Search Results for Measuring instruments. SirsiDynix Enterprise http://librarycatalog.yyu.edu.tr/client/en_US/default/default/qu$003dMeasuring$002binstruments.$0026ic$003dtrue$0026ps$003d300?dt=list 2025-02-12T11:01:29Z High Impulse Voltage and Current Measurement Techniques Fundamentals - Measuring Instruments - Measuring Methods ent://SD_ILS/0/SD_ILS:168555 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Schon, Klaus. author.<br/><a href="https://doi.org/10.1007/978-3-319-00378-8">https://doi.org/10.1007/978-3-319-00378-8</a><br/>Format:&#160;Electronic Resources<br/> Rinoplasti ve rekonstr&uuml;ksiyon a&ccedil;&#305;s&#305;ndan geometrik morfometri y&ouml;ntemi ile burun &#351;eklinin analizi &quot;Van &ouml;rne&#287;i&quot; ent://SD_ILS/0/SD_ILS:131671 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Bayram, Semih, 1992-<br/>Format:&#160;Books<br/> Ortaokul fen bilimleri ders kitaplar&#305;nda yer alan etkinliklerin bilim, teknoloji, m&uuml;hendislik ve matematik yakla&#351;&#305;m&#305;na uygunlu&#287;unun incelenmesi ve &ouml;&#287;retmen g&ouml;r&uuml;&#351;leri ent://SD_ILS/0/SD_ILS:101887 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Tezcan,Gizem.<br/>Format:&#160;Books<br/> &#350;ebeke ve &ccedil;evresel ko&#351;ullar&#305;n g&uuml;ne&#351; enerji sistemleri &uuml;zerine etkileri ent://SD_ILS/0/SD_ILS:89359 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;&Ccedil;akmak, Serdal, 1973-<br/>Format:&#160;Books<br/> Experiments and Numerical Simulations of Turbulent Combustion of Diluted Sprays TCS 3: Third International Workshop on Turbulent Spray Combustion ent://SD_ILS/0/SD_ILS:156880 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Merci, Bart. editor.<br/><a href="https://doi.org/10.1007/978-3-319-04678-5">https://doi.org/10.1007/978-3-319-04678-5</a><br/>Format:&#160;Electronic Resources<br/> Introduzione al Laboratorio di Fisica Misure e Teoria delle Incertezze ent://SD_ILS/0/SD_ILS:157068 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Ciullo, Giuseppe. author.<br/><a href="https://doi.org/10.1007/978-88-470-5656-5">https://doi.org/10.1007/978-88-470-5656-5</a><br/>Format:&#160;Electronic Resources<br/> Jet Quenching in Relativistic Heavy Ion Collisions at the LHC ent://SD_ILS/0/SD_ILS:147521 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Angerami, Aaron. author.<br/><a href="https://doi.org/10.1007/978-3-319-01219-3">https://doi.org/10.1007/978-3-319-01219-3</a><br/>Format:&#160;Electronic Resources<br/> Dynamic Studies Through Control of Relaxation in NMR Spectroscopy ent://SD_ILS/0/SD_ILS:148705 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Salvi, Nicola. author.<br/><a href="https://doi.org/10.1007/978-3-319-06170-2">https://doi.org/10.1007/978-3-319-06170-2</a><br/>Format:&#160;Electronic Resources<br/> Time-Dependent CP Violation Measurements Analyses of Neutral B Meson to Double-Charm Decays at the Japanese Belle Experiment ent://SD_ILS/0/SD_ILS:151714 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;R&ouml;hrken, Markus. author.<br/><a href="https://doi.org/10.1007/978-3-319-00726-7">https://doi.org/10.1007/978-3-319-00726-7</a><br/>Format:&#160;Electronic Resources<br/> Free-Electron Lasers in the Ultraviolet and X-Ray Regime Physical Principles, Experimental Results, Technical Realization ent://SD_ILS/0/SD_ILS:143293 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Schm&uuml;ser, Peter. author.<br/><a href="https://doi.org/10.1007/978-3-319-04081-3">https://doi.org/10.1007/978-3-319-04081-3</a><br/>Format:&#160;Electronic Resources<br/> Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications ent://SD_ILS/0/SD_ILS:143308 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Haschke, Michael. author.<br/><a href="https://doi.org/10.1007/978-3-319-04864-2">https://doi.org/10.1007/978-3-319-04864-2</a><br/>Format:&#160;Electronic Resources<br/> Recent Advances in Automation, Robotics and Measuring Techniques ent://SD_ILS/0/SD_ILS:143405 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Szewczyk, Roman. editor.<br/><a href="https://doi.org/10.1007/978-3-319-05353-0">https://doi.org/10.1007/978-3-319-05353-0</a><br/>Format:&#160;Electronic Resources<br/> Balances Instruments, Manufacturers, History ent://SD_ILS/0/SD_ILS:145055 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Robens, Erich. author.<br/><a href="https://doi.org/10.1007/978-3-642-36447-1">https://doi.org/10.1007/978-3-642-36447-1</a><br/>Format:&#160;Electronic Resources<br/> Measurement Uncertainties in Science and Technology ent://SD_ILS/0/SD_ILS:145384 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Grabe, Michael. author.<br/><a href="https://doi.org/10.1007/978-3-319-04888-8">https://doi.org/10.1007/978-3-319-04888-8</a><br/>Format:&#160;Electronic Resources<br/> Robust Control for Grid Voltage Stability: High Penetration of Renewable Energy Interfacing Conventional and Renewable Power Generation Resources ent://SD_ILS/0/SD_ILS:139516 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hossain, Jahangir. author.<br/><a href="https://doi.org/10.1007/978-981-287-116-9">https://doi.org/10.1007/978-981-287-116-9</a><br/>Format:&#160;Electronic Resources<br/> Background Processes in the Electrostatic Spectrometers of the KATRIN Experiment ent://SD_ILS/0/SD_ILS:140664 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Mertens, Susanne. author.<br/><a href="https://doi.org/10.1007/978-3-319-01177-6">https://doi.org/10.1007/978-3-319-01177-6</a><br/>Format:&#160;Electronic Resources<br/> Standard Model Measurements with the ATLAS Detector Monte Carlo Simulations of the Tile Calorimeter and Measurement of the Z &rarr; &tau; &tau; Cross Section ent://SD_ILS/0/SD_ILS:140701 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Nov&aacute;kov&aacute;, Jana. author.<br/><a href="https://doi.org/10.1007/978-3-319-00810-3">https://doi.org/10.1007/978-3-319-00810-3</a><br/>Format:&#160;Electronic Resources<br/> Viscometry for Liquids Calibration of Viscometers ent://SD_ILS/0/SD_ILS:140801 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gupta, S. V. author.<br/><a href="https://doi.org/10.1007/978-3-319-04858-1">https://doi.org/10.1007/978-3-319-04858-1</a><br/>Format:&#160;Electronic Resources<br/> Fundamental Physics in Particle Traps ent://SD_ILS/0/SD_ILS:158166 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Quint, Wolfgang. editor.<br/><a href="https://doi.org/10.1007/978-3-642-45201-7">https://doi.org/10.1007/978-3-642-45201-7</a><br/>Format:&#160;Electronic Resources<br/> High-Voltage Test and Measuring Techniques ent://SD_ILS/0/SD_ILS:159475 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hauschild, Wolfgang. author.<br/><a href="https://doi.org/10.1007/978-3-642-45352-6">https://doi.org/10.1007/978-3-642-45352-6</a><br/>Format:&#160;Electronic Resources<br/> Precision Interferometry in a New Shape Higher-order Laguerre-Gauss Modes for Gravitational Wave Detection ent://SD_ILS/0/SD_ILS:159553 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Fulda, Paul. author.<br/><a href="https://doi.org/10.1007/978-3-319-01375-6">https://doi.org/10.1007/978-3-319-01375-6</a><br/>Format:&#160;Electronic Resources<br/> Top Quark Pair Production Precision Measurements of the Top Quark Pair Production Cross Section in the Single Lepton Channel with the ATLAS Experiment ent://SD_ILS/0/SD_ILS:160269 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Henrichs, Anna Christine. author.<br/><a href="https://doi.org/10.1007/978-3-319-01487-6">https://doi.org/10.1007/978-3-319-01487-6</a><br/>Format:&#160;Electronic Resources<br/> Large Scale Renewable Power Generation Advances in Technologies for Generation, Transmission and Storage ent://SD_ILS/0/SD_ILS:160555 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hossain, Jahangir. editor.<br/><a href="https://doi.org/10.1007/978-981-4585-30-9">https://doi.org/10.1007/978-981-4585-30-9</a><br/>Format:&#160;Electronic Resources<br/> Studying Complex Surface Dynamical Systems Using Helium-3 Spin-Echo Spectroscopy ent://SD_ILS/0/SD_ILS:160959 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Lechner, Barbara A. J. author.<br/><a href="https://doi.org/10.1007/978-3-319-01180-6">https://doi.org/10.1007/978-3-319-01180-6</a><br/>Format:&#160;Electronic Resources<br/> Ground-Based Aerosol Optical Depth Measurement Using Sunphotometers ent://SD_ILS/0/SD_ILS:136821 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Dayou, Jedol. author.<br/><a href="https://doi.org/10.1007/978-981-287-101-5">https://doi.org/10.1007/978-981-287-101-5</a><br/>Format:&#160;Electronic Resources<br/> Characterisation of Ferroelectric Bulk Materials and Thin Films ent://SD_ILS/0/SD_ILS:137440 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Cain, Markys G. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-9311-1">https://doi.org/10.1007/978-1-4020-9311-1</a><br/>Format:&#160;Electronic Resources<br/> Accelerator Physics at the Tevatron Collider ent://SD_ILS/0/SD_ILS:167540 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Lebedev, Valery. editor.<br/><a href="https://doi.org/10.1007/978-1-4939-0885-1">https://doi.org/10.1007/978-1-4939-0885-1</a><br/>Format:&#160;Electronic Resources<br/> The Euroschool on Exotic Beams, Vol. IV ent://SD_ILS/0/SD_ILS:167610 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Scheidenberger, Christoph. editor.<br/><a href="https://doi.org/10.1007/978-3-642-45141-6">https://doi.org/10.1007/978-3-642-45141-6</a><br/>Format:&#160;Electronic Resources<br/> Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes ent://SD_ILS/0/SD_ILS:169232 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Yoshimura, Nagamitsu. author.<br/><a href="https://doi.org/10.1007/978-4-431-54448-7">https://doi.org/10.1007/978-4-431-54448-7</a><br/>Format:&#160;Electronic Resources<br/> Nonlinear Analysis of Gas-Water/Oil-Water Two-Phase Flow in Complex Networks ent://SD_ILS/0/SD_ILS:170070 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gao, Zhong-Ke. author.<br/><a href="https://doi.org/10.1007/978-3-642-38373-1">https://doi.org/10.1007/978-3-642-38373-1</a><br/>Format:&#160;Electronic Resources<br/> Astronomical Measurement A Concise Guide ent://SD_ILS/0/SD_ILS:171738 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Lawrence, Andy. author.