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1. 
Cover image for Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes
Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes
by 
Yoshimura, Nagamitsu. author.
https://doi.org/10.1007/978-4-431-54448-7
Format: 
Excerpt: 
Measurement Science and Instrumentation.
2. 
Cover image for Micro Metal Forming
Micro Metal Forming
by 
Vollertsen, Frank. editor.
https://doi.org/10.1007/978-3-642-30916-8
Format: 
Excerpt: 
Measurement Science and Instrumentation.
3. 
Cover image for Ellipsometry at the Nanoscale
Ellipsometry at the Nanoscale
by 
Losurdo, Maria. editor.
https://doi.org/10.1007/978-3-642-33956-1
Format: 
Excerpt: 
Measurement Science and Instrumentation.
4. 
Cover image for Precision Nanometrology Sensors and Measuring Systems for Nanomanufacturing
Precision Nanometrology Sensors and Measuring Systems for Nanomanufacturing
by 
Gao, Wei. author.
https://doi.org/10.1007/978-1-84996-254-4
Format: 
Excerpt: 
Measurement Science and Instrumentation.
5. 
Cover image for New Horizons of Applied Scanning Electron Microscopy
New Horizons of Applied Scanning Electron Microscopy
by 
Shimizu, Kenichi. author.
https://doi.org/10.1007/978-3-642-03160-1
Format: 
Excerpt: 
Measurement Science and Instrumentation.
6. 
Cover image for Nanoscale Devices - Fundamentals and Applications
Nanoscale Devices - Fundamentals and Applications
by 
Gross, Rudolf. editor.
https://doi.org/10.1007/978-1-4020-5107-4
Format: 
Excerpt: 
Measurement Science and Instrumentation.
7. 
Cover image for Photon-based Nanoscience and Nanobiotechnology
Photon-based Nanoscience and Nanobiotechnology
by 
Dubowski, Jan J. editor.
https://doi.org/10.1007/978-1-4020-5523-2
Format: 
Excerpt: 
Measurement Science and Instrumentation.
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