Search Results for Measurement. - Narrowed by: Condensed matter. SirsiDynix Enterprise http://librarycatalog.yyu.edu.tr/client/en_US/default/default/qu$003dMeasurement.$0026qf$003dSUBJECT$002509Subject$002509Condensed$002bmatter.$002509Condensed$002bmatter.$0026ic$003dtrue$0026ps$003d300?dt=list 2025-02-14T18:02:57Z Springer Handbook of Materials Measurement Methods ent://SD_ILS/0/SD_ILS:150185 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Czichos, Horst. editor.<br/><a href="https://doi.org/10.1007/978-3-540-30300-8">https://doi.org/10.1007/978-3-540-30300-8</a><br/>Format:&#160;Electronic Resources<br/> Nonlinear Analysis of Gas-Water/Oil-Water Two-Phase Flow in Complex Networks ent://SD_ILS/0/SD_ILS:170070 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Gao, Zhong-Ke. author.<br/><a href="https://doi.org/10.1007/978-3-642-38373-1">https://doi.org/10.1007/978-3-642-38373-1</a><br/>Format:&#160;Electronic Resources<br/> Experiments and Numerical Simulations of Turbulent Combustion of Diluted Sprays TCS 3: Third International Workshop on Turbulent Spray Combustion ent://SD_ILS/0/SD_ILS:156880 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Merci, Bart. editor.<br/><a href="https://doi.org/10.1007/978-3-319-04678-5">https://doi.org/10.1007/978-3-319-04678-5</a><br/>Format:&#160;Electronic Resources<br/> Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors ent://SD_ILS/0/SD_ILS:136057 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Im, Seongil. author.<br/><a href="https://doi.org/10.1007/978-94-007-6392-0">https://doi.org/10.1007/978-94-007-6392-0</a><br/>Format:&#160;Electronic Resources<br/> Modern Gas-Based Temperature and Pressure Measurements ent://SD_ILS/0/SD_ILS:138479 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Pavese, Franco. author.<br/><a href="https://doi.org/10.1007/978-1-4419-8282-7">https://doi.org/10.1007/978-1-4419-8282-7</a><br/>Format:&#160;Electronic Resources<br/> The Rudolf M&ouml;ssbauer Story His Scientific Work and Its Impact on Science and History ent://SD_ILS/0/SD_ILS:165841 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Kalvius, Michael. editor.<br/><a href="https://doi.org/10.1007/978-3-642-17952-5">https://doi.org/10.1007/978-3-642-17952-5</a><br/>Format:&#160;Electronic Resources<br/> Springer Handbook of Metrology and Testing ent://SD_ILS/0/SD_ILS:172787 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Czichos, Horst. editor.<br/><a href="https://doi.org/10.1007/978-3-642-16641-9">https://doi.org/10.1007/978-3-642-16641-9</a><br/>Format:&#160;Electronic Resources<br/> Experiments and Numerical Simulations of Diluted Spray Turbulent Combustion Proceedings of the 1st International Workshop on Turbulent Spray Combustion ent://SD_ILS/0/SD_ILS:135613 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Merci, Bart. editor.<br/><a href="https://doi.org/10.1007/978-94-007-1409-0">https://doi.org/10.1007/978-94-007-1409-0</a><br/>Format:&#160;Electronic Resources<br/> New Horizons of Applied Scanning Electron Microscopy ent://SD_ILS/0/SD_ILS:161940 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Shimizu, Kenichi. author.<br/><a href="https://doi.org/10.1007/978-3-642-03160-1">https://doi.org/10.1007/978-3-642-03160-1</a><br/>Format:&#160;Electronic Resources<br/> Ion Beams in Nanoscience and Technology ent://SD_ILS/0/SD_ILS:167305 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Hellborg, Ragnar. editor.<br/><a href="https://doi.org/10.1007/978-3-642-00623-4">https://doi.org/10.1007/978-3-642-00623-4</a><br/>Format:&#160;Electronic Resources<br/> Studying Kinetics with Neutrons Prospects for Time-Resolved Neutron Scattering ent://SD_ILS/0/SD_ILS:161070 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Eckold, G&ouml;tz. editor.<br/><a href="https://doi.org/10.1007/978-3-642-03309-4">https://doi.org/10.1007/978-3-642-03309-4</a><br/>Format:&#160;Electronic Resources<br/> Surface and Interface Analysis An Electrochemists Toolbox ent://SD_ILS/0/SD_ILS:168721 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Holze, Rudolf. author.<br/><a href="https://doi.org/10.1007/978-3-540-49829-2">https://doi.org/10.1007/978-3-540-49829-2</a><br/>Format:&#160;Electronic Resources<br/> Explosives Detection using Magnetic and Nuclear Resonance Techniques ent://SD_ILS/0/SD_ILS:135389 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Fraissard, Jacques. editor.