<br/><a href="https://doi.org/10.1007/978-3-642-39835-3">https://doi.org/10.1007/978-3-642-39835-3</a><br/>Format:&#160;Electronic Resources<br/> Dynamic Pulsed-Field-Gradient NMR ent://SD_ILS/0/SD_ILS:173890 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;S&oslash;rland, Geir Humborstad. author.<br/><a href="https://doi.org/10.1007/978-3-662-44500-6">https://doi.org/10.1007/978-3-662-44500-6</a><br/>Format:&#160;Electronic Resources<br/> Macroscopic Matter Wave Interferometry ent://SD_ILS/0/SD_ILS:174379 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Nimmrichter, Stefan. author.<br/><a href="https://doi.org/10.1007/978-3-319-07097-1">https://doi.org/10.1007/978-3-319-07097-1</a><br/>Format:&#160;Electronic Resources<br/> Theoretical Concepts of X-Ray Nanoscale Analysis Theory and Applications ent://SD_ILS/0/SD_ILS:174689 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Benediktovich, Andrei. author.<br/><a href="https://doi.org/10.1007/978-3-642-38177-5">https://doi.org/10.1007/978-3-642-38177-5</a><br/>Format:&#160;Electronic Resources<br/> Finite Sample Analysis in Quantum Estimation ent://SD_ILS/0/SD_ILS:162982 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Sugiyama, Takanori. author.<br/><a href="https://doi.org/10.1007/978-4-431-54777-8">https://doi.org/10.1007/978-4-431-54777-8</a><br/>Format:&#160;Electronic Resources<br/> Universe of Scales: From Nanotechnology to Cosmology Symposium in Honor of Minoru M. Freund ent://SD_ILS/0/SD_ILS:163501 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Freund, Friedemann. editor.<br/><a href="https://doi.org/10.1007/978-3-319-02207-9">https://doi.org/10.1007/978-3-319-02207-9</a><br/>Format:&#160;Electronic Resources<br/> Nuclear Reactions An Introduction ent://SD_ILS/0/SD_ILS:163998 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Paetz gen. Schieck, Hans. author.<br/><a href="https://doi.org/10.1007/978-3-642-53986-2">https://doi.org/10.1007/978-3-642-53986-2</a><br/>Format:&#160;Electronic Resources<br/> Longitudinal Double-Spin Asymmetry of Electrons from Heavy Flavor Decays in Polarized p + p Collisions at &radic;s = 200 GeV ent://SD_ILS/0/SD_ILS:166000 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Nakamura, Katsuro. author.<br/><a href="https://doi.org/10.1007/978-4-431-54616-0">https://doi.org/10.1007/978-4-431-54616-0</a><br/>Format:&#160;Electronic Resources<br/> Advanced Interferometers and the Search for Gravitational Waves Lectures from the First VESF School on Advanced Detectors for Gravitational Waves ent://SD_ILS/0/SD_ILS:176055 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Bassan, Massimo. editor.<br/><a href="https://doi.org/10.1007/978-3-319-03792-9">https://doi.org/10.1007/978-3-319-03792-9</a><br/>Format:&#160;Electronic Resources<br/> Renewable Energy Integration Challenges and Solutions ent://SD_ILS/0/SD_ILS:176606 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hossain, Jahangir. editor.<br/><a href="https://doi.org/10.1007/978-981-4585-27-9">https://doi.org/10.1007/978-981-4585-27-9</a><br/>Format:&#160;Electronic Resources<br/> Measuring Signal Generators Theory &amp; Design ent://SD_ILS/0/SD_ILS:177287 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Rybin, Yu. K. author.<br/><a href="https://doi.org/10.1007/978-3-319-02833-0">https://doi.org/10.1007/978-3-319-02833-0</a><br/>Format:&#160;Electronic Resources<br/> Heavy Neutral Particle Decays to Tau Pairs Detected with CMS in Proton Collisions at \sqrt{s} = 7TeV ent://SD_ILS/0/SD_ILS:177854 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Bachtis, Michail. author.<br/><a href="https://doi.org/10.1007/978-3-319-03257-3">https://doi.org/10.1007/978-3-319-03257-3</a><br/>Format:&#160;Electronic Resources<br/> Advancement in Sensing Technology New Developments and Practical Applications ent://SD_ILS/0/SD_ILS:147598 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Mukhopadhyay, Subhas Chandra. editor. (orcid)0000-0002-8600-5907<br/><a href="https://doi.org/10.1007/978-3-642-32180-1">https://doi.org/10.1007/978-3-642-32180-1</a><br/>Format:&#160;Electronic Resources<br/> Nondestructive Testing of Materials and Structures ent://SD_ILS/0/SD_ILS:147866 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;B&uuml;y&uuml;k&ouml;zt&uuml;rk, Oral. author.<br/><a href="https://doi.org/10.1007/978-94-007-0723-8">https://doi.org/10.1007/978-94-007-0723-8</a><br/>Format:&#160;Electronic Resources<br/> Micro Metal Forming ent://SD_ILS/0/SD_ILS:148553 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Vollertsen, Frank. editor.<br/><a href="https://doi.org/10.1007/978-3-642-30916-8">https://doi.org/10.1007/978-3-642-30916-8</a><br/>Format:&#160;Electronic Resources<br/> Introduction to Polarization Physics ent://SD_ILS/0/SD_ILS:151682 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Nurushev, Sandibek B. author.<br/><a href="https://doi.org/10.1007/978-3-642-32163-4">https://doi.org/10.1007/978-3-642-32163-4</a><br/>Format:&#160;Electronic Resources<br/> Electromigration Techniques Theory and Practice ent://SD_ILS/0/SD_ILS:143045 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Buszewski, Boguslaw. editor.<br/><a href="https://doi.org/10.1007/978-3-642-35043-6">https://doi.org/10.1007/978-3-642-35043-6</a><br/>Format:&#160;Electronic Resources<br/> Infrared Thermography for Thermo-Fluid-Dynamics ent://SD_ILS/0/SD_ILS:145612 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Astarita, Tommaso. author.<br/><a href="https://doi.org/10.1007/978-3-642-29508-9">https://doi.org/10.1007/978-3-642-29508-9</a><br/>Format:&#160;Electronic Resources<br/> Search for the Standard Model Higgs Boson in the H &rarr; ZZ &rarr; l + l - qq Decay Channel at CMS ent://SD_ILS/0/SD_ILS:145712 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Pandolfi, Francesco. author.<br/><a href="https://doi.org/10.1007/978-3-319-00903-2">https://doi.org/10.1007/978-3-319-00903-2</a><br/>Format:&#160;Electronic Resources<br/> Atmospheric Effects in Space Geodesy ent://SD_ILS/0/SD_ILS:147334 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;B&ouml;hm, Johannes. editor.<br/><a href="https://doi.org/10.1007/978-3-642-36932-2">https://doi.org/10.1007/978-3-642-36932-2</a><br/>Format:&#160;Electronic Resources<br/> Modern Gas-Based Temperature and Pressure Measurements ent://SD_ILS/0/SD_ILS:138479 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Pavese, Franco. author.<br/><a href="https://doi.org/10.1007/978-1-4419-8282-7">https://doi.org/10.1007/978-1-4419-8282-7</a><br/>Format:&#160;Electronic Resources<br/> Evaluating Measurement Accuracy A Practical Approach ent://SD_ILS/0/SD_ILS:139111 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Rabinovich, Semyon G. author.<br/><a href="https://doi.org/10.1007/978-1-4614-6717-5">https://doi.org/10.1007/978-1-4614-6717-5</a><br/>Format:&#160;Electronic Resources<br/> Computational Electromagnetics and Model-Based Inversion A Modern Paradigm for Eddy-Current Nondestructive Evaluation ent://SD_ILS/0/SD_ILS:139632 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Sabbagh, Harold A. author.<br/><a href="https://doi.org/10.1007/978-1-4419-8429-6">https://doi.org/10.1007/978-1-4419-8429-6</a><br/>Format:&#160;Electronic Resources<br/> Ultrasonic Fluid Quantity Measurement in Dynamic Vehicular Applications A Support Vector Machine Approach ent://SD_ILS/0/SD_ILS:140683 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Terzic, Jenny. author.<br/><a href="https://doi.org/10.1007/978-3-319-00633-8">https://doi.org/10.1007/978-3-319-00633-8</a><br/>Format:&#160;Electronic Resources<br/> Magnetism and Synchrotron Radiation: Towards the Fourth Generation Light Sources Proceedings of the 6th International School &quot;Synchrotron Radiation and Magnetism&quot;, Mittelwihr (France), 2012 ent://SD_ILS/0/SD_ILS:140747 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Beaurepaire, Eric. editor.<br/><a href="https://doi.org/10.1007/978-3-319-03032-6">https://doi.org/10.1007/978-3-319-03032-6</a><br/>Format:&#160;Electronic Resources<br/> Surface Science Techniques ent://SD_ILS/0/SD_ILS:158144 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Bracco, Gianangelo. editor.<br/><a href="https://doi.org/10.1007/978-3-642-34243-1">https://doi.org/10.1007/978-3-642-34243-1</a><br/>Format:&#160;Electronic Resources<br/> Ellipsometry at the Nanoscale ent://SD_ILS/0/SD_ILS:158361 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Losurdo, Maria. editor.<br/><a href="https://doi.org/10.1007/978-3-642-33956-1">https://doi.org/10.1007/978-3-642-33956-1</a><br/>Format:&#160;Electronic Resources<br/> Stochastic Cooling of Particle Beams ent://SD_ILS/0/SD_ILS:159499 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;M&ouml;hl, Dieter. author.<br/><a href="https://doi.org/10.1007/978-3-642-34979-9">https://doi.org/10.1007/978-3-642-34979-9</a><br/>Format:&#160;Electronic Resources<br/> Natural Gas Hydrates Experimental Techniques and Their Applications ent://SD_ILS/0/SD_ILS:160226 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Ye, Yuguang. editor.<br/><a href="https://doi.org/10.1007/978-3-642-31101-7">https://doi.org/10.1007/978-3-642-31101-7</a><br/>Format:&#160;Electronic Resources<br/> Photon Physics at the LHC A Measurement of Inclusive Isolated Prompt Photon Production at &radic;s = 7 TeV with the ATLAS Detector ent://SD_ILS/0/SD_ILS:160965 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hance, Michael. author.<br/><a href="https://doi.org/10.1007/978-3-642-33062-9">https://doi.org/10.1007/978-3-642-33062-9</a><br/>Format:&#160;Electronic Resources<br/> Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors ent://SD_ILS/0/SD_ILS:136057 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Im, Seongil. author.<br/><a href="https://doi.org/10.1007/978-94-007-6392-0">https://doi.org/10.1007/978-94-007-6392-0</a><br/>Format:&#160;Electronic Resources<br/> Three Great Tsunamis: Lisbon (1755), Sumatra-Andaman (2004) and Japan (2011) ent://SD_ILS/0/SD_ILS:167265 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gupta, Harsh K. author.<br/><a href="https://doi.org/10.1007/978-94-007-6576-4">https://doi.org/10.1007/978-94-007-6576-4</a><br/>Format:&#160;Electronic Resources<br/> Magnetic Resonance Imaging with Nonlinear Gradient Fields Signal Encoding and Image Reconstruction ent://SD_ILS/0/SD_ILS:168795 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Schultz, Gerrit. author.