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1. 
Cover image for Rheological and Seismic Properties of Solid-Melt Systems A Mechanical Spectroscopy Study
Rheological and Seismic Properties of Solid-Melt Systems A Mechanical Spectroscopy Study
by 
Chien, Su-Ying. author.
https://doi.org/10.1007/978-3-319-03098-2
Format: 
Excerpt: 
Spectrum analysis.
2. 
Cover image for Innovative Technological Materials Structural Properties by Neutron Scattering, Synchrotron Radiation and Modeling
Innovative Technological Materials Structural Properties by Neutron Scattering, Synchrotron Radiation and Modeling
by 
Skrzypek, Jacek J. editor.
https://doi.org/10.1007/978-3-642-12059-6
Format: 
Excerpt: 
Spectrum analysis.
3. 
Cover image for Nanoscale Magnetic Materials and Applications
Nanoscale Magnetic Materials and Applications
by 
Liu, J. Ping. editor.
https://doi.org/10.1007/978-0-387-85600-1
Format: 
Excerpt: 
Spectrum analysis.
4. 
Cover image for Charged Semiconductor Defects Structure, Thermodynamics and Diffusion
Charged Semiconductor Defects Structure, Thermodynamics and Diffusion
by 
Seebauer, Edmund G. author.
https://doi.org/10.1007/978-1-84882-059-3
Format: 
Excerpt: 
Spectrum analysis.
5. 
Cover image for Transmission Electron Microscopy A Textbook for Materials Science
Transmission Electron Microscopy A Textbook for Materials Science
by 
Williams, David B. author.
https://doi.org/10.1007/978-0-387-76501-3
Format: 
Excerpt: 
Spectrum analysis.
6. 
Cover image for Mikro- und Nanoskopie der Werkstoffe
Mikro- und Nanoskopie der Werkstoffe
by 
Hornbogen, Erhard. author.
https://doi.org/10.1007/978-3-540-89946-4
Format: 
Excerpt: 
Spectrum analysis.
7. 
Cover image for Fundamentals of Shock Wave Propagation in Solids
Fundamentals of Shock Wave Propagation in Solids
by 
Davison, Lee. author.
https://doi.org/10.1007/978-3-540-74569-3
Format: 
Excerpt: 
Spectrum analysis.
8. 
Cover image for Light Scattering and Nanoscale Surface Roughness
Light Scattering and Nanoscale Surface Roughness
by 
Maradudin, Alexei A. editor.
https://doi.org/10.1007/978-0-387-35659-4
Format: 
Excerpt: 
Spectrum analysis.