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Publication Date: 2007

Author

SpringerLink (Online service)

(23)

Byrnes, Jim. editor.

(1)

Cesarsky, C. editor.

(1)

Costisella, Burkhard. author.

(1)

Desaintfuscien, M. author.

(1)

Diamond, Ph. editor.

(1)

Drosg, Manfred. author.

(1)

Ellis, Darwin V. author.

(1)

Gabriel, Kamiel S. author.

(1)

Hawkes, P.W. editor.

(1)

Hering, Ekbert. author.

(1)

Hoekstra, Alfons. editor.

(1)

Hugenschmidt, Manfred. author.

(1)

Hüfner, Stephan. editor.

(1)

Janulewicz, K.A. editor.

(1)

Kissler-Patig, Markus. editor.

(1)

Komorsky-Lovric, Sebojka. author.

(1)

Kompenhans, Jürgen. author.

(1)

Lobanov, A.P. editor.

(1)

Lovric, Milivoj. author.

(1)

Maltsev, Valeri. editor.

(1)

Martin, Rolf. author.

(1)

Mirceski, Valentin. author.

(1)

Mitchell, Terence N. author.

(1)

Nickles, P.V. editor.

(1)

Quadt, Arnulf. author.

(1)

Raffel, Markus. author. (orcid)0000-0002-3340-9115

(1)

Roth, Martin M. editor.

(1)

Salicone, Simona. author.

(1)

Singer, Julian M. author.

(1)

Spence, John C.H. editor.

(1)

Stohrer, Martin. author.

(1)

Verma, Hem Raj. author.

(1)

Videen, Gorden. editor.

(1)

Walsh, Jeremy. editor.

(1)

Wang, Zhong Lin. editor.

(1)

Wereley, Steven T. author.

(1)

Werner, Dirk. author.

(1)

Wiedemann, Helmut. author.

(1)

Willert, Christian E. author.

(1)

Zensus, J.A. editor.

(1)

Zhou, Weilie. editor.

(1)

Zudin, Yuri B. author.

(1)

Language

(20)

(3)

Subject

Measurement Science and Instrumentation.

(23)

(23)

Measuring instruments.

(23)

Condensed Matter Physics.

(5)

Condensed matter.

(5)

(4)

(4)

(4)

Technology and Engineering.

(4)

Analytical chemistry.

(3)

Atomic, Molecular and Chemical Physics.

(3)

Characterization and Analytical Technique.

(3)

(3)

(3)

Materials-Analysis.

(3)

(3)

Spectrum analysis.

(3)

(2)

Classical Electrodynamics.

(2)

Classical and Continuum Physics.

(2)

Electrodynamics.

(2)

(2)

Physical chemistry.

(2)

(2)

Thermodynamics.

(2)

Accelerator Physics.

(1)

(1)

Astronomy, Cosmology and Space Sciences.

(1)

Astronomy, Observations and Techniques.

(1)

Astronomy-Observations.

(1)

(1)

Atomic and Molecular Structure and Properties.

(1)

Atomic structure .

(1)

Atoms and molecules in external fields.

(1)

Automotive engineering.

(1)

Bioanalysis and Bioimaging.

(1)

Chemistry, Organic.

(1)

Chemistry, Technical.

(1)

Classical and Quantum Gravity.

(1)

Cogeneration of electric power and heat.

(1)

Computational intelligence.

(1)

Computer Imaging, Vision, Pattern Recognition and Graphics.

(1)

Computer vision.

(1)

Continuum mechanics.

(1)

Electric power production.

(1)

Electrical Power Engineering.

(1)

Electrochemistry.

(1)

Electronics and Microelectronics, Instrumentation.

(1)

(1)

Elementary Particles, Quantum Field Theory.

(1)

Elementary particles (Physics).

(1)

Engineering Fluid Dynamics.

(1)

Engineering Thermodynamics, Heat and Mass Transfer.

(1)

Environmental chemistry.

(1)

Fluid mechanics.

(1)

(1)

(1)

Geotechnical Engineering and Applied Earth Sciences.

(1)

Geotechnical engineering.

(1)

Global Analysis and Analysis on Manifolds.

(1)

Global analysis (Mathematics).

(1)

(1)

Heat engineering.

(1)

(1)

Humanities and Social Sciences.

(1)

(1)

Image processing-Digital techniques.

(1)

Industrial Chemistry.

(1)

Manifolds (Mathematics).

(1)

(1)

Mathematical analysis.

(1)

Measure and Integration.

(1)

Measure theory.