<br/><a href="https://doi.org/10.1007/978-3-658-01134-5">https://doi.org/10.1007/978-3-658-01134-5</a><br/>Format:&#160;Electronic Resources<br/> Giant Magnetoresistance (GMR) Sensors From Basis to State-of-the-Art Applications ent://SD_ILS/0/SD_ILS:172754 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Reig, Candid. author.<br/><a href="https://doi.org/10.1007/978-3-642-37172-1">https://doi.org/10.1007/978-3-642-37172-1</a><br/>Format:&#160;Electronic Resources<br/> Suzaku Studies of White Dwarf Stars and the Galactic X-ray Background Emission ent://SD_ILS/0/SD_ILS:173447 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Yuasa, Takayuki. author.<br/><a href="https://doi.org/10.1007/978-4-431-54219-3">https://doi.org/10.1007/978-4-431-54219-3</a><br/>Format:&#160;Electronic Resources<br/> Autonomous Sensor Networks Collective Sensing Strategies for Analytical Purposes ent://SD_ILS/0/SD_ILS:162768 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Filippini, Daniel. editor.<br/><a href="https://doi.org/10.1007/978-3-642-34648-4">https://doi.org/10.1007/978-3-642-34648-4</a><br/>Format:&#160;Electronic Resources<br/> Perfect/Complete Scattering Experiments Probing Quantum Mechanics on Atomic and Molecular Collisions and Coincidences ent://SD_ILS/0/SD_ILS:162948 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Kleinpoppen, Hans. author.<br/><a href="https://doi.org/10.1007/978-3-642-40514-3">https://doi.org/10.1007/978-3-642-40514-3</a><br/>Format:&#160;Electronic Resources<br/> Space-Time Reference Systems ent://SD_ILS/0/SD_ILS:165403 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Soffel, Michael. author.<br/><a href="https://doi.org/10.1007/978-3-642-30226-8">https://doi.org/10.1007/978-3-642-30226-8</a><br/>Format:&#160;Electronic Resources<br/> Metrology for Fire Experiments in Outdoor Conditions ent://SD_ILS/0/SD_ILS:176573 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Silvani, Xavier. author.<br/><a href="https://doi.org/10.1007/978-1-4614-7962-8">https://doi.org/10.1007/978-1-4614-7962-8</a><br/>Format:&#160;Electronic Resources<br/> Exploring Macroscopic Quantum Mechanics in Optomechanical Devices ent://SD_ILS/0/SD_ILS:148178 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Miao, Haixing. author.<br/><a href="https://doi.org/10.1007/978-3-642-25640-0">https://doi.org/10.1007/978-3-642-25640-0</a><br/>Format:&#160;Electronic Resources<br/> A Neural Network Approach to Fluid Quantity Measurement in Dynamic Environments ent://SD_ILS/0/SD_ILS:148868 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Terzic, Edin. author.<br/><a href="https://doi.org/10.1007/978-1-4471-4060-3">https://doi.org/10.1007/978-1-4471-4060-3</a><br/>Format:&#160;Electronic Resources<br/> Interventional Magnetic Resonance Imaging ent://SD_ILS/0/SD_ILS:143233 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Kahn, Thomas. editor.<br/><a href="https://doi.org/10.1007/978-3-642-20706-8">https://doi.org/10.1007/978-3-642-20706-8</a><br/>Format:&#160;Electronic Resources<br/> Bouguer Gravity Regional and Residual Separation Application to Geology and Environment ent://SD_ILS/0/SD_ILS:144418 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Mallick, K. author.<br/><a href="https://doi.org/10.1007/978-94-007-0406-0">https://doi.org/10.1007/978-94-007-0406-0</a><br/>Format:&#160;Electronic Resources<br/> Mass Metrology ent://SD_ILS/0/SD_ILS:145113 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gupta, S. V. author.<br/><a href="https://doi.org/10.1007/978-3-642-23412-5">https://doi.org/10.1007/978-3-642-23412-5</a><br/>Format:&#160;Electronic Resources<br/> Measurement Uncertainties Physical Parameters and Calibration of Instruments ent://SD_ILS/0/SD_ILS:146501 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gupta, S. V. author.<br/><a href="https://doi.org/10.1007/978-3-642-20989-5">https://doi.org/10.1007/978-3-642-20989-5</a><br/>Format:&#160;Electronic Resources<br/> Atomic Processes in Basic and Applied Physics ent://SD_ILS/0/SD_ILS:146910 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Shevelko, Viacheslav. editor.<br/><a href="https://doi.org/10.1007/978-3-642-25569-4">https://doi.org/10.1007/978-3-642-25569-4</a><br/>Format:&#160;Electronic Resources<br/> Measuring Technology and Mechatronics Automation in Electrical Engineering ent://SD_ILS/0/SD_ILS:138464 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hou, Zhixiang. editor.<br/><a href="https://doi.org/10.1007/978-1-4614-2185-6">https://doi.org/10.1007/978-1-4614-2185-6</a><br/>Format:&#160;Electronic Resources<br/> Modeling Nanoscale Imaging in Electron Microscopy ent://SD_ILS/0/SD_ILS:138553 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Vogt, Thomas. editor.<br/><a href="https://doi.org/10.1007/978-1-4614-2191-7">https://doi.org/10.1007/978-1-4614-2191-7</a><br/>Format:&#160;Electronic Resources<br/> The Dawn Mission to Minor Planets 4 Vesta and 1 Ceres ent://SD_ILS/0/SD_ILS:138822 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Russell, Christopher. editor.<br/><a href="https://doi.org/10.1007/978-1-4614-4903-4">https://doi.org/10.1007/978-1-4614-4903-4</a><br/>Format:&#160;Electronic Resources<br/> The Mie Theory Basics and Applications ent://SD_ILS/0/SD_ILS:142795 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hergert, Wolfram. editor.<br/><a href="https://doi.org/10.1007/978-3-642-28738-1">https://doi.org/10.1007/978-3-642-28738-1</a><br/>Format:&#160;Electronic Resources<br/> Nuclear Physics with Polarized Particles ent://SD_ILS/0/SD_ILS:158211 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Paetz gen. Schieck, Hans. author.<br/><a href="https://doi.org/10.1007/978-3-642-24226-7">https://doi.org/10.1007/978-3-642-24226-7</a><br/>Format:&#160;Electronic Resources<br/> Semiconductor Research Experimental Techniques ent://SD_ILS/0/SD_ILS:160635 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Patane, Amalia. editor.<br/><a href="https://doi.org/10.1007/978-3-642-23351-7">https://doi.org/10.1007/978-3-642-23351-7</a><br/>Format:&#160;Electronic Resources<br/> Applied Photometry, Radiometry, and Measurements of Optical Losses ent://SD_ILS/0/SD_ILS:161340 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Bukshtab, Michael. author.<br/><a href="https://doi.org/10.1007/978-94-007-2165-4">https://doi.org/10.1007/978-94-007-2165-4</a><br/>Format:&#160;Electronic Resources<br/> Informational Limits in Optical Polarimetry and Vectorial Imaging ent://SD_ILS/0/SD_ILS:162134 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Foreman, Matthew R. author.<br/><a href="https://doi.org/10.1007/978-3-642-28528-8">https://doi.org/10.1007/978-3-642-28528-8</a><br/>Format:&#160;Electronic Resources<br/> Handbook of Particle Detection and Imaging ent://SD_ILS/0/SD_ILS:168139 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Grupen, Claus. editor.<br/><a href="https://doi.org/10.1007/978-3-642-13271-1">https://doi.org/10.1007/978-3-642-13271-1</a><br/>Format:&#160;Electronic Resources<br/> Measurement of the Inclusive Jet Cross Section with the ATLAS Detector at the Large Hadron Collider ent://SD_ILS/0/SD_ILS:173619 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Doglioni, Caterina. author.<br/><a href="https://doi.org/10.1007/978-3-642-30538-2">https://doi.org/10.1007/978-3-642-30538-2</a><br/>Format:&#160;Electronic Resources<br/> A Search for Ultra-High Energy Neutrinos and Cosmic-Rays with ANITA-2 ent://SD_ILS/0/SD_ILS:174786 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Mottram, Matthew Joseph. author.<br/><a href="https://doi.org/10.1007/978-3-642-30032-5">https://doi.org/10.1007/978-3-642-30032-5</a><br/>Format:&#160;Electronic Resources<br/> Fundamentals of Mass Determination ent://SD_ILS/0/SD_ILS:175509 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Borys, Michael. author.<br/><a href="https://doi.org/10.1007/978-3-642-11937-8">https://doi.org/10.1007/978-3-642-11937-8</a><br/>Format:&#160;Electronic Resources<br/> Terminal Ballistics ent://SD_ILS/0/SD_ILS:162396 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Rosenberg, Zvi. author.<br/><a href="https://doi.org/10.1007/978-3-642-25305-8">https://doi.org/10.1007/978-3-642-25305-8</a><br/>Format:&#160;Electronic Resources<br/> Spin Squeezing and Non-linear Atom Interferometry with Bose-Einstein Condensates ent://SD_ILS/0/SD_ILS:164715 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gro&szlig;, Christian. author.<br/><a href="https://doi.org/10.1007/978-3-642-25637-0">https://doi.org/10.1007/978-3-642-25637-0</a><br/>Format:&#160;Electronic Resources<br/> The Rudolf M&ouml;ssbauer Story His Scientific Work and Its Impact on Science and History ent://SD_ILS/0/SD_ILS:165841 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Kalvius, Michael. editor.<br/><a href="https://doi.org/10.1007/978-3-642-17952-5">https://doi.org/10.1007/978-3-642-17952-5</a><br/>Format:&#160;Electronic Resources<br/> Automatische Sichtpr&uuml;fung Grundlagen, Methoden und Praxis der Bildgewinnung und Bildauswertung ent://SD_ILS/0/SD_ILS:182415 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Beyerer, J&uuml;rgen. author.<br/><a href="https://doi.org/10.1007/978-3-642-23966-3">https://doi.org/10.1007/978-3-642-23966-3</a><br/>Format:&#160;Electronic Resources<br/> Measurement and instrumentation : theory and application ent://SD_ILS/0/SD_ILS:198857 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Morris, Alan S., 1948-<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780123819604">https://www.sciencedirect.com/science/book/9780123819604</a> ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128008843">https://www.sciencedirect.com/science/book/9780128008843</a><br/>Format:&#160;Electronic Resources<br/> Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology. ent://SD_ILS/0/SD_ILS:199411 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Klapetek, Petr.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9781455730582">https://www.sciencedirect.com/science/book/9781455730582</a><br/>Format:&#160;Electronic Resources<br/> The Quality of Measurements A Metrological Reference ent://SD_ILS/0/SD_ILS:177022 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Fridman, A.E. author.<br/><a href="https://doi.org/10.1007/978-1-4614-1478-0">https://doi.org/10.1007/978-1-4614-1478-0</a><br/>Format:&#160;Electronic Resources<br/> Acoustical Imaging Volume 31 ent://SD_ILS/0/SD_ILS:177445 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Nowicki, Andrzej. editor.