovric, Sebojka. author.

(1)

Korzhik, Mikhail. author.

(1)

Lapina, Olga. editor.

(1)

Lecoq, Paul. author.

(1)

Lovric, Milivoj. author.

(1)

Martin, Rolf. author.

(1)

Midgley, P.A. editor.

(1)

Mirceski, Valentin. author.

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Mitani, Tomoaki. author.

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Molinar Min Beciet, Gianfranco. author.

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Moses, William W. editor.

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Subject

Condensed matter.

(25)

Measurement Science and Instrumentation.

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(25)

Measuring instruments.

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(15)

Spectrum analysis.

(15)

Characterization and Analytical Technique.

(8)

Materials-Analysis.

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(4)

Materials science.

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Physical chemistry.

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Technology and Engineering.

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Accelerator Physics.

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Atomic, Molecular and Chemical Physics.

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Nanotechnology.

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Particle accelerators.

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Surfaces (Technology).

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Surfaces, Interfaces and Thin Film.

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Analytical chemistry.

(2)

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Chemistry, Technical.

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Classical and Continuum Physics.

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Atomic and Molecular Structure and Properties.

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Atomic structure .

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Molecular structure .

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Philosophical Foundations of Physics and Astronomy.

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(1)

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13.

Cover image for Very High Resolution Photoelectron Spectroscopy

Very High Resolution Photoelectron Spectroscopy

Very High Resolution Photoelectron Spectroscopy

by

Hüfner, Stephan. editor.

https://doi.org/10.1007/3-540-68133-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:151027

14.

Cover image for Science of Microscopy

Science of Microscopy

Science of Microscopy

by

Hawkes, P.W. editor.

https://doi.org/10.1007/978-0-387-49762-4

Format:

Excerpt:

Measuring instruments.

SD_ILS:153249

15.

Cover image for Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques

Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques

Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques

by

Verma, Hem Raj. author.

https://doi.org/10.1007/978-3-540-30279-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:163383

16.

Cover image for Square-Wave Voltammetry Theory and Application

Square-Wave Voltammetry Theory and Application

Square-Wave Voltammetry Theory and Application

by

Mirceski, Valentin. author.

https://doi.org/10.1007/978-3-540-73740-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:141336

17.

Cover image for Physik für Ingenieure

Physik für Ingenieure

Physik für Ingenieure

by

Hering, Ekbert. author.

https://doi.org/10.1007/978-3-540-71856-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:191296

18.

Cover image for Springer Handbook of Materials Measurement Methods

Springer Handbook of Materials Measurement Methods

Springer Handbook of Materials Measurement Methods

by

Czichos, Horst. editor.

https://doi.org/10.1007/978-3-540-30300-8

Format:

Excerpt:

Measuring instruments.

SD_ILS:150185

19.

Cover image for Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering

Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering

Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering

by

Lecoq, Paul. author.

https://doi.org/10.1007/3-540-27768-4

Format:

Excerpt:

Measuring instruments.

SD_ILS:162583

20.

Cover image for Magnetism: A Synchrotron Radiation Approach

Magnetism: A Synchrotron Radiation Approach

Magnetism: A Synchrotron Radiation Approach

by

Beaurepaire, Eric. editor.

https://doi.org/10.1007/b11594864

Format:

Excerpt:

Measuring instruments.

SD_ILS:162160

21.

Cover image for Numerical and Practical Exercises in Thermoluminescence

Numerical and Practical Exercises in Thermoluminescence

Numerical and Practical Exercises in Thermoluminescence

by

Pagonis, Vasilis. author.

https://doi.org/10.1007/0-387-30090-2

Format:

Excerpt:

Measuring instruments.

SD_ILS:139563

22.

Cover image for Radiation Detectors for Medical Applications

Radiation Detectors for Medical Applications

Radiation Detectors for Medical Applications

by

Tavernier, Stefaan. editor.

https://doi.org/10.1007/1-4020-5093-3

Format:

Excerpt:

Measuring instruments.

SD_ILS:140170

23.

Cover image for Parametric X-Ray Radiation in Crystals Theory, Experiment and Applications

Parametric X-Ray Radiation in Crystals Theory, Experiment and Applications

Parametric X-Ray Radiation in Crystals Theory, Experiment and Applications

by

Baryshevsky, Vladimir G. author.

https://doi.org/10.1007/b95327

Format:

Excerpt:

Measuring instruments.

SD_ILS:151720

24.

Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

by

Cullis, A.G. editor.

https://doi.org/10.1007/3-540-31915-8

Format:

Excerpt:

Measuring instruments.

SD_ILS:167149

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