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1. 
Cover image for Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK
Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK
by 
Cullis, A.G. editor.
https://doi.org/10.1007/978-1-4020-8615-1
Format: 
Excerpt: 
Measuring instruments.
2. 
Cover image for Vacuum Technology Practice for Scientific Instruments
Vacuum Technology Practice for Scientific Instruments
by 
Yoshimura, Nagamitsu. author.
https://doi.org/10.1007/978-3-540-74433-7
Format: 
Excerpt: 
Measuring instruments.
3. 
Cover image for Photon-based Nanoscience and Nanobiotechnology
Photon-based Nanoscience and Nanobiotechnology
by 
Dubowski, Jan J. editor.
https://doi.org/10.1007/978-1-4020-5523-2
Format: 
Excerpt: 
Measuring instruments.
4. 
Cover image for Material Properties under Intensive Dynamic Loading
Material Properties under Intensive Dynamic Loading
by 
Zhernokletov, Mikhail V. editor.
https://doi.org/10.1007/978-3-540-36845-8
Format: 
Excerpt: 
Measuring instruments.
5. 
Cover image for Magnetism: A Synchrotron Radiation Approach
Magnetism: A Synchrotron Radiation Approach
by 
Beaurepaire, Eric. editor.
https://doi.org/10.1007/b11594864
Format: 
Excerpt: 
Measuring instruments.
6. 
Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
by 
Cullis, A.G. editor.
https://doi.org/10.1007/3-540-31915-8
Format: 
Excerpt: 
Measuring instruments.
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