<br/><a href="https://doi.org/10.1007/978-94-007-2619-2">https://doi.org/10.1007/978-94-007-2619-2</a><br/>Format:&#160;Electronic Resources<br/> Digitale Bildverarbeitung und Bildgewinnung ent://SD_ILS/0/SD_ILS:186400 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;J&auml;hne, Bernd. author.<br/><a href="https://doi.org/10.1007/978-3-642-04952-1">https://doi.org/10.1007/978-3-642-04952-1</a><br/>Format:&#160;Electronic Resources<br/> Distributed Large-Scale Dimensional Metrology New Insights ent://SD_ILS/0/SD_ILS:154690 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Franceschini, Fiorenzo. author.<br/><a href="https://doi.org/10.1007/978-0-85729-543-9">https://doi.org/10.1007/978-0-85729-543-9</a><br/>Format:&#160;Electronic Resources<br/> Chemical Identification and its Quality Assurance ent://SD_ILS/0/SD_ILS:156791 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Milman, Boris L. author.<br/><a href="https://doi.org/10.1007/978-3-642-15361-7">https://doi.org/10.1007/978-3-642-15361-7</a><br/>Format:&#160;Electronic Resources<br/> Dark Matter and Dark Energy A Challenge for Modern Cosmology ent://SD_ILS/0/SD_ILS:156954 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Matarrese, Sabino. editor.<br/><a href="https://doi.org/10.1007/978-90-481-8685-3">https://doi.org/10.1007/978-90-481-8685-3</a><br/>Format:&#160;Electronic Resources<br/> Induction Accelerators ent://SD_ILS/0/SD_ILS:148522 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Takayama, Ken. editor.<br/><a href="https://doi.org/10.1007/978-3-642-13917-8">https://doi.org/10.1007/978-3-642-13917-8</a><br/>Format:&#160;Electronic Resources<br/> Acoustical Imaging Volume 30 ent://SD_ILS/0/SD_ILS:150046 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Andr&eacute;, Michael P. editor.<br/><a href="https://doi.org/10.1007/978-90-481-3255-3">https://doi.org/10.1007/978-90-481-3255-3</a><br/>Format:&#160;Electronic Resources<br/> Nanoindentation ent://SD_ILS/0/SD_ILS:150172 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Fischer-Cripps, Anthony C. author.<br/><a href="https://doi.org/10.1007/978-1-4419-9872-9">https://doi.org/10.1007/978-1-4419-9872-9</a><br/>Format:&#160;Electronic Resources<br/> Nanotechnology Standards ent://SD_ILS/0/SD_ILS:138409 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Murashov, Vladimir. editor.<br/><a href="https://doi.org/10.1007/978-1-4419-7853-0">https://doi.org/10.1007/978-1-4419-7853-0</a><br/>Format:&#160;Electronic Resources<br/> On-Chip Instrumentation Design and Debug for Systems on Chip ent://SD_ILS/0/SD_ILS:138455 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Stollon, Neal. author.<br/><a href="https://doi.org/10.1007/978-1-4419-7563-8">https://doi.org/10.1007/978-1-4419-7563-8</a><br/>Format:&#160;Electronic Resources<br/> Astronomical Photometry Past, Present, and Future ent://SD_ILS/0/SD_ILS:138536 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Milone, Eugene F. editor.<br/><a href="https://doi.org/10.1007/978-1-4419-8050-2">https://doi.org/10.1007/978-1-4419-8050-2</a><br/>Format:&#160;Electronic Resources<br/> Experiments and Numerical Simulations of Diluted Spray Turbulent Combustion Proceedings of the 1st International Workshop on Turbulent Spray Combustion ent://SD_ILS/0/SD_ILS:135613 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Merci, Bart. editor.<br/><a href="https://doi.org/10.1007/978-94-007-1409-0">https://doi.org/10.1007/978-94-007-1409-0</a><br/>Format:&#160;Electronic Resources<br/> Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics ent://SD_ILS/0/SD_ILS:137936 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Proulx, Tom. editor.<br/><a href="https://doi.org/10.1007/978-1-4614-0228-2">https://doi.org/10.1007/978-1-4614-0228-2</a><br/>Format:&#160;Electronic Resources<br/> Teletrasporto dalla fantascienza alla realt&agrave; ent://SD_ILS/0/SD_ILS:168214 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Castellani, Leonardo. author.<br/><a href="https://doi.org/10.1007/978-88-470-1614-9">https://doi.org/10.1007/978-88-470-1614-9</a><br/>Format:&#160;Electronic Resources<br/> Springer Handbook of Metrology and Testing ent://SD_ILS/0/SD_ILS:172787 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Czichos, Horst. editor.<br/><a href="https://doi.org/10.1007/978-3-642-16641-9">https://doi.org/10.1007/978-3-642-16641-9</a><br/>Format:&#160;Electronic Resources<br/> Information Modeling for Interoperable Dimensional Metrology ent://SD_ILS/0/SD_ILS:173688 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Zhao, Y. author.<br/><a href="https://doi.org/10.1007/978-1-4471-2167-1">https://doi.org/10.1007/978-1-4471-2167-1</a><br/>Format:&#160;Electronic Resources<br/> Optical Measurement of Surface Topography ent://SD_ILS/0/SD_ILS:174403 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Leach, Richard. editor.<br/><a href="https://doi.org/10.1007/978-3-642-12012-1">https://doi.org/10.1007/978-3-642-12012-1</a><br/>Format:&#160;Electronic Resources<br/> Beam-Wave Interaction in Periodic and Quasi-Periodic Structures ent://SD_ILS/0/SD_ILS:163377 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Sch&auml;chter, Levi. author.<br/><a href="https://doi.org/10.1007/978-3-642-19848-9">https://doi.org/10.1007/978-3-642-19848-9</a><br/>Format:&#160;Electronic Resources<br/> Model of the Response Function of CUORE Bolometers ent://SD_ILS/0/SD_ILS:164279 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Vignati, Marco. author.<br/><a href="https://doi.org/10.1007/978-94-007-1232-4">https://doi.org/10.1007/978-94-007-1232-4</a><br/>Format:&#160;Electronic Resources<br/> Delamination in Wood, Wood Products and Wood-Based Composites ent://SD_ILS/0/SD_ILS:165044 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Bucur, Voichita. editor.<br/><a href="https://doi.org/10.1007/978-90-481-9550-3">https://doi.org/10.1007/978-90-481-9550-3</a><br/>Format:&#160;Electronic Resources<br/> Thermomechanics and Infra-Red Imaging, Volume 7 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics ent://SD_ILS/0/SD_ILS:165209 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Proulx, Tom. author.<br/><a href="https://doi.org/10.1007/978-1-4614-0207-7">https://doi.org/10.1007/978-1-4614-0207-7</a><br/>Format:&#160;Electronic Resources<br/> Advances in Gyroscope Technologies ent://SD_ILS/0/SD_ILS:165924 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Armenise, Mario N. author.<br/><a href="https://doi.org/10.1007/978-3-642-15494-2">https://doi.org/10.1007/978-3-642-15494-2</a><br/>Format:&#160;Electronic Resources<br/> Broadband Reflectometry for Enhanced Diagnostics and Monitoring Applications ent://SD_ILS/0/SD_ILS:177645 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Cataldo, Andrea. author.<br/><a href="https://doi.org/10.1007/978-3-642-20233-9">https://doi.org/10.1007/978-3-642-20233-9</a><br/>Format:&#160;Electronic Resources<br/> Designing Quantitative Experiments Prediction Analysis ent://SD_ILS/0/SD_ILS:157049 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Wolberg, John. author.<br/><a href="https://doi.org/10.1007/978-3-642-11589-9">https://doi.org/10.1007/978-3-642-11589-9</a><br/>Format:&#160;Electronic Resources<br/> Sciences of Geodesy - I Advances and Future Directions ent://SD_ILS/0/SD_ILS:147665 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Xu, Guochang. editor.<br/><a href="https://doi.org/10.1007/978-3-642-11741-1">https://doi.org/10.1007/978-3-642-11741-1</a><br/>Format:&#160;Electronic Resources<br/> Introduction to Radiation Protection Practical Knowledge for Handling Radioactive Sources ent://SD_ILS/0/SD_ILS:145490 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Grupen, Claus. author.<br/><a href="https://doi.org/10.1007/978-3-642-02586-0">https://doi.org/10.1007/978-3-642-02586-0</a><br/>Format:&#160;Electronic Resources<br/> Evaluating Measurement Accuracy A Practical Approach ent://SD_ILS/0/SD_ILS:145857 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Rabinovich, Semyon G. author.<br/><a href="https://doi.org/10.1007/978-1-4419-1456-9">https://doi.org/10.1007/978-1-4419-1456-9</a><br/>Format:&#160;Electronic Resources<br/> Precision Nanometrology Sensors and Measuring Systems for Nanomanufacturing ent://SD_ILS/0/SD_ILS:146588 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gao, Wei. author.<br/><a href="https://doi.org/10.1007/978-1-84996-254-4">https://doi.org/10.1007/978-1-84996-254-4</a><br/>Format:&#160;Electronic Resources<br/> Watching Earth from Space How Surveillance Helps Us -- and Harms Us ent://SD_ILS/0/SD_ILS:138437 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Norris, Pat. author.<br/><a href="https://doi.org/10.1007/978-1-4419-6938-5">https://doi.org/10.1007/978-1-4419-6938-5</a><br/>Format:&#160;Electronic Resources<br/> Studying Kinetics with Neutrons Prospects for Time-Resolved Neutron Scattering ent://SD_ILS/0/SD_ILS:161070 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Eckold, G&ouml;tz. editor.<br/><a href="https://doi.org/10.1007/978-3-642-03309-4">https://doi.org/10.1007/978-3-642-03309-4</a><br/>Format:&#160;Electronic Resources<br/> New Horizons of Applied Scanning Electron Microscopy ent://SD_ILS/0/SD_ILS:161940 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Shimizu, Kenichi. author.<br/><a href="https://doi.org/10.1007/978-3-642-03160-1">https://doi.org/10.1007/978-3-642-03160-1</a><br/>Format:&#160;Electronic Resources<br/> Handbook of Modern Sensors Physics, Designs, and Applications ent://SD_ILS/0/SD_ILS:138208 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Fraden, Jacob. author.<br/><a href="https://doi.org/10.1007/978-1-4419-6466-3">https://doi.org/10.1007/978-1-4419-6466-3</a><br/>Format:&#160;Electronic Resources<br/> Ion Beams in Nanoscience and Technology ent://SD_ILS/0/SD_ILS:167305 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hellborg, Ragnar. editor.<br/><a href="https://doi.org/10.1007/978-3-642-00623-4">https://doi.org/10.1007/978-3-642-00623-4</a><br/>Format:&#160;Electronic Resources<br/> Experimental Techniques in Nuclear and Particle Physics ent://SD_ILS/0/SD_ILS:167950 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Tavernier, Stefaan. author.