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Subject: Electronics.

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SpringerLink (Online service)

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Cullis, A.G. editor.

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Hossain, Jahangir. editor.

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Mahmud, Apel. editor.

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Abdul Rahman, Mohd Syaifudin. author.

(1)

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Electronics and Microelectronics, Instrumentation.

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Measurement Science and Instrumentation.

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Measuring instruments.

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13.

Cover image for Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK

Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK

Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK

by

Cullis, A.G. editor.

https://doi.org/10.1007/978-1-4020-8615-1

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:143773

14.

Cover image for Particle Detection with Drift Chambers

Particle Detection with Drift Chambers

Particle Detection with Drift Chambers

by

Blum, Walter. author.

https://doi.org/10.1007/978-3-540-76684-1

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:163694

15.

Cover image for Electronic Circuits Handbook for Design and Application

Electronic Circuits Handbook for Design and Application

Electronic Circuits Handbook for Design and Application

by

Tietze, Ulrich. author.

https://doi.org/10.1007/978-3-540-78655-9

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:135138

16.

Cover image for Measurement Uncertainty An Approach via the Mathematical Theory of Evidence

Measurement Uncertainty An Approach via the Mathematical Theory of Evidence

Measurement Uncertainty An Approach via the Mathematical Theory of Evidence

by

Salicone, Simona. author.

https://doi.org/10.1007/978-0-387-46328-5

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:153128

17.

Cover image for Beam Instrumentation and Diagnostics

Beam Instrumentation and Diagnostics

Beam Instrumentation and Diagnostics

by

Strehl, Peter. author.

https://doi.org/10.1007/3-540-26404-3

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:149557

18.

Cover image for Pixel Detectors From Fundamentals to Applications

Pixel Detectors From Fundamentals to Applications

Pixel Detectors From Fundamentals to Applications

by

Rossi, Leonardo. author.

https://doi.org/10.1007/3-540-28333-1

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:160591

19.

Cover image for Geomagnetics for Aeronautical Safety A Case Study in and around the Balkans

Geomagnetics for Aeronautical Safety A Case Study in and around the Balkans

Geomagnetics for Aeronautical Safety A Case Study in and around the Balkans

by

Rasson, Jean L. editor.

https://doi.org/10.1007/978-1-4020-5025-1

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:137438

20.

Cover image for Precision Temperature Sensors in CMOS Technology

Precision Temperature Sensors in CMOS Technology

Precision Temperature Sensors in CMOS Technology

by

Pertijs, Micheal A.P. author.

https://doi.org/10.1007/1-4020-5258-8

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:141482

21.

Cover image for Intense Electron and Ion Beams

Intense Electron and Ion Beams

Intense Electron and Ion Beams

by

Molokovsky, Sergey Ivanovich. author.

https://doi.org/10.1007/3-540-28812-0

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:151618

22.

Cover image for Dynamic Characterisation of Analogue-to-Digital Converters

Dynamic Characterisation of Analogue-to-Digital Converters

Dynamic Characterisation of Analogue-to-Digital Converters

by

Dallet, Dominique. editor.

https://doi.org/10.1007/b136458

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:152283

23.

Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

by

Cullis, A.G. editor.

https://doi.org/10.1007/3-540-31915-8

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:167149

24.

Cover image for Microscale Diagnostic Techniques

Microscale Diagnostic Techniques

Microscale Diagnostic Techniques

by

Breuer, Kenny. editor.

https://doi.org/10.1007/b137604

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:146412

1

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