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Publication Date: 2005

Author

SpringerLink (Online service)

(35)

De Bièvre, Paul. editor.

(2)

Günzler, Helmut. editor.

(2)

Jähne, Bernd. author.

(2)

Alagumalai, Sivakumar. editor.

(1)

Ansari, Farhad. editor.

(1)

(1)

Barsanti, Laura. editor.

(1)

Baryshevsky, Vladimir G. author.

(1)

Basting, Dirk. editor.

(1)

Brandner, Wolfgang. editor.

(1)

Breuer, Kenny. editor.

(1)

Bundschuh, Manfred. author.

(1)

Cesarsky, Catherine. editor.

(1)

Cheng, K.S. editor.

(1)

Chhabildas, L.C. editor.

(1)

Cook, Wade D. author.

(1)

Cullis, A.G. editor.

(1)

Curtis, David D. editor.

(1)

Dallet, Dominique. editor.

(1)

Davison, Lee. editor.

(1)

Dovrolis, Constantinos. editor.

(1)

Dumke, Reiner. author.

(1)

Ebert, Christof. author.

(1)

Ehlers, Ulf-Daniel. editor.

(1)

Evangelista, Valtere. editor.

(1)

Fahrner, Wolfgang. editor.

(1)

Feranchuk, Ilya D. author.

(1)

George, Vanessa. editor.

(1)

Grabe, Michael. author.

(1)

Gualtieri, Paolo. editor.

(1)

Hellborg, Ragnar. editor.

(1)

Hierlemann, Andreas. author.

(1)

Horie, Y. editor.

(1)

Hungi, Njora. editor.

(1)

Hutchison, John L. editor.

(1)

Jüptner, Werner. author.

(1)

Kasper, Markus E. editor.

(1)

Kupfer, Klaus. editor.

(1)

Law, Beverly. editor.

(1)

Lee, Xuhui. editor.

(1)

Liu, Tianshu. author.

(1)

Machado da Silva, José. editor.

(1)

Marowsky, Gerd. editor.

(1)

Massman, William. editor.

(1)

Merzkirch, Wolfgang. editor.

(1)

Molokovsky, Sergey Ivanovich. author.

(1)

Passarelli, Vincenzo. editor.

(1)

Rabinovich, Semyon G. author.

(1)

Romero, Gustavo E. editor.

(1)

Rottman, G.J. editor.

(1)

Salama, Alberto. editor.

(1)

Schenkel, Peter. editor.

(1)

Schmietendorf, Andreas. author.

(1)

Schnars, Ulf. author.

(1)

Shapiro, Maurice M. editor.

(1)

Stanev, Todor. editor.

(1)

Steinberger, Jack. author.

(1)

Sullivan, John P. author.

(1)

Sushkov, Aleksandr Danilovich. author.

(1)

Ulyanenkov, Alexander P. author.

(1)

Wefel, John P. editor.

(1)

Woods, Tom. editor.

(1)

Zhu, Joe. author.

(1)

van der Linden, Wim J. author.

(1)

Language

(33)

(2)

(1)

Subject

Measurement Science and Instrumentation.

(25)

(25)

Measuring instruments.

(25)

Electronics and Microelectronics, Instrumentation.

(6)

(6)

(5)

(5)

Control engineering.

(5)

Control, Robotics, Automation.

(5)

(5)

(5)

Electrical and Electronic Engineering.

(4)

Electrical engineering.

(4)

Nuclear and Particle Physics.

(4)

Nuclear physics.

(4)

(4)

(4)

Telecommunication.

(4)

Accelerator Physics.

(3)

Analytical chemistry.

(3)

Astronomy, Cosmology and Space Sciences.

(3)

Atomic, Molecular and Chemical Physics.

(3)

(3)

Classical and Continuum Physics.

(3)

Computer vision.

(3)

Condensed Matter Physics.

(3)

Condensed matter.

(3)

(3)

(3)

Mechanics, Applied.

(3)

Microwaves, RF Engineering and Optical Communications.

(3)

(3)

Nanotechnology.

(3)

Particle accelerators.

(3)

Assessment and Testing.

(2)

Astronomy, Observations and Techniques.

(2)

Astronomy-Observations.

(2)

Classical Electrodynamics.

(2)

Educational tests and measurements.

(2)

Electrodynamics.

(2)

Electronic Circuits and Systems.

(2)

Electronic circuits.

(2)

Engineering Fluid Dynamics.

(2)

Engineering Mechanics.

(2)

(2)

(2)

Environmental Sciences.

(2)

Fluid mechanics.

(2)

Mechanical engineering.

(2)

Optical materials.

(2)

Physical chemistry.

(2)

Physics and Astronomy.

(2)

(2)

Signal processing.

(2)

Signal, Speech and Image Processing .

(2)

(2)

Spectrum analysis.

(2)

Technology and Engineering.

(2)

Advertising media planning.

(1)

Application software.

(1)

(1)

Atmospheric science.

(1)

Atomic and Molecular Structure and Properties.

(1)

Atomic structure .

(1)

Automotive engineering.

(1)

Bioanalysis and Bioimaging.

(1)

Bioinformatics.

(1)

Biomathematics.

(1)

(1)

Building Construction and Design.

(1)

Building Repair and Maintenance.

(1)

Building materials.

(1)

Buildings-Design and construction.

(1)

Buildings-Maintenance.

(1)

Buildings-Repair and reconstruction.

(1)

Business and Management.

(1)

(1)

Career development.

(1)

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(1)

(1)

Chemistry, Technical.

(1)

(1)

Civil engineering.

(1)

Communications Engineering, Networks.

(1)

Comparative education.

(1)

Computational and Systems Biology.