<br/><a href="https://doi.org/10.1007/978-90-481-3062-7">https://doi.org/10.1007/978-90-481-3062-7</a><br/>Format:&#160;Electronic Resources<br/> Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK ent://SD_ILS/0/SD_ILS:143773 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Cullis, A.G. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-8615-1">https://doi.org/10.1007/978-1-4020-8615-1</a><br/>Format:&#160;Electronic Resources<br/> Vacuum Technology Practice for Scientific Instruments ent://SD_ILS/0/SD_ILS:165538 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Yoshimura, Nagamitsu. author.<br/><a href="https://doi.org/10.1007/978-3-540-74433-7">https://doi.org/10.1007/978-3-540-74433-7</a><br/>Format:&#160;Electronic Resources<br/> Mid-Infrared Coherent Sources and Applications ent://SD_ILS/0/SD_ILS:155468 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Ebrahim-Zadeh, Majid. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-6463-0">https://doi.org/10.1007/978-1-4020-6463-0</a><br/>Format:&#160;Electronic Resources<br/> Very High Resolution Photoelectron Spectroscopy ent://SD_ILS/0/SD_ILS:151027 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;H&uuml;fner, Stephan. editor.<br/><a href="https://doi.org/10.1007/3-540-68133-7">https://doi.org/10.1007/3-540-68133-7</a><br/>Format:&#160;Electronic Resources<br/> Science of Microscopy ent://SD_ILS/0/SD_ILS:153249 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Hawkes, P.W. editor.<br/><a href="https://doi.org/10.1007/978-0-387-49762-4">https://doi.org/10.1007/978-0-387-49762-4</a><br/>Format:&#160;Electronic Resources<br/> Atomic and Nuclear Analytical Methods XRF, M&ouml;ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques ent://SD_ILS/0/SD_ILS:163383 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Verma, Hem Raj. author.<br/><a href="https://doi.org/10.1007/978-3-540-30279-7">https://doi.org/10.1007/978-3-540-30279-7</a><br/>Format:&#160;Electronic Resources<br/> Square-Wave Voltammetry Theory and Application ent://SD_ILS/0/SD_ILS:141336 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Mirceski, Valentin. author.<br/><a href="https://doi.org/10.1007/978-3-540-73740-7">https://doi.org/10.1007/978-3-540-73740-7</a><br/>Format:&#160;Electronic Resources<br/> Physik f&uuml;r Ingenieure ent://SD_ILS/0/SD_ILS:191296 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Hering, Ekbert. author.<br/><a href="https://doi.org/10.1007/978-3-540-71856-7">https://doi.org/10.1007/978-3-540-71856-7</a><br/>Format:&#160;Electronic Resources<br/> Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering ent://SD_ILS/0/SD_ILS:162583 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Lecoq, Paul. author.<br/><a href="https://doi.org/10.1007/3-540-27768-4">https://doi.org/10.1007/3-540-27768-4</a><br/>Format:&#160;Electronic Resources<br/> Magnetism: A Synchrotron Radiation Approach ent://SD_ILS/0/SD_ILS:162160 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Beaurepaire, Eric. editor.<br/><a href="https://doi.org/10.1007/b11594864">https://doi.org/10.1007/b11594864</a><br/>Format:&#160;Electronic Resources<br/> Numerical and Practical Exercises in Thermoluminescence ent://SD_ILS/0/SD_ILS:139563 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Pagonis, Vasilis. author.<br/><a href="https://doi.org/10.1007/0-387-30090-2">https://doi.org/10.1007/0-387-30090-2</a><br/>Format:&#160;Electronic Resources<br/> Radiation Detectors for Medical Applications ent://SD_ILS/0/SD_ILS:140170 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Tavernier, Stefaan. editor.<br/><a href="https://doi.org/10.1007/1-4020-5093-3">https://doi.org/10.1007/1-4020-5093-3</a><br/>Format:&#160;Electronic Resources<br/> Parametric X-Ray Radiation in Crystals Theory, Experiment and Applications ent://SD_ILS/0/SD_ILS:151720 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Baryshevsky, Vladimir G. author.<br/><a href="https://doi.org/10.1007/b95327">https://doi.org/10.1007/b95327</a><br/>Format:&#160;Electronic Resources<br/> Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK ent://SD_ILS/0/SD_ILS:167149 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Cullis, A.G. editor.<br/><a href="https://doi.org/10.1007/3-540-31915-8">https://doi.org/10.1007/3-540-31915-8</a><br/>Format:&#160;Electronic Resources<br/> High-Pressure Shock Compression of Solids VIII The Science and Technology of High-Velocity Impact ent://SD_ILS/0/SD_ILS:161415 2025-02-14T18:02:57Z 2025-02-14T18:02:57Z by&#160;Chhabildas, L.C. editor.<br/><a href="https://doi.org/10.1007/b138708">https://doi.org/10.1007/b138708</a><br/>Format:&#160;Electronic Resources<br/>