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1. 
Cover image for Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings
Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings
by 
Dumke, Reiner R. editor.
https://doi.org/10.1007/978-3-540-89403-2
Format: 
Excerpt: 
Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings / Dumke, Reiner R. editor.
2. 
Cover image for Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings
by 
Abran, Alain. editor.
https://doi.org/10.1007/978-3-642-05415-0
Format: 
Excerpt: 
Dumke, Reiner R. editor.
3. 
Cover image for Software Process and Product Measurement International Conference, IWSM-MENSURA 2007, Palma de Mallorca, Spain, November 5-8, 2007, Revised Papers
Software Process and Product Measurement International Conference, IWSM-MENSURA 2007, Palma de Mallorca, Spain, November 5-8, 2007, Revised Papers
by 
Cuadrado-Gallego, Juan J. editor.
https://doi.org/10.1007/978-3-540-85553-8
Format: 
Excerpt: 
Dumke, Reiner R. editor.
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