<br/><a href="https://doi.org/10.1007/978-3-642-00829-0">https://doi.org/10.1007/978-3-642-00829-0</a><br/>Format:&#160;Electronic Resources<br/> LDA Application Methods Laser Doppler Anemometry for Fluid Dynamics ent://SD_ILS/0/SD_ILS:173275 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Zhang, Zhengji. author.<br/><a href="https://doi.org/10.1007/978-3-642-13514-9">https://doi.org/10.1007/978-3-642-13514-9</a><br/>Format:&#160;Electronic Resources<br/> Units of Measurement Past, Present and Future. International System of Units ent://SD_ILS/0/SD_ILS:173286 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gupta, S. V. author.<br/><a href="https://doi.org/10.1007/978-3-642-00738-5">https://doi.org/10.1007/978-3-642-00738-5</a><br/>Format:&#160;Electronic Resources<br/> The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks ent://SD_ILS/0/SD_ILS:174335 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hebra, Alex. author.<br/><a href="https://doi.org/10.1007/978-3-211-78381-8">https://doi.org/10.1007/978-3-211-78381-8</a><br/>Format:&#160;Electronic Resources<br/> Fundamental principles of engineering nanometrology ent://SD_ILS/0/SD_ILS:197873 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Leach, R. K.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780080964546">https://www.sciencedirect.com/science/book/9780080964546</a> ScienceDirect <a href="https://www.sciencedirect.com/science/book/9781455777532">https://www.sciencedirect.com/science/book/9781455777532</a><br/>Format:&#160;Electronic Resources<br/> Hyperspectral imaging for food quality analysis and control ent://SD_ILS/0/SD_ILS:198035 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Sun, Da-Wen.<br/>ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780123747532">https://www.sciencedirect.com/science/book/9780123747532</a><br/>Format:&#160;Electronic Resources<br/> Colour measurement : principles, advances and industrial applications ent://SD_ILS/0/SD_ILS:198659 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gulrajani, M. L.<br/>ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781845695590">http://www.sciencedirect.com/science/book/9781845695590</a><br/>Format:&#160;Electronic Resources<br/> Electroanalytical Methods Guide to Experiments and Applications ent://SD_ILS/0/SD_ILS:177819 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Scholz, Fritz. editor.<br/><a href="https://doi.org/10.1007/978-3-642-02915-8">https://doi.org/10.1007/978-3-642-02915-8</a><br/>Format:&#160;Electronic Resources<br/> Statistische Versuchsplanung Design of Experiments (DoE) ent://SD_ILS/0/SD_ILS:180431 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Siebertz, Karl. author.<br/><a href="https://doi.org/10.1007/978-3-642-05493-8">https://doi.org/10.1007/978-3-642-05493-8</a><br/>Format:&#160;Electronic Resources<br/> The Principles of Astronomical Telescope Design ent://SD_ILS/0/SD_ILS:154251 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Cheng, Jingquan. author.<br/><a href="https://doi.org/10.1007/b105475">https://doi.org/10.1007/b105475</a><br/>Format:&#160;Electronic Resources<br/> Introduction to Fluorescence Sensing ent://SD_ILS/0/SD_ILS:155780 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Demchenko, Alexander P. author.<br/><a href="https://doi.org/10.1007/978-1-4020-9003-5">https://doi.org/10.1007/978-1-4020-9003-5</a><br/>Format:&#160;Electronic Resources<br/> Dealing with Uncertainties A Guide to Error Analysis ent://SD_ILS/0/SD_ILS:157151 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Drosg, Manfred. author.<br/><a href="https://doi.org/10.1007/978-3-642-01384-3">https://doi.org/10.1007/978-3-642-01384-3</a><br/>Format:&#160;Electronic Resources<br/> Computational Surface and Roundness Metrology ent://SD_ILS/0/SD_ILS:148280 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Muralikrishnan, Balasubramanian. author.<br/><a href="https://doi.org/10.1007/978-1-84800-297-5">https://doi.org/10.1007/978-1-84800-297-5</a><br/>Format:&#160;Electronic Resources<br/> Introduction to Plasma Spectroscopy ent://SD_ILS/0/SD_ILS:151648 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Kunze, Hans-Joachim. author.<br/><a href="https://doi.org/10.1007/978-3-642-02233-3">https://doi.org/10.1007/978-3-642-02233-3</a><br/>Format:&#160;Electronic Resources<br/> New Horizons in Occultation Research Studies in Atmosphere and Climate ent://SD_ILS/0/SD_ILS:146512 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Steiner, Andrea. editor.<br/><a href="https://doi.org/10.1007/978-3-642-00321-9">https://doi.org/10.1007/978-3-642-00321-9</a><br/>Format:&#160;Electronic Resources<br/> Infrasound Monitoring for Atmospheric Studies ent://SD_ILS/0/SD_ILS:141830 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Le Pichon, Alexis. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-9508-5">https://doi.org/10.1007/978-1-4020-9508-5</a><br/>Format:&#160;Electronic Resources<br/> New Techniques for the Detection of Nuclear and Radioactive Agents ent://SD_ILS/0/SD_ILS:141831 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Aycik, Gul Asiye. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-9600-6">https://doi.org/10.1007/978-1-4020-9600-6</a><br/>Format:&#160;Electronic Resources<br/> IUTAM Symposium on Unsteady Separated Flows and their Control Proceedings of the IUTAM Symposium &quot;Unsteady Separated Flows and their Control&quot;, Corfu, Greece, 18-22 June 2007 ent://SD_ILS/0/SD_ILS:141835 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Braza, Marianna. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-9898-7">https://doi.org/10.1007/978-1-4020-9898-7</a><br/>Format:&#160;Electronic Resources<br/> Applications of Synchrotron Light to Scattering and Diffraction in Materials and Life Sciences ent://SD_ILS/0/SD_ILS:158909 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Ezquerra, T.A. editor.<br/><a href="https://doi.org/10.1007/978-3-540-95968-7">https://doi.org/10.1007/978-3-540-95968-7</a><br/>Format:&#160;Electronic Resources<br/> Charged Particle Traps II Applications ent://SD_ILS/0/SD_ILS:159337 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Werth, G&uuml;nther. author.<br/><a href="https://doi.org/10.1007/978-3-540-92261-2">https://doi.org/10.1007/978-3-540-92261-2</a><br/>Format:&#160;Electronic Resources<br/> LEP - The Lord of the Collider Rings at CERN 1980-2000 The Making, Operation and Legacy of the World's Largest Scientific Instrument ent://SD_ILS/0/SD_ILS:161506 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Schopper, Herwig. author.<br/><a href="https://doi.org/10.1007/978-3-540-89301-1">https://doi.org/10.1007/978-3-540-89301-1</a><br/>Format:&#160;Electronic Resources<br/> Explosives Detection using Magnetic and Nuclear Resonance Techniques ent://SD_ILS/0/SD_ILS:135389 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Fraissard, Jacques. editor.<br/><a href="https://doi.org/10.1007/978-90-481-3062-7">https://doi.org/10.1007/978-90-481-3062-7</a><br/>Format:&#160;Electronic Resources<br/> The Euroschool Lectures on Physics with Exotic Beams, Vol. III ent://SD_ILS/0/SD_ILS:136827 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Al-Khalili, J.S. editor.<br/><a href="https://doi.org/10.1007/978-3-540-85839-3">https://doi.org/10.1007/978-3-540-85839-3</a><br/>Format:&#160;Electronic Resources<br/> Particle Size Measurements Fundamentals, Practice, Quality ent://SD_ILS/0/SD_ILS:137603 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Merkus, Henk G. author.<br/><a href="https://doi.org/10.1007/978-1-4020-9016-5">https://doi.org/10.1007/978-1-4020-9016-5</a><br/>Format:&#160;Electronic Resources<br/> Space Technologies for the Benefit of Human Society and Earth ent://SD_ILS/0/SD_ILS:137618 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Olla, Phillip. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-9573-3">https://doi.org/10.1007/978-1-4020-9573-3</a><br/>Format:&#160;Electronic Resources<br/> Multisensor Fusion and Integration for Intelligent Systems An Edition of the Selected Papers from the IEEE International Conference on Multisensor Fusion and Integration for Intelligent Systems 2008 ent://SD_ILS/0/SD_ILS:167944 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Suk-han, Lee. editor.<br/><a href="https://doi.org/10.1007/978-3-540-89859-7">https://doi.org/10.1007/978-3-540-89859-7</a><br/>Format:&#160;Electronic Resources<br/> Surface and Interface Analysis An Electrochemists Toolbox ent://SD_ILS/0/SD_ILS:168721 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Holze, Rudolf. author.<br/><a href="https://doi.org/10.1007/978-3-540-49829-2">https://doi.org/10.1007/978-3-540-49829-2</a><br/>Format:&#160;Electronic Resources<br/> Dictionary of Weighing Terms A Guide to the Terminology of Weighing ent://SD_ILS/0/SD_ILS:169392 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Nater, Roland. author.<br/><a href="https://doi.org/10.1007/978-3-642-02014-8">https://doi.org/10.1007/978-3-642-02014-8</a><br/>Format:&#160;Electronic Resources<br/> I capricci del caso Introduzione alla statistica, al calcolo della probabilit&agrave; e alla teoria degli errori ent://SD_ILS/0/SD_ILS:170755 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Piazza, Roberto. author.<br/><a href="https://doi.org/10.1007/978-88-470-1116-8">https://doi.org/10.1007/978-88-470-1116-8</a><br/>Format:&#160;Electronic Resources<br/> Light Scattering Reviews 4 Single Light Scattering and Radiative Transfer ent://SD_ILS/0/SD_ILS:172261 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Kokhanovsky, Alexander A. author.<br/><a href="https://doi.org/10.1007/978-3-540-74276-0">https://doi.org/10.1007/978-3-540-74276-0</a><br/>Format:&#160;Electronic Resources<br/> Physics at the Large Hadron Collider ent://SD_ILS/0/SD_ILS:174283 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Datta, Amitava. editor.<br/><a href="https://doi.org/10.1007/978-81-8489-295-6">https://doi.org/10.1007/978-81-8489-295-6</a><br/>Format:&#160;Electronic Resources<br/> High-Redshift Galaxies Light from the Early Universe ent://SD_ILS/0/SD_ILS:165378 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Appenzeller, Immo. author.<br/><a href="https://doi.org/10.1007/978-3-540-75824-2">https://doi.org/10.1007/978-3-540-75824-2</a><br/>Format:&#160;Electronic Resources<br/> Particle and Nuclear Physics at J-PARC ent://SD_ILS/0/SD_ILS:167123 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Sato, Takahiro. editor.