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Subject: Thin films.

Author

SpringerLink (Online service)

(9)

Cain, Markys G. editor.

(1)

Gross, Rudolf. editor.

(1)

Haschke, Michael. author.

(1)

Hierlemann, Andreas. author.

(1)

Holze, Rudolf. author.

(1)

Hüfner, Stephan. editor.

(1)

Leach, Richard. editor.

(1)

Lechner, Barbara A. J. author.

(1)

Mitani, Tomoaki. author.

(1)

Shimizu, Kenichi. author.

(1)

Sidorenko, Anatolie. editor.

(1)

Tagirov, Lenar. editor.

(1)

Language

(9)

Publication Date

-

(3)

(1)

(1)

(1)

(1)

(1)

(1)

Subject

Measurement Science and Instrumentation.

(9)

(9)

Measuring instruments.

(9)

Surfaces (Technology).

(9)

Surfaces, Interfaces and Thin Film.

(9)

(4)

Spectrum analysis.

(4)

Characterization and Analytical Technique.

(3)

Condensed Matter Physics.

(3)

Condensed matter.

(3)

Materials-Analysis.

(3)

Nanotechnology.

(3)

Microelectromechanical systems.

(2)

Microsystems and MEMS.

(2)

Microtechnology.

(2)

Microwaves, RF Engineering and Optical Communications.

(2)

Physical chemistry.

(2)

Surface and Interface and Thin Film.

(2)

Surfaces (Physics).

(2)

Telecommunication.

(2)

Analytical chemistry.

(1)

(1)

Atomic and Molecular Structure and Properties.

(1)

Atomic structure .

(1)

Atomic, Molecular and Chemical Physics.

(1)

(1)

Ceramic materials.

(1)

(1)

Electronics and Microelectronics, Instrumentation.

(1)

(1)

Molecular structure .

(1)

(1)

Optical materials.

(1)

Physics and Astronomy.

(1)

(1)

Material Type

Shelf Location

Springer E-Book Collection

Library

Ferit Melen Library

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1.

Cover image for Optical Measurement of Surface Topography

Optical Measurement of Surface Topography

Optical Measurement of Surface Topography

by

Leach, Richard. editor.

https://doi.org/10.1007/978-3-642-12012-1

Format:

Excerpt:

Optical Measurement of Surface Topography Leach, Richard. editor.

SD_ILS:174403

2.

Cover image for Characterisation of Ferroelectric Bulk Materials and Thin Films

Characterisation of Ferroelectric Bulk Materials and Thin Films

Characterisation of Ferroelectric Bulk Materials and Thin Films

by

Cain, Markys G. editor.

https://doi.org/10.1007/978-1-4020-9311-1

Format:

Excerpt:

Springer Series in Measurement Science and Technology,

SD_ILS:137440

3.

Cover image for Studying Complex Surface Dynamical Systems Using Helium-3 Spin-Echo Spectroscopy

Studying Complex Surface Dynamical Systems Using Helium-3 Spin-Echo Spectroscopy

Studying Complex Surface Dynamical Systems Using Helium-3 Spin-Echo Spectroscopy

by

Lechner, Barbara A. J. author.

https://doi.org/10.1007/978-3-319-01180-6

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:160959

4.

Cover image for Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications

Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications

Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications

by

Haschke, Michael. author.

https://doi.org/10.1007/978-3-319-04864-2

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:143308

5.

Cover image for New Horizons of Applied Scanning Electron Microscopy

New Horizons of Applied Scanning Electron Microscopy

New Horizons of Applied Scanning Electron Microscopy

by

Shimizu, Kenichi. author.

https://doi.org/10.1007/978-3-642-03160-1

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:161940

6.

Cover image for Surface and Interface Analysis An Electrochemists Toolbox

Surface and Interface Analysis An Electrochemists Toolbox

Surface and Interface Analysis An Electrochemists Toolbox

by

Holze, Rudolf. author.

https://doi.org/10.1007/978-3-540-49829-2

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:168721

7.

Cover image for Very High Resolution Photoelectron Spectroscopy

Very High Resolution Photoelectron Spectroscopy

Very High Resolution Photoelectron Spectroscopy

by

Hüfner, Stephan. editor.

https://doi.org/10.1007/3-540-68133-7

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:151027

8.

Cover image for Nanoscale Devices - Fundamentals and Applications

Nanoscale Devices - Fundamentals and Applications

Nanoscale Devices - Fundamentals and Applications

by

Gross, Rudolf. editor.

https://doi.org/10.1007/978-1-4020-5107-4

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:155151

9.

Cover image for Integrated Chemical Microsensor Systems in CMOS Technology

Integrated Chemical Microsensor Systems in CMOS Technology

Integrated Chemical Microsensor Systems in CMOS Technology

by

Hierlemann, Andreas. author.

https://doi.org/10.1007/b138987

Format:

Excerpt:

Measurement Science and Instrumentation.

SD_ILS:156712

1

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