Search Results for Measurement. - Narrowed by: Thin films.
SirsiDynix Enterprise
http://librarycatalog.yyu.edu.tr/client/en_US/default/default/qu$003dMeasurement.$0026qf$003dSUBJECT$002509Subject$002509Thin$002bfilms.$002509Thin$002bfilms.$0026ps$003d300?dt=list
2025-02-07T07:08:35Z
Optical Measurement of Surface Topography
ent://SD_ILS/0/SD_ILS:174403
2025-02-07T07:08:35Z
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by Leach, Richard. editor.<br/><a href="https://doi.org/10.1007/978-3-642-12012-1">https://doi.org/10.1007/978-3-642-12012-1</a><br/>Format: Electronic Resources<br/>
Characterisation of Ferroelectric Bulk Materials and Thin Films
ent://SD_ILS/0/SD_ILS:137440
2025-02-07T07:08:35Z
2025-02-07T07:08:35Z
by Cain, Markys G. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-9311-1">https://doi.org/10.1007/978-1-4020-9311-1</a><br/>Format: Electronic Resources<br/>
Studying Complex Surface Dynamical Systems Using Helium-3 Spin-Echo Spectroscopy
ent://SD_ILS/0/SD_ILS:160959
2025-02-07T07:08:35Z
2025-02-07T07:08:35Z
by Lechner, Barbara A. J. author.<br/><a href="https://doi.org/10.1007/978-3-319-01180-6">https://doi.org/10.1007/978-3-319-01180-6</a><br/>Format: Electronic Resources<br/>
Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications
ent://SD_ILS/0/SD_ILS:143308
2025-02-07T07:08:35Z
2025-02-07T07:08:35Z
by Haschke, Michael. author.<br/><a href="https://doi.org/10.1007/978-3-319-04864-2">https://doi.org/10.1007/978-3-319-04864-2</a><br/>Format: Electronic Resources<br/>
New Horizons of Applied Scanning Electron Microscopy
ent://SD_ILS/0/SD_ILS:161940
2025-02-07T07:08:35Z
2025-02-07T07:08:35Z
by Shimizu, Kenichi. author.<br/><a href="https://doi.org/10.1007/978-3-642-03160-1">https://doi.org/10.1007/978-3-642-03160-1</a><br/>Format: Electronic Resources<br/>
Surface and Interface Analysis An Electrochemists Toolbox
ent://SD_ILS/0/SD_ILS:168721
2025-02-07T07:08:35Z
2025-02-07T07:08:35Z
by Holze, Rudolf. author.<br/><a href="https://doi.org/10.1007/978-3-540-49829-2">https://doi.org/10.1007/978-3-540-49829-2</a><br/>Format: Electronic Resources<br/>
Very High Resolution Photoelectron Spectroscopy
ent://SD_ILS/0/SD_ILS:151027
2025-02-07T07:08:35Z
2025-02-07T07:08:35Z
by Hüfner, Stephan. editor.<br/><a href="https://doi.org/10.1007/3-540-68133-7">https://doi.org/10.1007/3-540-68133-7</a><br/>Format: Electronic Resources<br/>
Nanoscale Devices - Fundamentals and Applications
ent://SD_ILS/0/SD_ILS:155151
2025-02-07T07:08:35Z
2025-02-07T07:08:35Z
by Gross, Rudolf. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-5107-4">https://doi.org/10.1007/978-1-4020-5107-4</a><br/>Format: Electronic Resources<br/>
Integrated Chemical Microsensor Systems in CMOS Technology
ent://SD_ILS/0/SD_ILS:156712
2025-02-07T07:08:35Z
2025-02-07T07:08:35Z
by Hierlemann, Andreas. author.<br/><a href="https://doi.org/10.1007/b138987">https://doi.org/10.1007/b138987</a><br/>Format: Electronic Resources<br/>