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1. 
Cover image for Nanotribology and Nanomechanics I Measurement Techniques and Nanomechanics
Nanotribology and Nanomechanics I Measurement Techniques and Nanomechanics
by 
Bhushan, Bharat. editor.
https://doi.org/10.1007/978-3-642-15283-2
Format: 
Excerpt: 
Nanotribology and Nanomechanics I Measurement Techniques and Nanomechanics / Bhushan, Bharat
2. 
Cover image for Macroscopic Matter Wave Interferometry
Macroscopic Matter Wave Interferometry
by 
Nimmrichter, Stefan. author.
https://doi.org/10.1007/978-3-319-07097-1
Format: 
Excerpt: 
Measurement Science and Instrumentation.
3. 
Cover image for Universe of Scales: From Nanotechnology to Cosmology Symposium in Honor of Minoru M. Freund
Universe of Scales: From Nanotechnology to Cosmology Symposium in Honor of Minoru M. Freund
by 
Freund, Friedemann. editor.
https://doi.org/10.1007/978-3-319-02207-9
Format: 
Excerpt: 
Measurement Science and Instrumentation.
4. 
Cover image for Electromigration Techniques Theory and Practice
Electromigration Techniques Theory and Practice
by 
Buszewski, Boguslaw. editor.
https://doi.org/10.1007/978-3-642-35043-6
Format: 
Excerpt: 
Measurement Science and Instrumentation.
5. 
Cover image for Magnetism and Synchrotron Radiation: Towards the Fourth Generation Light Sources Proceedings of the 6th International School "Synchrotron Radiation and Magnetism", Mittelwihr (France), 2012
Magnetism and Synchrotron Radiation: Towards the Fourth Generation Light Sources Proceedings of the 6th International School "Synchrotron Radiation and Magnetism", Mittelwihr (France), 2012
by 
Beaurepaire, Eric. editor.
https://doi.org/10.1007/978-3-319-03032-6
Format: 
Excerpt: 
Measurement Science and Instrumentation.
6. 
Cover image for Surface Science Techniques
Surface Science Techniques
by 
Bracco, Gianangelo. editor.
https://doi.org/10.1007/978-3-642-34243-1
Format: 
Excerpt: 
Measurement Science and Instrumentation.
7. 
Cover image for The Mie Theory Basics and Applications
The Mie Theory Basics and Applications
by 
Hergert, Wolfram. editor.
https://doi.org/10.1007/978-3-642-28738-1
Format: 
Excerpt: 
Measurement Science and Instrumentation.
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