Search Results for Measurement. - Narrowed by: Condensed matter.SirsiDynix Enterprisehttp://librarycatalog.yyu.edu.tr/client/en_US/default/default/qu$003dMeasurement.$0026qf$003dSUBJECT$002509Subject$002509Condensed$002bmatter.$002509Condensed$002bmatter.$0026ic$003dtrue$0026ps$003d300?dt=list2025-02-14T18:02:57ZSpringer Handbook of Materials Measurement Methodsent://SD_ILS/0/SD_ILS:1501852025-02-14T18:02:57Z2025-02-14T18:02:57Zby Czichos, Horst. editor.<br/><a href="https://doi.org/10.1007/978-3-540-30300-8">https://doi.org/10.1007/978-3-540-30300-8</a><br/>Format: Electronic Resources<br/>Nonlinear Analysis of Gas-Water/Oil-Water Two-Phase Flow in Complex Networksent://SD_ILS/0/SD_ILS:1700702025-02-14T18:02:57Z2025-02-14T18:02:57Zby Gao, Zhong-Ke. author.<br/><a href="https://doi.org/10.1007/978-3-642-38373-1">https://doi.org/10.1007/978-3-642-38373-1</a><br/>Format: Electronic Resources<br/>Experiments and Numerical Simulations of Turbulent Combustion of Diluted Sprays TCS 3: Third International Workshop on Turbulent Spray Combustionent://SD_ILS/0/SD_ILS:1568802025-02-14T18:02:57Z2025-02-14T18:02:57Zby Merci, Bart. editor.<br/><a href="https://doi.org/10.1007/978-3-319-04678-5">https://doi.org/10.1007/978-3-319-04678-5</a><br/>Format: Electronic Resources<br/>Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistorsent://SD_ILS/0/SD_ILS:1360572025-02-14T18:02:57Z2025-02-14T18:02:57Zby Im, Seongil. author.<br/><a href="https://doi.org/10.1007/978-94-007-6392-0">https://doi.org/10.1007/978-94-007-6392-0</a><br/>Format: Electronic Resources<br/>Modern Gas-Based Temperature and Pressure Measurementsent://SD_ILS/0/SD_ILS:1384792025-02-14T18:02:57Z2025-02-14T18:02:57Zby Pavese, Franco. author.<br/><a href="https://doi.org/10.1007/978-1-4419-8282-7">https://doi.org/10.1007/978-1-4419-8282-7</a><br/>Format: Electronic Resources<br/>The Rudolf Mössbauer Story His Scientific Work and Its Impact on Science and Historyent://SD_ILS/0/SD_ILS:1658412025-02-14T18:02:57Z2025-02-14T18:02:57Zby Kalvius, Michael. editor.<br/><a href="https://doi.org/10.1007/978-3-642-17952-5">https://doi.org/10.1007/978-3-642-17952-5</a><br/>Format: Electronic Resources<br/>Springer Handbook of Metrology and Testingent://SD_ILS/0/SD_ILS:1727872025-02-14T18:02:57Z2025-02-14T18:02:57Zby Czichos, Horst. editor.<br/><a href="https://doi.org/10.1007/978-3-642-16641-9">https://doi.org/10.1007/978-3-642-16641-9</a><br/>Format: Electronic Resources<br/>Experiments and Numerical Simulations of Diluted Spray Turbulent Combustion Proceedings of the 1st International Workshop on Turbulent Spray Combustionent://SD_ILS/0/SD_ILS:1356132025-02-14T18:02:57Z2025-02-14T18:02:57Zby Merci, Bart. editor.<br/><a href="https://doi.org/10.1007/978-94-007-1409-0">https://doi.org/10.1007/978-94-007-1409-0</a><br/>Format: Electronic Resources<br/>New Horizons of Applied Scanning Electron Microscopyent://SD_ILS/0/SD_ILS:1619402025-02-14T18:02:57Z2025-02-14T18:02:57Zby Shimizu, Kenichi. author.<br/><a href="https://doi.org/10.1007/978-3-642-03160-1">https://doi.org/10.1007/978-3-642-03160-1</a><br/>Format: Electronic Resources<br/>Ion Beams in Nanoscience and Technologyent://SD_ILS/0/SD_ILS:1673052025-02-14T18:02:57Z2025-02-14T18:02:57Zby Hellborg, Ragnar. editor.<br/><a href="https://doi.org/10.1007/978-3-642-00623-4">https://doi.org/10.1007/978-3-642-00623-4</a><br/>Format: Electronic Resources<br/>Studying Kinetics with Neutrons Prospects for Time-Resolved Neutron Scatteringent://SD_ILS/0/SD_ILS:1610702025-02-14T18:02:57Z2025-02-14T18:02:57Zby Eckold, Götz. editor.<br/><a href="https://doi.org/10.1007/978-3-642-03309-4">https://doi.org/10.1007/978-3-642-03309-4</a><br/>Format: Electronic Resources<br/>Surface and Interface Analysis An Electrochemists Toolboxent://SD_ILS/0/SD_ILS:1687212025-02-14T18:02:57Z2025-02-14T18:02:57Zby Holze, Rudolf. author.<br/><a href="https://doi.org/10.1007/978-3-540-49829-2">https://doi.org/10.1007/978-3-540-49829-2</a><br/>Format: Electronic Resources<br/>Explosives Detection using Magnetic and Nuclear Resonance Techniquesent://SD_ILS/0/SD_ILS:1353892025-02-14T18:02:57Z2025-02-14T18:02:57Zby Fraissard, Jacques. editor.