<br/><a href="https://doi.org/10.1007/978-3-642-00961-7">https://doi.org/10.1007/978-3-642-00961-7</a><br/>Format:&#160;Electronic Resources<br/> Exploration Geophysics ent://SD_ILS/0/SD_ILS:167184 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gadallah, Mamdouh R. author.<br/><a href="https://doi.org/10.1007/978-3-540-85160-8">https://doi.org/10.1007/978-3-540-85160-8</a><br/>Format:&#160;Electronic Resources<br/> Springer Handbook of Experimental Solid Mechanics ent://SD_ILS/0/SD_ILS:152698 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Sharpe, Jr., William N. editor.<br/><a href="https://doi.org/10.1007/978-0-387-30877-7">https://doi.org/10.1007/978-0-387-30877-7</a><br/>Format:&#160;Electronic Resources<br/> Handbook of Signal Processing in Acoustics ent://SD_ILS/0/SD_ILS:152674 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Havelock, David. editor.<br/><a href="https://doi.org/10.1007/978-0-387-30441-0">https://doi.org/10.1007/978-0-387-30441-0</a><br/>Format:&#160;Electronic Resources<br/> The Uncertainty in Physical Measurements An Introduction to Data Analysis in the Physics Laboratory ent://SD_ILS/0/SD_ILS:154052 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Fornasini, Paolo. author.<br/><a href="https://doi.org/10.1007/978-0-387-78650-6">https://doi.org/10.1007/978-0-387-78650-6</a><br/>Format:&#160;Electronic Resources<br/> Advanced Environmental Monitoring ent://SD_ILS/0/SD_ILS:155451 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Kim, Young. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-6364-0">https://doi.org/10.1007/978-1-4020-6364-0</a><br/>Format:&#160;Electronic Resources<br/> High Time Resolution Astrophysics ent://SD_ILS/0/SD_ILS:155479 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Phelan, Don. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-6518-7">https://doi.org/10.1007/978-1-4020-6518-7</a><br/>Format:&#160;Electronic Resources<br/> Mid-Infrared Coherent Sources and Applications ent://SD_ILS/0/SD_ILS:155468 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Ebrahim-Zadeh, Majid. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-6463-0">https://doi.org/10.1007/978-1-4020-6463-0</a><br/>Format:&#160;Electronic Resources<br/> Standardization and Quality Assurance in Fluorescence Measurements II Bioanalytical and Biomedical Applications ent://SD_ILS/0/SD_ILS:150603 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Resch-Genger, Ute. editor.<br/><a href="https://doi.org/10.1007/978-3-540-70571-0">https://doi.org/10.1007/978-3-540-70571-0</a><br/>Format:&#160;Electronic Resources<br/> The Power of Optical/IR Interferometry: Recent Scientific Results and 2nd Generation Instrumentation Proceedings of the ESO Workshop held in Garching, Germany, 4-8 April 2005 ent://SD_ILS/0/SD_ILS:151729 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Richichi, Andrea. editor.<br/><a href="https://doi.org/10.1007/978-3-540-74256-2">https://doi.org/10.1007/978-3-540-74256-2</a><br/>Format:&#160;Electronic Resources<br/> Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK ent://SD_ILS/0/SD_ILS:143773 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Cullis, A.G. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-8615-1">https://doi.org/10.1007/978-1-4020-8615-1</a><br/>Format:&#160;Electronic Resources<br/> Battery Management Systems Accurate State-of-Charge Indication for Battery-Powered Applications ent://SD_ILS/0/SD_ILS:141699 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Pop, Valer. author.<br/><a href="https://doi.org/10.1007/978-1-4020-6945-1">https://doi.org/10.1007/978-1-4020-6945-1</a><br/>Format:&#160;Electronic Resources<br/> Detection of Liquid Explosives and Flammable Agents in Connection with Terrorism ent://SD_ILS/0/SD_ILS:141744 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Schubert, Hiltmar. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-8466-9">https://doi.org/10.1007/978-1-4020-8466-9</a><br/>Format:&#160;Electronic Resources<br/> Trapped Charged Particles and Fundamental Interactions ent://SD_ILS/0/SD_ILS:160544 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Blaum, Habil Klaus. editor.<br/><a href="https://doi.org/10.1007/978-3-540-77817-2">https://doi.org/10.1007/978-3-540-77817-2</a><br/>Format:&#160;Electronic Resources<br/> Precision Physics of Simple Atoms and Molecules ent://SD_ILS/0/SD_ILS:161431 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Karshenboim, Savely G. editor.<br/><a href="https://doi.org/10.1007/978-3-540-75479-4">https://doi.org/10.1007/978-3-540-75479-4</a><br/>Format:&#160;Electronic Resources<br/> Electronic Circuits Handbook for Design and Application ent://SD_ILS/0/SD_ILS:135138 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Tietze, Ulrich. author.<br/><a href="https://doi.org/10.1007/978-3-540-78655-9">https://doi.org/10.1007/978-3-540-78655-9</a><br/>Format:&#160;Electronic Resources<br/> Problemi di Fisica ent://SD_ILS/0/SD_ILS:171223 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Fazio, Michelangelo. author.<br/><a href="https://doi.org/10.1007/978-88-470-0796-3">https://doi.org/10.1007/978-88-470-0796-3</a><br/>Format:&#160;Electronic Resources<br/> The 2007 ESO Instrument Calibration Workshop Proceedings of the ESO Workshop held in Garching, Germany, 23-26 January 2007 ent://SD_ILS/0/SD_ILS:173289 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Kaufer, Andreas. editor.<br/><a href="https://doi.org/10.1007/978-3-540-76963-7">https://doi.org/10.1007/978-3-540-76963-7</a><br/>Format:&#160;Electronic Resources<br/> Micrometeorology ent://SD_ILS/0/SD_ILS:173424 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Foken, Thomas. author.<br/><a href="https://doi.org/10.1007/978-3-540-74666-9">https://doi.org/10.1007/978-3-540-74666-9</a><br/>Format:&#160;Electronic Resources<br/> Standardization and Quality Assurance in Fluorescence Measurements I Techniques ent://SD_ILS/0/SD_ILS:175443 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Resch-Genger, Ute. editor.<br/><a href="https://doi.org/10.1007/978-3-540-75207-3">https://doi.org/10.1007/978-3-540-75207-3</a><br/>Format:&#160;Electronic Resources<br/> Particle Detection with Drift Chambers ent://SD_ILS/0/SD_ILS:163694 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Blum, Walter. author.<br/><a href="https://doi.org/10.1007/978-3-540-76684-1">https://doi.org/10.1007/978-3-540-76684-1</a><br/>Format:&#160;Electronic Resources<br/> Vacuum Technology Practice for Scientific Instruments ent://SD_ILS/0/SD_ILS:165538 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Yoshimura, Nagamitsu. author.<br/><a href="https://doi.org/10.1007/978-3-540-74433-7">https://doi.org/10.1007/978-3-540-74433-7</a><br/>Format:&#160;Electronic Resources<br/> Modern Developments in X-Ray and Neutron Optics ent://SD_ILS/0/SD_ILS:166467 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Erko, Alexei. editor.<br/><a href="https://doi.org/10.1007/978-3-540-74561-7">https://doi.org/10.1007/978-3-540-74561-7</a><br/>Format:&#160;Electronic Resources<br/> Time in Quantum Mechanics ent://SD_ILS/0/SD_ILS:176415 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Muga, Gonzalo. editor.<br/><a href="https://doi.org/10.1007/978-3-540-73473-4">https://doi.org/10.1007/978-3-540-73473-4</a><br/>Format:&#160;Electronic Resources<br/> Lasers, Clocks and Drag-Free Control Exploration of Relativistic Gravity in Space ent://SD_ILS/0/SD_ILS:178039 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Dittus, Hansj&ouml;rg. editor.<br/><a href="https://doi.org/10.1007/978-3-540-34377-6">https://doi.org/10.1007/978-3-540-34377-6</a><br/>Format:&#160;Electronic Resources<br/> Grundkurs Strahlenschutz Praxiswissen f&uuml;r den Umgang mit radioaktiven Stoffen ent://SD_ILS/0/SD_ILS:179960 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Grupen, Claus. author.<br/><a href="https://doi.org/10.1007/978-3-540-75849-5">https://doi.org/10.1007/978-3-540-75849-5</a><br/>Format:&#160;Electronic Resources<br/> W&auml;gelexikon Leitfaden w&auml;getechnischer Begriffe ent://SD_ILS/0/SD_ILS:189517 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Nater, Roland. author.<br/><a href="https://doi.org/10.1007/978-3-540-75908-9">https://doi.org/10.1007/978-3-540-75908-9</a><br/>Format:&#160;Electronic Resources<br/> Physik der Teilchenbeschleuniger und Ionenoptik ent://SD_ILS/0/SD_ILS:193600 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hinterberger, Frank. author.<br/><a href="https://doi.org/10.1007/978-3-540-75282-0">https://doi.org/10.1007/978-3-540-75282-0</a><br/>Format:&#160;Electronic Resources<br/> Measurement Uncertainty An Approach via the Mathematical Theory of Evidence ent://SD_ILS/0/SD_ILS:153128 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Salicone, Simona. author.<br/><a href="https://doi.org/10.1007/978-0-387-46328-5">https://doi.org/10.1007/978-0-387-46328-5</a><br/>Format:&#160;Electronic Resources<br/> Science of Microscopy ent://SD_ILS/0/SD_ILS:153249 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hawkes, P.W. editor.<br/><a href="https://doi.org/10.1007/978-0-387-49762-4">https://doi.org/10.1007/978-0-387-49762-4</a><br/>Format:&#160;Electronic Resources<br/> Microgravity Two-phase Flow and Heat Transfer ent://SD_ILS/0/SD_ILS:155164 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gabriel, Kamiel S. author.<br/><a href="https://doi.org/10.1007/1-4020-5143-3">https://doi.org/10.1007/1-4020-5143-3</a><br/>Format:&#160;Electronic Resources<br/> Optics of Biological Particles ent://SD_ILS/0/SD_ILS:155259 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hoekstra, Alfons. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-5502-7">https://doi.org/10.1007/978-1-4020-5502-7</a><br/>Format:&#160;Electronic Resources<br/> X-Ray Lasers 2006 Proceedings of the 10th International Conference, August 20-25, 2006, Berlin, Germany ent://SD_ILS/0/SD_ILS:155387 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Nickles, P.V. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-6018-2">https://doi.org/10.1007/978-1-4020-6018-2</a><br/>Format:&#160;Electronic Resources<br/> Particle Accelerator Physics ent://SD_ILS/0/SD_ILS:148982 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Wiedemann, Helmut. author.