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Subject: Condensed Matter Physics.

Author

SpringerLink (Online service)

(25)

Cullis, A.G. editor.

(2)

Czichos, Horst. editor.

(2)

Saito, Tetsuya. editor.

(2)

Smith, Leslie E. editor.

(2)

Annenkov, Alexander. author.

(1)

Baryshevsky, Vladimir G. author.

(1)

Beaurepaire, Eric. editor.

(1)

Bulou, Hervé. editor.

(1)

Chang, Youn-Gyoung. author.

(1)

Chhabildas, L.C. editor.

(1)

Davison, Lee. editor.

(1)

Ebrahim-Zadeh, Majid. editor.

(1)

Eckold, Götz. editor.

(1)

Feranchuk, Ilya D. author.

(1)

Fraissard, Jacques. editor.

(1)

Furetta, Claudio. author.

(1)

Gektin, Alexander. author.

(1)

Gektin, Alexander. editor.

(1)

Grinyov, Boris. editor.

(1)

Hawkes, P.W. editor.

(1)

Hellborg, Ragnar. editor.

(1)

Hering, Ekbert. author.

(1)

Holze, Rudolf. author.

(1)

Horie, Y. editor.

(1)

Hutchison, John L. editor.

(1)

Hüfner, Stephan. editor.

(1)

Im, Seongil. author.

(1)

Kalvius, Michael. editor.

(1)

Kappler, Jean Paul. editor.

(1)

Kienle, Paul. editor.

(1)

Kim, Jae Hoon. author.

(1)

Kitis, George. author.

(1)

Komorsky-Lovric, Sebojka. author.

(1)

Korzhik, Mikhail. author.

(1)

Lapina, Olga. editor.

(1)

Lecoq, Paul. author.

(1)

Lovric, Milivoj. author.

(1)

Martin, Rolf. author.

(1)

Midgley, P.A. editor.

(1)

Mirceski, Valentin. author.

(1)

Mitani, Tomoaki. author.

(1)

Molinar Min Beciet, Gianfranco. author.

(1)

Moses, William W. editor.

(1)

Nagler, Stephen E. editor.

(1)

Pagonis, Vasilis. author.

(1)

Pavese, Franco. author.

(1)

Pedrini, Christian. author.

(1)

Scheurer, Fabrice. editor.

(1)

Schober, Helmut. editor.

(1)

Shimizu, Kenichi. author.

(1)

Sorokina, Irina T. editor.

(1)

Spence, John C.H. editor.

(1)

Stohrer, Martin. author.

(1)

Tavernier, Stefaan. editor.

(1)

Ulyanenkov, Alexander P. author.

(1)

Verma, Hem Raj. author.

(1)

Whitlow, Harry J. editor.

(1)

Yoshimura, Nagamitsu. author.

(1)

Zhang, Yanwen. editor.

(1)

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Subject

Condensed matter.

(25)

Measurement Science and Instrumentation.

(25)

(25)

Measuring instruments.

(25)

(15)

Spectrum analysis.

(15)

Characterization and Analytical Technique.

(8)

Materials-Analysis.

(8)

(4)

Materials science.

(4)

Physical chemistry.

(4)

Technology and Engineering.

(4)

Accelerator Physics.

(3)

Atomic, Molecular and Chemical Physics.

(3)

(3)

(3)

Nanotechnology.

(3)

Particle accelerators.

(3)

(3)

Surfaces (Technology).

(3)

Surfaces, Interfaces and Thin Film.

(3)

(3)

Analytical chemistry.

(2)

(2)

Chemistry, Technical.

(2)

Classical and Continuum Physics.

(2)

Electronic Circuits and Systems.

(2)

Electronic circuits.

(2)

Electronics and Microelectronics, Instrumentation.

(2)

(2)

Industrial Chemistry.

(2)

Machines, Tools, Processes.

(2)

(2)

Mechanics, Applied.

(2)

Nuclear medicine.

(2)

(2)

Security Science and Technology.

(2)

Security systems.

(2)

Applied and Technical Physics.

(1)

Atomic and Molecular Structure and Properties.

(1)

Atomic structure .

(1)

Bioanalysis and Bioimaging.

(1)

Classical Electrodynamics.

(1)

Crystallography and Scattering Methods.

(1)

Crystallography.

(1)

Electrochemistry.

(1)

Electrodynamics.

(1)

Engineering Mechanics.

(1)

Engineering Thermodynamics, Heat and Mass Transfer.

(1)

Environmental chemistry.

(1)

Heat engineering.

(1)

(1)

(1)

(1)

(1)

Machinery and Machine Elements.