<br/><a href="https://doi.org/10.1007/978-90-481-3062-7">https://doi.org/10.1007/978-90-481-3062-7</a><br/>Format: Electronic Resources<br/>Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UKent://SD_ILS/0/SD_ILS:1437732025-02-14T18:02:57Z2025-02-14T18:02:57Zby Cullis, A.G. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-8615-1">https://doi.org/10.1007/978-1-4020-8615-1</a><br/>Format: Electronic Resources<br/>Vacuum Technology Practice for Scientific Instrumentsent://SD_ILS/0/SD_ILS:1655382025-02-14T18:02:57Z2025-02-14T18:02:57Zby Yoshimura, Nagamitsu. author.<br/><a href="https://doi.org/10.1007/978-3-540-74433-7">https://doi.org/10.1007/978-3-540-74433-7</a><br/>Format: Electronic Resources<br/>Mid-Infrared Coherent Sources and Applicationsent://SD_ILS/0/SD_ILS:1554682025-02-14T18:02:57Z2025-02-14T18:02:57Zby Ebrahim-Zadeh, Majid. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-6463-0">https://doi.org/10.1007/978-1-4020-6463-0</a><br/>Format: Electronic Resources<br/>Very High Resolution Photoelectron Spectroscopyent://SD_ILS/0/SD_ILS:1510272025-02-14T18:02:57Z2025-02-14T18:02:57Zby Hüfner, Stephan. editor.<br/><a href="https://doi.org/10.1007/3-540-68133-7">https://doi.org/10.1007/3-540-68133-7</a><br/>Format: Electronic Resources<br/>Science of Microscopyent://SD_ILS/0/SD_ILS:1532492025-02-14T18:02:57Z2025-02-14T18:02:57Zby Hawkes, P.W. editor.<br/><a href="https://doi.org/10.1007/978-0-387-49762-4">https://doi.org/10.1007/978-0-387-49762-4</a><br/>Format: Electronic Resources<br/>Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and Ion-Beam Spectroscopic Techniquesent://SD_ILS/0/SD_ILS:1633832025-02-14T18:02:57Z2025-02-14T18:02:57Zby Verma, Hem Raj. author.<br/><a href="https://doi.org/10.1007/978-3-540-30279-7">https://doi.org/10.1007/978-3-540-30279-7</a><br/>Format: Electronic Resources<br/>Square-Wave Voltammetry Theory and Applicationent://SD_ILS/0/SD_ILS:1413362025-02-14T18:02:57Z2025-02-14T18:02:57Zby Mirceski, Valentin. author.<br/><a href="https://doi.org/10.1007/978-3-540-73740-7">https://doi.org/10.1007/978-3-540-73740-7</a><br/>Format: Electronic Resources<br/>Physik für Ingenieureent://SD_ILS/0/SD_ILS:1912962025-02-14T18:02:57Z2025-02-14T18:02:57Zby Hering, Ekbert. author.<br/><a href="https://doi.org/10.1007/978-3-540-71856-7">https://doi.org/10.1007/978-3-540-71856-7</a><br/>Format: Electronic Resources<br/>Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineeringent://SD_ILS/0/SD_ILS:1625832025-02-14T18:02:57Z2025-02-14T18:02:57Zby Lecoq, Paul. author.<br/><a href="https://doi.org/10.1007/3-540-27768-4">https://doi.org/10.1007/3-540-27768-4</a><br/>Format: Electronic Resources<br/>Magnetism: A Synchrotron Radiation Approachent://SD_ILS/0/SD_ILS:1621602025-02-14T18:02:57Z2025-02-14T18:02:57Zby Beaurepaire, Eric. editor.<br/><a href="https://doi.org/10.1007/b11594864">https://doi.org/10.1007/b11594864</a><br/>Format: Electronic Resources<br/>Numerical and Practical Exercises in Thermoluminescenceent://SD_ILS/0/SD_ILS:1395632025-02-14T18:02:57Z2025-02-14T18:02:57Zby Pagonis, Vasilis. author.<br/><a href="https://doi.org/10.1007/0-387-30090-2">https://doi.org/10.1007/0-387-30090-2</a><br/>Format: Electronic Resources<br/>Radiation Detectors for Medical Applicationsent://SD_ILS/0/SD_ILS:1401702025-02-14T18:02:57Z2025-02-14T18:02:57Zby Tavernier, Stefaan. editor.<br/><a href="https://doi.org/10.1007/1-4020-5093-3">https://doi.org/10.1007/1-4020-5093-3</a><br/>Format: Electronic Resources<br/>Parametric X-Ray Radiation in Crystals Theory, Experiment and Applicationsent://SD_ILS/0/SD_ILS:1517202025-02-14T18:02:57Z2025-02-14T18:02:57Zby Baryshevsky, Vladimir G. author.<br/><a href="https://doi.org/10.1007/b95327">https://doi.org/10.1007/b95327</a><br/>Format: Electronic Resources<br/>Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UKent://SD_ILS/0/SD_ILS:1671492025-02-14T18:02:57Z2025-02-14T18:02:57Zby Cullis, A.G. editor.<br/><a href="https://doi.org/10.1007/3-540-31915-8">https://doi.org/10.1007/3-540-31915-8</a><br/>Format: Electronic Resources<br/>High-Pressure Shock Compression of Solids VIII The Science and Technology of High-Velocity Impactent://SD_ILS/0/SD_ILS:1614152025-02-14T18:02:57Z2025-02-14T18:02:57Zby Chhabildas, L.C. editor.<br/><a href="https://doi.org/10.1007/b138708">https://doi.org/10.1007/b138708</a><br/>Format: Electronic Resources<br/>