<br/><a href="https://doi.org/10.1007/978-3-540-49045-6">https://doi.org/10.1007/978-3-540-49045-6</a><br/>Format:&#160;Electronic Resources<br/> Data Processing in Precise Time and Frequency Applications ent://SD_ILS/0/SD_ILS:149275 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Desaintfuscien, M. author.<br/><a href="https://doi.org/10.1007/978-3-540-48878-1">https://doi.org/10.1007/978-3-540-48878-1</a><br/>Format:&#160;Electronic Resources<br/> Exploring the Cosmic Frontier Astrophysical Instruments for the 21st Century ent://SD_ILS/0/SD_ILS:150717 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Lobanov, A.P. editor.<br/><a href="https://doi.org/10.1007/978-3-540-39756-4">https://doi.org/10.1007/978-3-540-39756-4</a><br/>Format:&#160;Electronic Resources<br/> Very High Resolution Photoelectron Spectroscopy ent://SD_ILS/0/SD_ILS:151027 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;H&uuml;fner, Stephan. editor.<br/><a href="https://doi.org/10.1007/3-540-68133-7">https://doi.org/10.1007/3-540-68133-7</a><br/>Format:&#160;Electronic Resources<br/> Theory of Periodic Conjugate Heat Transfer ent://SD_ILS/0/SD_ILS:145048 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Zudin, Yuri B. author.<br/><a href="https://doi.org/10.1007/978-3-540-70725-7">https://doi.org/10.1007/978-3-540-70725-7</a><br/>Format:&#160;Electronic Resources<br/> Scanning Microscopy for Nanotechnology Techniques and Applications ent://SD_ILS/0/SD_ILS:139866 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Zhou, Weilie. editor.<br/><a href="https://doi.org/10.1007/978-0-387-39620-0">https://doi.org/10.1007/978-0-387-39620-0</a><br/>Format:&#160;Electronic Resources<br/> Square-Wave Voltammetry Theory and Application ent://SD_ILS/0/SD_ILS:141336 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Mirceski, Valentin. author.<br/><a href="https://doi.org/10.1007/978-3-540-73740-7">https://doi.org/10.1007/978-3-540-73740-7</a><br/>Format:&#160;Electronic Resources<br/> Imaging for Detection and Identification ent://SD_ILS/0/SD_ILS:141502 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Byrnes, Jim. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-5620-8">https://doi.org/10.1007/978-1-4020-5620-8</a><br/>Format:&#160;Electronic Resources<br/> Top Quark Physics at Hadron Colliders ent://SD_ILS/0/SD_ILS:158670 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Quadt, Arnulf. author.<br/><a href="https://doi.org/10.1007/978-3-540-71060-8">https://doi.org/10.1007/978-3-540-71060-8</a><br/>Format:&#160;Electronic Resources<br/> Dealing with Uncertainties A Guide to Error Analysis ent://SD_ILS/0/SD_ILS:160319 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Drosg, Manfred. author.<br/><a href="https://doi.org/10.1007/978-3-540-29608-9">https://doi.org/10.1007/978-3-540-29608-9</a><br/>Format:&#160;Electronic Resources<br/> NMR - From Spectra to Structures An Experimental Approach ent://SD_ILS/0/SD_ILS:160725 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Mitchell, Terence N. author.<br/><a href="https://doi.org/10.1007/978-3-540-72196-3">https://doi.org/10.1007/978-3-540-72196-3</a><br/>Format:&#160;Electronic Resources<br/> Well Logging for Earth Scientists ent://SD_ILS/0/SD_ILS:137325 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Ellis, Darwin V. author.<br/><a href="https://doi.org/10.1007/978-1-4020-4602-5">https://doi.org/10.1007/978-1-4020-4602-5</a><br/>Format:&#160;Electronic Resources<br/> Science Perspectives for 3D Spectroscopy Proceedings of the ESO Workshop held in Garching, Germany, 10-14 October 2005 ent://SD_ILS/0/SD_ILS:168200 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Kissler-Patig, Markus. editor.<br/><a href="https://doi.org/10.1007/978-3-540-73491-8">https://doi.org/10.1007/978-3-540-73491-8</a><br/>Format:&#160;Electronic Resources<br/> Atomic and Nuclear Analytical Methods XRF, M&ouml;ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques ent://SD_ILS/0/SD_ILS:163383 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Verma, Hem Raj. author.<br/><a href="https://doi.org/10.1007/978-3-540-30279-7">https://doi.org/10.1007/978-3-540-30279-7</a><br/>Format:&#160;Electronic Resources<br/> Particle Image Velocimetry A Practical Guide ent://SD_ILS/0/SD_ILS:164115 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Raffel, Markus. author. (orcid)0000-0002-3340-9115<br/><a href="https://doi.org/10.1007/978-3-540-72308-0">https://doi.org/10.1007/978-3-540-72308-0</a><br/>Format:&#160;Electronic Resources<br/> Lasermesstechnik Diagnostik der Kurzzeitphysik ent://SD_ILS/0/SD_ILS:188944 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hugenschmidt, Manfred. author.<br/><a href="https://doi.org/10.1007/978-3-540-29921-9">https://doi.org/10.1007/978-3-540-29921-9</a><br/>Format:&#160;Electronic Resources<br/> Funktionalanalysis ent://SD_ILS/0/SD_ILS:189294 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Werner, Dirk. author.<br/><a href="https://doi.org/10.1007/978-3-540-72536-7">https://doi.org/10.1007/978-3-540-72536-7</a><br/>Format:&#160;Electronic Resources<br/> Physik f&uuml;r Ingenieure ent://SD_ILS/0/SD_ILS:191296 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hering, Ekbert. author.<br/><a href="https://doi.org/10.1007/978-3-540-71856-7">https://doi.org/10.1007/978-3-540-71856-7</a><br/>Format:&#160;Electronic Resources<br/> Structural Synthesis in Precision Elasticity ent://SD_ILS/0/SD_ILS:152211 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Tseytlin, Yakov M. author.<br/><a href="https://doi.org/10.1007/b105079">https://doi.org/10.1007/b105079</a><br/>Format:&#160;Electronic Resources<br/> Digital Signal Processing for Measurement Systems Theory and Applications ent://SD_ILS/0/SD_ILS:152514 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;D'Antona, Gabriele. author.<br/><a href="https://doi.org/10.1007/0-387-28666-7">https://doi.org/10.1007/0-387-28666-7</a><br/>Format:&#160;Electronic Resources<br/> Nanoscale Devices - Fundamentals and Applications ent://SD_ILS/0/SD_ILS:155151 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Gross, Rudolf. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-5107-4">https://doi.org/10.1007/978-1-4020-5107-4</a><br/>Format:&#160;Electronic Resources<br/> Photon-based Nanoscience and Nanobiotechnology ent://SD_ILS/0/SD_ILS:155263 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Dubowski, Jan J. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-5523-2">https://doi.org/10.1007/978-1-4020-5523-2</a><br/>Format:&#160;Electronic Resources<br/> The Euroschool Lectures on Physics With Exotic Beams, Vol. II ent://SD_ILS/0/SD_ILS:157153 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Al-Khalili, J.S. editor.<br/><a href="https://doi.org/10.1007/b11743651">https://doi.org/10.1007/b11743651</a><br/>Format:&#160;Electronic Resources<br/> Beam Instrumentation and Diagnostics ent://SD_ILS/0/SD_ILS:149557 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Strehl, Peter. author.<br/><a href="https://doi.org/10.1007/3-540-26404-3">https://doi.org/10.1007/3-540-26404-3</a><br/>Format:&#160;Electronic Resources<br/> Springer Handbook of Materials Measurement Methods ent://SD_ILS/0/SD_ILS:150185 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Czichos, Horst. editor.<br/><a href="https://doi.org/10.1007/978-3-540-30300-8">https://doi.org/10.1007/978-3-540-30300-8</a><br/>Format:&#160;Electronic Resources<br/> True Visions The Emergence of Ambient Intelligence ent://SD_ILS/0/SD_ILS:151331 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Aarts, Emile H.L. editor.<br/><a href="https://doi.org/10.1007/978-3-540-28974-6">https://doi.org/10.1007/978-3-540-28974-6</a><br/>Format:&#160;Electronic Resources<br/> The 2nd International Conference on Nuclear Physics in Astrophysics Refereed and selected contributions, Debrecen, Hungary, May 16-20, 2005 ent://SD_ILS/0/SD_ILS:151796 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;F&uuml;l&ouml;p, Zsolt. editor.<br/><a href="https://doi.org/10.1007/3-540-32843-2">https://doi.org/10.1007/3-540-32843-2</a><br/>Format:&#160;Electronic Resources<br/> The Scientific Legacy of Beppo Occhialini ent://SD_ILS/0/SD_ILS:144341 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Redondi, Pietro. editor.<br/><a href="https://doi.org/10.1007/978-3-540-37354-4">https://doi.org/10.1007/978-3-540-37354-4</a><br/>Format:&#160;Electronic Resources<br/> Hadron Collider Physics 2005 Proceedings of the 1st Hadron Collider Physics Symposium, Les Diablerets, Switzerland, July 4-9, 2005 ent://SD_ILS/0/SD_ILS:147133 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Campanelli, Mario. editor.<br/><a href="https://doi.org/10.1007/978-3-540-32841-4">https://doi.org/10.1007/978-3-540-32841-4</a><br/>Format:&#160;Electronic Resources<br/> Numerical and Practical Exercises in Thermoluminescence ent://SD_ILS/0/SD_ILS:139563 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Pagonis, Vasilis. author.<br/><a href="https://doi.org/10.1007/0-387-30090-2">https://doi.org/10.1007/0-387-30090-2</a><br/>Format:&#160;Electronic Resources<br/> Radiation Detectors for Medical Applications ent://SD_ILS/0/SD_ILS:140170 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Tavernier, Stefaan. editor.<br/><a href="https://doi.org/10.1007/1-4020-5093-3">https://doi.org/10.1007/1-4020-5093-3</a><br/>Format:&#160;Electronic Resources<br/> Precision Temperature Sensors in CMOS Technology ent://SD_ILS/0/SD_ILS:141482 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Pertijs, Micheal A.P. author.<br/><a href="https://doi.org/10.1007/1-4020-5258-8">https://doi.org/10.1007/1-4020-5258-8</a><br/>Format:&#160;Electronic Resources<br/> Material Properties under Intensive Dynamic Loading ent://SD_ILS/0/SD_ILS:142211 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Zhernokletov, Mikhail V. editor.<br/><a href="https://doi.org/10.1007/978-3-540-36845-8">https://doi.org/10.1007/978-3-540-36845-8</a><br/>Format:&#160;Electronic Resources<br/> Observation of the Earth System from Space ent://SD_ILS/0/SD_ILS:159831 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Flury, Jakob. editor.<br/><a href="https://doi.org/10.1007/3-540-29522-4">https://doi.org/10.1007/3-540-29522-4</a><br/>Format:&#160;Electronic Resources<br/> Pixel Detectors From Fundamentals to Applications ent://SD_ILS/0/SD_ILS:160591 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Rossi, Leonardo. author.