(1)

Computational intelligence.

(1)

Computer Communication Networks.

(1)

Computer and Information Systems Applications.

(1)

Computer networks .

(1)

Crystallography and Scattering Methods.

(1)

Crystallography.

(1)

(1)

Earth sciences.

(1)

(1)

(1)

Electronic data processing-Management.

(1)

Electronic digital computers-Evaluation.

(1)

Engineering Thermodynamics, Heat and Mass Transfer.

(1)

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(1)

(1)

Heat engineering.

(1)

(1)

(1)

(1)

Industrial Chemistry.

(1)

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(1)

Innovation and Technology Management.

(1)

Inorganic chemistry.

(1)

Interactive multimedia.

(1)

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(1)

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(1)

Kamu hizmetleri_Performans ölçümü

(1)

Kamu üniversiteleri_Türkiye

(1)

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(1)

(1)

Management science.

(1)

(1)

Materials science.

(1)

Mathematical Applications in Chemistry.

(1)

Mathematical and Computational Biology.

(1)

(1)

Media Planning.

(1)

Molecular structure .

(1)

Multibody Systems and Mechanical Vibrations.

(1)

Multibody systems.

(1)

Multimedia systems.

(1)

Operations Management.

(1)

Operations Research and Decision Theory.

(1)

Operations research.

(1)

(1)

(1)

Probability Theory.

(1)

Production management.

(1)

(1)

Public services_Performance measurement

(1)

Public universities_Turkish

(1)

Social sciences-Statistical methods.

(1)

Software engineering.

(1)

Statistics in Social Sciences, Humanities, Law, Education, Behavorial Sciences, Public Policy.

(1)

(1)

Surfaces (Technology).

(1)

Surfaces, Interfaces and Thin Film.

(1)

System Performance and Evaluation.

(1)

Technological innovations.

(1)

Thermodynamics.

(1)

(1)

Tiftik keçisi, Vücut ölçüleri, Tiftik verimi, Tiftik kalitesi,

(1)

(1)

(1)

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Springer E-Book Collection

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Library

Ferit Melen Library

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13.

Cover image for Dynamic Characterisation of Analogue-to-Digital Converters

Dynamic Characterisation of Analogue-to-Digital Converters

Dynamic Characterisation of Analogue-to-Digital Converters

by

Dallet, Dominique. editor.

https://doi.org/10.1007/b136458

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:152283

14.

Cover image for The Solar Radiation and Climate Experiment (SORCE) Mission Description and Early Results

The Solar Radiation and Climate Experiment (SORCE) Mission Description and Early Results

The Solar Radiation and Climate Experiment (SORCE) Mission Description and Early Results

by

Rottman, G.J. editor.

https://doi.org/10.1007/0-387-37625-9

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:153027

15.

Cover image for Linear Models for Optimal Test Design

Linear Models for Optimal Test Design

Linear Models for Optimal Test Design

by

van der Linden, Wim J. author.

https://doi.org/10.1007/0-387-29054-0

Format:

Excerpt:

Educational tests and measurements.

SD_ILS:152564

16.

Cover image for Electromagnetic Aquametry Electromagnetic Wave Interaction with Water and Moist Substances

Electromagnetic Aquametry Electromagnetic Wave Interaction with Water and Moist Substances

Electromagnetic Aquametry Electromagnetic Wave Interaction with Water and Moist Substances

by

Kupfer, Klaus. editor.

https://doi.org/10.1007/b137700

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:175110

17.

Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK

by

Cullis, A.G. editor.

https://doi.org/10.1007/3-540-31915-8

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:167149

18.

Cover image for Learning About Particles - 50 Privileged Years

Learning About Particles - 50 Privileged Years

Learning About Particles - 50 Privileged Years

by

Steinberger, Jack. author.

https://doi.org/10.1007/b138163

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:168288

19.

Cover image for Science with Adaptive Optics Proceedings of the ESO Workshop Held at Garching, Germany, 16-19 September 2003

Science with Adaptive Optics Proceedings of the ESO Workshop Held at Garching, Germany, 16-19 September 2003

Science with Adaptive Optics Proceedings of the ESO Workshop Held at Garching, Germany, 16-19 September 2003

by

Brandner, Wolfgang. editor.

https://doi.org/10.1007/b80350

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:145000

20.

Cover image for Microscale Diagnostic Techniques

Microscale Diagnostic Techniques

Microscale Diagnostic Techniques

by

Breuer, Kenny. editor.

https://doi.org/10.1007/b137604

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:146412

21.

Cover image for Fluid Mechanics of Flow Metering

Fluid Mechanics of Flow Metering

Fluid Mechanics of Flow Metering

by

Merzkirch, Wolfgang. editor.

https://doi.org/10.1007/b138000

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:164793

22.

Cover image for Pressure and Temperature Sensitive Paints

Pressure and Temperature Sensitive Paints

Pressure and Temperature Sensitive Paints

by

Liu, Tianshu. author.

https://doi.org/10.1007/b137841

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:158686

23.

Cover image for High-Pressure Shock Compression of Solids VIII The Science and Technology of High-Velocity Impact

High-Pressure Shock Compression of Solids VIII The Science and Technology of High-Velocity Impact

High-Pressure Shock Compression of Solids VIII The Science and Technology of High-Velocity Impact

by

Chhabildas, L.C. editor.

https://doi.org/10.1007/b138708

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:161415

24.

Cover image for Integrated Chemical Microsensor Systems in CMOS Technology

Integrated Chemical Microsensor Systems in CMOS Technology

Integrated Chemical Microsensor Systems in CMOS Technology

by

Hierlemann, Andreas. author.

https://doi.org/10.1007/b138987

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:156712

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