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Publication Date: 2011

Author

SpringerLink (Online service)

(21)

André, Michael P. editor.

(1)

Armenise, Mario N. author.

(1)

Briggs, Richard J. editor.

(1)

Brown, Robert. author.

(1)

Bucur, Voichita. editor.

(1)

Cannazza, Giuseppe. author.

(1)

Castellani, Leonardo. author.

(1)

Cataldo, Andrea. author.

(1)

Ciminelli, Caterina. author.

(1)

Colpi, Monica. editor.

(1)

Czichos, Horst. editor.

(1)

De Benedetto, Egidio. author.

(1)

Dell'Olio, Francesco. author.

(1)

Fischer-Cripps, Anthony C. author.

(1)

Fornaro, Giulia Alice. author.

(1)

Franceschini, Fiorenzo. author.

(1)

Galetto, Maurizio. author.

(1)

Gorini, Vittorio. editor.

(1)

Howard, John. editor.

(1)

Jones, Joie P. editor.

(1)

Kramer, T. author.

(1)

Leach, Richard. editor.

(1)

Lee, Hua. editor.

(1)

Maisano, Domenico. author.

(1)

Mastrogiacomo, Luca. author.

(1)

Matarrese, Sabino. editor.

(1)

Merci, Bart. editor.

(1)

Milman, Boris L. author.

(1)

Milone, Eugene F. editor.

(1)

Moschella, Ugo. editor.

(1)

Murashov, Vladimir. editor.

(1)

Passaro, Vittorio M. N. author.

(1)

Pralio, Barbara. author.

(1)

Proulx, Tom. author.

(1)

Proulx, Tom. editor.

(1)

Roekaerts, Dirk. editor.

(1)

SADIKI, AMSINI. editor.

(1)

Saito, Tetsuya. editor.

(1)

Schächter, Levi. author.

(1)

Smith, Leslie E. editor.

(1)

Sterken, C. editor.

(1)

Stollon, Neal. author.

(1)

Takayama, Ken. editor.

(1)

Vignati, Marco. author.

(1)

Xu, Xun. author.

(1)

Zhao, Y. author.

(1)

Language

(20)

(1)

Subject

Measurement Science and Instrumentation.

(21)

(21)

Measuring instruments.

(21)

Characterization and Analytical Technique.

(5)

Materials-Analysis.

(5)

Accelerator Physics.

(3)

Computer-Aided Engineering (CAD, CAE) and Design.

(3)

Computer-aided engineering.

(3)

Machines, Tools, Processes.

(3)

(3)

Microwaves, RF Engineering and Optical Communications.

(3)

Particle accelerators.

(3)

Telecommunication.

(3)

(2)

Chemistry, Technical.

(2)

Condensed matter.

(2)

Elementary Particles, Quantum Field Theory.

(2)

Elementary particles (Physics).

(2)

Industrial Chemistry.

(2)

Mathematical Modeling and Industrial Mathematics.

(2)

Mathematical models.

(2)

Mathematical physics.

(2)

Mechanics, Applied.

(2)

Nanotechnology.

(2)

Quantum field theory.

(2)

Theoretical, Mathematical and Computational Physics.

(2)

Acoustical engineering.

(1)

(1)

Aerospace Technology and Astronautics.

(1)

Aerospace engineering.

(1)

Analytical chemistry.

(1)

(1)

(1)

Biogeosciences.

(1)

Biomedical Engineering and Bioengineering.

(1)

Biomedical engineering.

(1)

Building materials.

(1)

Classical Electrodynamics.

(1)

Classical Mechanics.

(1)

Classical and Quantum Gravity.

(1)

Commercial law.

(1)

Condensed Matter Physics.

(1)

Electric power production.

(1)

Electrical Power Engineering.

(1)

Electrical and Electronic Engineering.

(1)

Electrical engineering.

(1)

Electrodynamics.

(1)

Electronic Circuits and Systems.

(1)

Electronic circuits.

(1)

Electronics and Microelectronics, Instrumentation.

(1)

(1)

Engineering Acoustics.

(1)

Engineering Fluid Dynamics.

(1)

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(1)

Engineering Thermodynamics, Heat and Mass Transfer.

(1)

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(1)

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(1)

Fluid mechanics.

(1)

Geographic information systems.

(1)

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(1)

(1)

Heat engineering.

(1)

(1)

Inorganic chemistry.

(1)

(1)

(1)

(1)

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(1)

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(1)

(1)

Phase Transitions and Multiphase Systems.

(1)

Physical chemistry.

(1)

Quantum physics.

(1)

Security Science and Technology.

(1)

Security systems.

(1)

Signal processing.

(1)

Signal, Speech and Image Processing .

(1)

Solid Mechanics.

(1)

(1)

(1)

Surfaces (Technology).

(1)

Surfaces, Interfaces and Thin Film.

(1)

Thermodynamics.

(1)

(1)

Material Type

Shelf Location

Springer E-Book Collection

Library

Ferit Melen Library

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1.

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Distributed Large-Scale Dimensional Metrology New Insights

by

Franceschini, Fiorenzo. author.

https://doi.org/10.1007/978-0-85729-543-9

Format:

Excerpt:

Measuring instruments.

SD_ILS:154690

2.

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Chemical Identification and its Quality Assurance

Chemical Identification and its Quality Assurance

by

Milman, Boris L. author.

https://doi.org/10.1007/978-3-642-15361-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:156791

3.

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Dark Matter and Dark Energy A Challenge for Modern Cosmology

Dark Matter and Dark Energy A Challenge for Modern Cosmology

by

Matarrese, Sabino. editor.

https://doi.org/10.1007/978-90-481-8685-3

Format:

Excerpt:

Measuring instruments.

SD_ILS:156954

4.

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Induction Accelerators

Induction Accelerators

by

Takayama, Ken. editor.

https://doi.org/10.1007/978-3-642-13917-8

Format:

Excerpt:

Measuring instruments.

SD_ILS:148522

5.

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Acoustical Imaging Volume 30

Acoustical Imaging Volume 30

by

André, Michael P. editor.

https://doi.org/10.1007/978-90-481-3255-3

Format:

Excerpt:

Measuring instruments.

SD_ILS:150046

6.

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Nanoindentation

by

Fischer-Cripps, Anthony C. author.

https://doi.org/10.1007/978-1-4419-9872-9

Format:

Excerpt:

Measuring instruments.

SD_ILS:150172

7.

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Nanotechnology Standards

Nanotechnology Standards

by

Murashov, Vladimir. editor.

https://doi.org/10.1007/978-1-4419-7853-0

Format:

Excerpt:

Measuring instruments.

SD_ILS:138409

8.

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On-Chip Instrumentation Design and Debug for Systems on Chip

by

Stollon, Neal. author.

https://doi.org/10.1007/978-1-4419-7563-8

Format:

Excerpt:

Measuring instruments.

SD_ILS:138455

9.

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Astronomical Photometry Past, Present, and Future

by

Milone, Eugene F. editor.

https://doi.org/10.1007/978-1-4419-8050-2

Format:

Excerpt:

Measuring instruments.

SD_ILS:138536

10.

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by

Merci, Bart. editor.

https://doi.org/10.1007/978-94-007-1409-0

Format:

Excerpt:

Measuring instruments.

SD_ILS:135613

11.

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by

Proulx, Tom. editor.

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Format:

Excerpt:

Measuring instruments.

SD_ILS:137936

12.

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Measuring instruments.

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