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Subject: Lasers.

Author

SpringerLink (Online service)

(19)

Balkan, Naci. editor.

(1)

Basting, Dirk. editor.

(1)

Behrens, Christopher. author.

(1)

Bracco, Gianangelo. editor.

(1)

Brandner, Wolfgang. editor.

(1)

Bukshtab, Michael. author.

(1)

Byrnes, Jim. editor.

(1)

Cannazza, Giuseppe. author.

(1)

Cataldo, Andrea. author.

(1)

Chang, Youn-Gyoung. author.

(1)

De Benedetto, Egidio. author.

(1)

Demchenko, Alexander P. author.

(1)

Dohlus, Martin. author.

(1)

Dubowski, Jan J. editor.

(1)

Erko, Alexei. editor.

(1)

Foreman, Matthew R. author.

(1)

Fulda, Paul. author.

(1)

Holst, Bodil. editor.

(1)

Hugenschmidt, Manfred. author.

(1)

Idir, Mourad. editor.

(1)

Im, Seongil. author.

(1)

Janulewicz, K.A. editor.

(1)

Jüptner, Werner. author.

(1)

Kasper, Markus E. editor.

(1)

Kim, Jae Hoon. author.

(1)

Krist, Thomas. editor.

(1)

Marowsky, Gerd. editor.

(1)

Miao, Haixing. author.

(1)

Michette, Alan G. editor.

(1)

Nickles, P.V. editor.

(1)

Patane, Amalia. editor.

(1)

Rossbach, Jörg. author.

(1)

Schmüser, Peter. author.

(1)

Schnars, Ulf. author.

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Tanev, Stoyan. editor.

(1)

Zhang, Zhengji. author.

(1)

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Measurement Science and Instrumentation.

(19)

(19)

Measuring instruments.

(19)

(3)

(3)

Microwaves, RF Engineering and Optical Communications.

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(1)

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Optical materials.

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(1)

Quantum optics.

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Semiconductors.

(1)

Signal processing.

(1)

Signal, Speech and Image Processing .

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(1)

(1)

(1)

Spectrum analysis.

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Surface and Interface and Thin Film.

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(1)

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Springer E-Book Collection

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Ferit Melen Library

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1.

Cover image for Free-Electron Lasers in the Ultraviolet and X-Ray Regime Physical Principles, Experimental Results, Technical Realization

Free-Electron Lasers in the Ultraviolet and X-Ray Regime Physical Principles, Experimental Results, Technical Realization

Free-Electron Lasers in the Ultraviolet and X-Ray Regime Physical Principles, Experimental Results, Technical Realization

by

Schmüser, Peter. author.

https://doi.org/10.1007/978-3-319-04081-3

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:143293

2.

Cover image for Precision Interferometry in a New Shape Higher-order Laguerre-Gauss Modes for Gravitational Wave Detection

Precision Interferometry in a New Shape Higher-order Laguerre-Gauss Modes for Gravitational Wave Detection

Precision Interferometry in a New Shape Higher-order Laguerre-Gauss Modes for Gravitational Wave Detection

by

Fulda, Paul. author.

https://doi.org/10.1007/978-3-319-01375-6

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:159553

3.

Cover image for Surface Science Techniques

Surface Science Techniques

Surface Science Techniques

by

Bracco, Gianangelo. editor.

https://doi.org/10.1007/978-3-642-34243-1

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:158144

4.

Cover image for Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

by

Im, Seongil. author.

https://doi.org/10.1007/978-94-007-6392-0

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:136057

5.

Cover image for Exploring Macroscopic Quantum Mechanics in Optomechanical Devices

Exploring Macroscopic Quantum Mechanics in Optomechanical Devices

Exploring Macroscopic Quantum Mechanics in Optomechanical Devices

by

Miao, Haixing. author.

https://doi.org/10.1007/978-3-642-25640-0

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:148178

6.

Cover image for Semiconductor Research Experimental Techniques

Semiconductor Research Experimental Techniques

Semiconductor Research Experimental Techniques

by

Patane, Amalia. editor.

https://doi.org/10.1007/978-3-642-23351-7

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:160635

7.

Cover image for Applied Photometry, Radiometry, and Measurements of Optical Losses

Applied Photometry, Radiometry, and Measurements of Optical Losses

Applied Photometry, Radiometry, and Measurements of Optical Losses

by

Bukshtab, Michael. author.

https://doi.org/10.1007/978-94-007-2165-4

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:161340

8.

Cover image for Informational Limits in Optical Polarimetry and Vectorial Imaging

Informational Limits in Optical Polarimetry and Vectorial Imaging

Informational Limits in Optical Polarimetry and Vectorial Imaging

by

Foreman, Matthew R. author.

https://doi.org/10.1007/978-3-642-28528-8

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:162134

9.

Cover image for Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications

Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications

Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications

by

Cataldo, Andrea. author.

https://doi.org/10.1007/978-3-642-20233-9

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:177645

10.

Cover image for LDA Application Methods Laser Doppler Anemometry for Fluid Dynamics

LDA Application Methods Laser Doppler Anemometry for Fluid Dynamics

LDA Application Methods Laser Doppler Anemometry for Fluid Dynamics

by

Zhang, Zhengji. author.

https://doi.org/10.1007/978-3-642-13514-9

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:173275

11.

Cover image for Introduction to Fluorescence Sensing

Introduction to Fluorescence Sensing

Introduction to Fluorescence Sensing

by

Demchenko, Alexander P. author.

https://doi.org/10.1007/978-1-4020-9003-5

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:155780

12.

Cover image for Modern Developments in X-Ray and Neutron Optics

Modern Developments in X-Ray and Neutron Optics

Modern Developments in X-Ray and Neutron Optics

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Erko, Alexei. editor.

https://doi.org/10.1007/978-3-540-74561-7

Format:

Excerpt:

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SD_ILS:166467

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