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1. 
Cover image for Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
by 
Walkosz, Weronika. author.
https://doi.org/10.1007/978-1-4419-7817-2
Format: 
Excerpt: 
Spectrum analysis.
2. 
Cover image for Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science
Frontiers of Ferroelectricity A Special Issue of the Journal of Materials Science
by 
Lang, Sidney B. author.
https://doi.org/10.1007/978-0-387-38039-1
Format: 
Excerpt: 
Spectrum analysis.
3. 
Cover image for Materials for Information Technology Devices, Interconnects and Packaging
Materials for Information Technology Devices, Interconnects and Packaging
by 
Zschech, Ehrenfried. editor.
https://doi.org/10.1007/1-84628-235-7
Format: 
Excerpt: 
Spectrum analysis.