(1)

Mechanical Power Engineering.

(1)

(1)

Molecular structure .

(1)

Nanotechnology.

(1)

Nuclear Energy.

(1)

Nuclear and Particle Physics.

(1)

Nuclear engineering.

(1)

Nuclear physics.

(1)

Optical materials.

(1)

Organic Chemistry.

(1)

Particle accelerators.

(1)

Plasma (Ionized gases).

(1)

Plasma Physics.

(1)

(1)

Probability Theory.

(1)

Quantum field theory.

(1)

Quantum optics.

(1)

Signal processing.

(1)

Signal, Speech and Image Processing .

(1)

Social sciences.

(1)

Statistics in Engineering, Physics, Computer Science, Chemistry and Earth Sciences.

(1)

(1)

Surfaces (Technology).

(1)

Surfaces, Interfaces and Thin Film.

(1)

(1)

Material Type

Shelf Location

Springer E-Book Collection

Library

Ferit Melen Library

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13.

Cover image for Dealing with Uncertainties A Guide to Error Analysis

Dealing with Uncertainties A Guide to Error Analysis

Dealing with Uncertainties A Guide to Error Analysis

by

Drosg, Manfred. author.

https://doi.org/10.1007/978-3-540-29608-9

Format:

Excerpt:

Measuring instruments.

SD_ILS:160319

14.

Cover image for X-Ray Lasers 2006 Proceedings of the 10th International Conference, August 20-25, 2006, Berlin, Germany

X-Ray Lasers 2006 Proceedings of the 10th International Conference, August 20-25, 2006, Berlin, Germany

X-Ray Lasers 2006 Proceedings of the 10th International Conference, August 20-25, 2006, Berlin, Germany

by

Nickles, P.V. editor.

https://doi.org/10.1007/978-1-4020-6018-2

Format:

Excerpt:

Measuring instruments.

SD_ILS:155387

15.

Cover image for Microgravity Two-phase Flow and Heat Transfer

Microgravity Two-phase Flow and Heat Transfer

Microgravity Two-phase Flow and Heat Transfer

by

Gabriel, Kamiel S. author.

https://doi.org/10.1007/1-4020-5143-3

Format:

Excerpt:

Measuring instruments.

SD_ILS:155164

16.

Cover image for Optics of Biological Particles

Optics of Biological Particles

Optics of Biological Particles

by

Hoekstra, Alfons. editor.

https://doi.org/10.1007/978-1-4020-5502-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:155259

17.

Cover image for Well Logging for Earth Scientists

Well Logging for Earth Scientists

Well Logging for Earth Scientists

by

Ellis, Darwin V. author.

https://doi.org/10.1007/978-1-4020-4602-5

Format:

Excerpt:

Measuring instruments.

SD_ILS:137325

18.

Cover image for Scanning Microscopy for Nanotechnology Techniques and Applications

Scanning Microscopy for Nanotechnology Techniques and Applications

Scanning Microscopy for Nanotechnology Techniques and Applications

by

Zhou, Weilie. editor.

https://doi.org/10.1007/978-0-387-39620-0

Format:

Excerpt:

Measuring instruments.

SD_ILS:139866

19.

Cover image for Square-Wave Voltammetry Theory and Application

Square-Wave Voltammetry Theory and Application

Square-Wave Voltammetry Theory and Application

by

Mirceski, Valentin. author.

https://doi.org/10.1007/978-3-540-73740-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:141336

20.

Cover image for Imaging for Detection and Identification

Imaging for Detection and Identification

Imaging for Detection and Identification

by

Byrnes, Jim. editor.

https://doi.org/10.1007/978-1-4020-5620-8

Format:

Excerpt:

Measuring instruments.

SD_ILS:141502

21.

Cover image for Lasermesstechnik Diagnostik der Kurzzeitphysik

Lasermesstechnik Diagnostik der Kurzzeitphysik

Lasermesstechnik Diagnostik der Kurzzeitphysik

by

Hugenschmidt, Manfred. author.

https://doi.org/10.1007/978-3-540-29921-9

Format:

Excerpt:

Measuring instruments.

SD_ILS:188944

22.

Cover image for Funktionalanalysis

Funktionalanalysis

Funktionalanalysis

by

Werner, Dirk. author.

https://doi.org/10.1007/978-3-540-72536-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:189294

23.

Cover image for Physik für Ingenieure

Physik für Ingenieure

Physik für Ingenieure

by

Hering, Ekbert. author.

https://doi.org/10.1007/978-3-540-71856-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:191296

1

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