(1)

(1)

(1)

(1)

Mathematical physics.

(1)

Mechanical engineering.

(1)

Microelectromechanical systems.

(1)

Microsystems and MEMS.

(1)

Microtechnology.

(1)

Molecular structure .

(1)

Philosophical Foundations of Physics and Astronomy.

(1)

Physics-Philosophy.

(1)

Solid Mechanics.

(1)

(1)

Theoretical, Mathematical and Computational Physics.

(1)

Thermodynamics.

(1)

Material Type

Shelf Location

Springer E-Book Collection

Library

Ferit Melen Library

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1.

Cover image for Modern Gas-Based Temperature and Pressure Measurements

Modern Gas-Based Temperature and Pressure Measurements

Modern Gas-Based Temperature and Pressure Measurements

by

Pavese, Franco. author.

https://doi.org/10.1007/978-1-4419-8282-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:138479

2.

Cover image for Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

by

Im, Seongil. author.

https://doi.org/10.1007/978-94-007-6392-0

Format:

Excerpt:

Measuring instruments.

SD_ILS:136057

3.

Cover image for The Rudolf Mössbauer Story His Scientific Work and Its Impact on Science and History

The Rudolf Mössbauer Story His Scientific Work and Its Impact on Science and History

The Rudolf Mössbauer Story His Scientific Work and Its Impact on Science and History

by

Kalvius, Michael. editor.

https://doi.org/10.1007/978-3-642-17952-5

Format:

Excerpt:

Measuring instruments.

SD_ILS:165841

4.

Cover image for Springer Handbook of Metrology and Testing

Springer Handbook of Metrology and Testing

Springer Handbook of Metrology and Testing

by

Czichos, Horst. editor.

https://doi.org/10.1007/978-3-642-16641-9

Format:

Excerpt:

Measuring instruments.

SD_ILS:172787

5.

Cover image for Studying Kinetics with Neutrons Prospects for Time-Resolved Neutron Scattering

Studying Kinetics with Neutrons Prospects for Time-Resolved Neutron Scattering

Studying Kinetics with Neutrons Prospects for Time-Resolved Neutron Scattering

by

Eckold, Götz. editor.

https://doi.org/10.1007/978-3-642-03309-4

Format:

Excerpt:

Measuring instruments.

SD_ILS:161070

6.

Cover image for New Horizons of Applied Scanning Electron Microscopy

New Horizons of Applied Scanning Electron Microscopy

New Horizons of Applied Scanning Electron Microscopy

by

Shimizu, Kenichi. author.

https://doi.org/10.1007/978-3-642-03160-1

Format:

Excerpt:

Measuring instruments.

SD_ILS:161940

7.

Cover image for Ion Beams in Nanoscience and Technology

Ion Beams in Nanoscience and Technology

Ion Beams in Nanoscience and Technology

by

Hellborg, Ragnar. editor.

https://doi.org/10.1007/978-3-642-00623-4

Format:

Excerpt:

Measuring instruments.

SD_ILS:167305

8.

Cover image for Explosives Detection using Magnetic and Nuclear Resonance Techniques

Explosives Detection using Magnetic and Nuclear Resonance Techniques

Explosives Detection using Magnetic and Nuclear Resonance Techniques

by

Fraissard, Jacques. editor.

https://doi.org/10.1007/978-90-481-3062-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:135389

9.

Cover image for Surface and Interface Analysis An Electrochemists Toolbox

Surface and Interface Analysis An Electrochemists Toolbox

Surface and Interface Analysis An Electrochemists Toolbox

by

Holze, Rudolf. author.

https://doi.org/10.1007/978-3-540-49829-2

Format:

Excerpt:

Measuring instruments.

SD_ILS:168721

10.

Cover image for Mid-Infrared Coherent Sources and Applications

Mid-Infrared Coherent Sources and Applications

Mid-Infrared Coherent Sources and Applications

by

Ebrahim-Zadeh, Majid. editor.

https://doi.org/10.1007/978-1-4020-6463-0

Format:

Excerpt:

Measuring instruments.

SD_ILS:155468

11.

Cover image for Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK

Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK

Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK

by

Cullis, A.G. editor.

https://doi.org/10.1007/978-1-4020-8615-1

Format:

Excerpt:

Measuring instruments.

SD_ILS:143773

12.

Cover image for Vacuum Technology Practice for Scientific Instruments

Vacuum Technology Practice for Scientific Instruments

Vacuum Technology Practice for Scientific Instruments

by

Yoshimura, Nagamitsu. author.

https://doi.org/10.1007/978-3-540-74433-7

Format:

Excerpt:

Measuring instruments.

SD_ILS:165538

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