Search Results for Abran, Alain. - Narrowed by: Software engineering.SirsiDynix Enterprisehttp://librarycatalog.yyu.edu.tr/client/en_US/default/default/qu$003dAbran$00252C$002bAlain.$0026qf$003dSUBJECT$002509Subject$002509Software$002bengineering.$002509Software$002bengineering.$0026ps$003d300?dt=list2025-02-14T17:57:53ZSoftware Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedingsent://SD_ILS/0/SD_ILS:1423282025-02-14T17:57:53Z2025-02-14T17:57:53Zby Abran, Alain. editor.<br/><a href="https://doi.org/10.1007/978-3-642-05415-0">https://doi.org/10.1007/978-3-642-05415-0</a><br/>Format: Electronic Resources<br/>Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedingsent://SD_ILS/0/SD_ILS:1516432025-02-14T17:57:53Z2025-02-14T17:57:53Zby Dumke, Reiner R. editor.<br/><a href="https://doi.org/10.1007/978-3-540-89403-2">https://doi.org/10.1007/978-3-540-89403-2</a><br/>Format: Electronic Resources<br/>Software Process and Product Measurement International Conference, IWSM-MENSURA 2007, Palma de Mallorca, Spain, November 5-8, 2007, Revised Papersent://SD_ILS/0/SD_ILS:1778642025-02-14T17:57:53Z2025-02-14T17:57:53Zby Cuadrado-Gallego, Juan J. editor.<br/><a href="https://doi.org/10.1007/978-3-540-85553-8">https://doi.org/10.1007/978-3-540-85553-8</a><br/>Format: Electronic Resources<br/>