<br/><a href="https://doi.org/10.1007/3-540-28333-1">https://doi.org/10.1007/3-540-28333-1</a><br/>Format:&#160;Electronic Resources<br/> Atmosphere and Climate Studies by Occultation Methods ent://SD_ILS/0/SD_ILS:160766 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Foelsche, Ulrich. editor.<br/><a href="https://doi.org/10.1007/3-540-34121-8">https://doi.org/10.1007/3-540-34121-8</a><br/>Format:&#160;Electronic Resources<br/> Maintenance of Process Instrumentation in Nuclear Power Plants ent://SD_ILS/0/SD_ILS:161422 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hashemian, H.M. author.<br/><a href="https://doi.org/10.1007/978-3-540-33704-1">https://doi.org/10.1007/978-3-540-33704-1</a><br/>Format:&#160;Electronic Resources<br/> Magnetism: A Synchrotron Radiation Approach ent://SD_ILS/0/SD_ILS:162160 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Beaurepaire, Eric. editor.<br/><a href="https://doi.org/10.1007/b11594864">https://doi.org/10.1007/b11594864</a><br/>Format:&#160;Electronic Resources<br/> Modulated Temperature Differential Scanning Calorimetry Theoretical and Practical Applications in Polymer Characterisation ent://SD_ILS/0/SD_ILS:137154 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Reading, Mike. editor.<br/><a href="https://doi.org/10.1007/1-4020-3750-3">https://doi.org/10.1007/1-4020-3750-3</a><br/>Format:&#160;Electronic Resources<br/> Detection and Disposal of Improvised Explosives ent://SD_ILS/0/SD_ILS:137389 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Schubert, Hiltmar. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-4887-6">https://doi.org/10.1007/978-1-4020-4887-6</a><br/>Format:&#160;Electronic Resources<br/> Stand-off Detection of Suicide Bombers and Mobile Subjects ent://SD_ILS/0/SD_ILS:137428 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Schubert, Hiltmar. editor.<br/><a href="https://doi.org/10.1007/1-4020-5159-X">https://doi.org/10.1007/1-4020-5159-X</a><br/>Format:&#160;Electronic Resources<br/> Geomagnetics for Aeronautical Safety A Case Study in and around the Balkans ent://SD_ILS/0/SD_ILS:137438 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Rasson, Jean L. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-5025-1">https://doi.org/10.1007/978-1-4020-5025-1</a><br/>Format:&#160;Electronic Resources<br/> Dynamics and Thermodynamics with Nuclear Degrees of Freedom ent://SD_ILS/0/SD_ILS:168016 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Chomaz, Philippe. editor.<br/><a href="https://doi.org/10.1007/978-3-540-46496-9">https://doi.org/10.1007/978-3-540-46496-9</a><br/>Format:&#160;Electronic Resources<br/> Collective Phenomena in Synchrotron Radiation Sources Prediction, Diagnostics, Countermeasures ent://SD_ILS/0/SD_ILS:173596 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Khan, Shaukat. author.<br/><a href="https://doi.org/10.1007/978-3-540-34313-4">https://doi.org/10.1007/978-3-540-34313-4</a><br/>Format:&#160;Electronic Resources<br/> Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering ent://SD_ILS/0/SD_ILS:162583 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Lecoq, Paul. author.<br/><a href="https://doi.org/10.1007/3-540-27768-4">https://doi.org/10.1007/3-540-27768-4</a><br/>Format:&#160;Electronic Resources<br/> Data Analysis Using the Method of Least Squares Extracting the Most Information from Experiments ent://SD_ILS/0/SD_ILS:166056 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Wolberg, John. author.<br/><a href="https://doi.org/10.1007/3-540-31720-1">https://doi.org/10.1007/3-540-31720-1</a><br/>Format:&#160;Electronic Resources<br/> Angewandte Meteorologie Mikrometeorologische Methoden ent://SD_ILS/0/SD_ILS:186020 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Foken, Thomas. author.<br/><a href="https://doi.org/10.1007/978-3-540-38204-1">https://doi.org/10.1007/978-3-540-38204-1</a><br/>Format:&#160;Electronic Resources<br/> Dynamic Characterisation of Analogue-to-Digital Converters ent://SD_ILS/0/SD_ILS:152283 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Dallet, Dominique. editor.<br/><a href="https://doi.org/10.1007/b136458">https://doi.org/10.1007/b136458</a><br/>Format:&#160;Electronic Resources<br/> Measurement Errors and Uncertainties Theory and Practice ent://SD_ILS/0/SD_ILS:152569 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Rabinovich, Semyon G. author.<br/><a href="https://doi.org/10.1007/0-387-29143-1">https://doi.org/10.1007/0-387-29143-1</a><br/>Format:&#160;Electronic Resources<br/> The Solar Radiation and Climate Experiment (SORCE) Mission Description and Early Results ent://SD_ILS/0/SD_ILS:153027 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Rottman, G.J. editor.<br/><a href="https://doi.org/10.1007/0-387-37625-9">https://doi.org/10.1007/0-387-37625-9</a><br/>Format:&#160;Electronic Resources<br/> Integrated Chemical Microsensor Systems in CMOS Technology ent://SD_ILS/0/SD_ILS:156712 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hierlemann, Andreas. author.<br/><a href="https://doi.org/10.1007/b138987">https://doi.org/10.1007/b138987</a><br/>Format:&#160;Electronic Resources<br/> Intense Electron and Ion Beams ent://SD_ILS/0/SD_ILS:151618 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Molokovsky, Sergey Ivanovich. author.<br/><a href="https://doi.org/10.1007/3-540-28812-0">https://doi.org/10.1007/3-540-28812-0</a><br/>Format:&#160;Electronic Resources<br/> Parametric X-Ray Radiation in Crystals Theory, Experiment and Applications ent://SD_ILS/0/SD_ILS:151720 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Baryshevsky, Vladimir G. author.<br/><a href="https://doi.org/10.1007/b95327">https://doi.org/10.1007/b95327</a><br/>Format:&#160;Electronic Resources<br/> Digital Image Processing ent://SD_ILS/0/SD_ILS:144737 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;J&auml;hne, Bernd. author.<br/><a href="https://doi.org/10.1007/3-540-27563-0">https://doi.org/10.1007/3-540-27563-0</a><br/>Format:&#160;Electronic Resources<br/> Science with Adaptive Optics Proceedings of the ESO Workshop Held at Garching, Germany, 16-19 September 2003 ent://SD_ILS/0/SD_ILS:145000 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Brandner, Wolfgang. editor.<br/><a href="https://doi.org/10.1007/b80350">https://doi.org/10.1007/b80350</a><br/>Format:&#160;Electronic Resources<br/> Microscale Diagnostic Techniques ent://SD_ILS/0/SD_ILS:146412 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Breuer, Kenny. editor.<br/><a href="https://doi.org/10.1007/b137604">https://doi.org/10.1007/b137604</a><br/>Format:&#160;Electronic Resources<br/> From Cells to Proteins: Imaging Nature across Dimensions Proceedings of the NATO Advanced Study Institute, held in Pisa, Italy, 12-23 September 2004 ent://SD_ILS/0/SD_ILS:140071 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Evangelista, Valtere. editor.<br/><a href="https://doi.org/10.1007/1-4020-3616-7">https://doi.org/10.1007/1-4020-3616-7</a><br/>Format:&#160;Electronic Resources<br/> Sensing Issues in Civil Structural Health Monitoring ent://SD_ILS/0/SD_ILS:140072 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Ansari, Farhad. editor.<br/><a href="https://doi.org/10.1007/1-4020-3661-2">https://doi.org/10.1007/1-4020-3661-2</a><br/>Format:&#160;Electronic Resources<br/> Pressure and Temperature Sensitive Paints ent://SD_ILS/0/SD_ILS:158686 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Liu, Tianshu. author.<br/><a href="https://doi.org/10.1007/b137841">https://doi.org/10.1007/b137841</a><br/>Format:&#160;Electronic Resources<br/> Electrostatic Accelerators Fundamentals and Applications ent://SD_ILS/0/SD_ILS:160083 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Hellborg, Ragnar. editor.<br/><a href="https://doi.org/10.1007/b138596">https://doi.org/10.1007/b138596</a><br/>Format:&#160;Electronic Resources<br/> High-Pressure Shock Compression of Solids VIII The Science and Technology of High-Velocity Impact ent://SD_ILS/0/SD_ILS:161415 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Chhabildas, L.C. editor.<br/><a href="https://doi.org/10.1007/b138708">https://doi.org/10.1007/b138708</a><br/>Format:&#160;Electronic Resources<br/> Neutrinos and Explosive Events in the Universe ent://SD_ILS/0/SD_ILS:137134 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Shapiro, Maurice M. editor.<br/><a href="https://doi.org/10.1007/1-4020-3748-1">https://doi.org/10.1007/1-4020-3748-1</a><br/>Format:&#160;Electronic Resources<br/> Multiwavelength Approach to Unidentified Gamma-Ray Sources A Second Workshop on the Nature of the High-Energy Unidentified Sources ent://SD_ILS/0/SD_ILS:137148 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Cheng, K.S. editor.<br/><a href="https://doi.org/10.1007/1-4020-3881-X">https://doi.org/10.1007/1-4020-3881-X</a><br/>Format:&#160;Electronic Resources<br/> ISO Science Legacy A Compact Review of ISO Major Achievements ent://SD_ILS/0/SD_ILS:137172 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Cesarsky, Catherine. editor.<br/><a href="https://doi.org/10.1007/1-4020-3844-5">https://doi.org/10.1007/1-4020-3844-5</a><br/>Format:&#160;Electronic Resources<br/> Learning About Particles - 50 Privileged Years ent://SD_ILS/0/SD_ILS:168288 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Steinberger, Jack. author.<br/><a href="https://doi.org/10.1007/b138163">https://doi.org/10.1007/b138163</a><br/>Format:&#160;Electronic Resources<br/> Electromagnetic Aquametry Electromagnetic Wave Interaction with Water and Moist Substances ent://SD_ILS/0/SD_ILS:175110 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Kupfer, Klaus. editor.<br/><a href="https://doi.org/10.1007/b137700">https://doi.org/10.1007/b137700</a><br/>Format:&#160;Electronic Resources<br/> Fluid Mechanics of Flow Metering ent://SD_ILS/0/SD_ILS:164793 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Merzkirch, Wolfgang. editor.<br/><a href="https://doi.org/10.1007/b138000">https://doi.org/10.1007/b138000</a><br/>Format:&#160;Electronic Resources<br/> Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK ent://SD_ILS/0/SD_ILS:167149 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Cullis, A.G. editor.<br/><a href="https://doi.org/10.1007/3-540-31915-8">https://doi.org/10.1007/3-540-31915-8</a><br/>Format:&#160;Electronic Resources<br/> Digitale Bildverarbeitung ent://SD_ILS/0/SD_ILS:184279 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;J&auml;hne, Bernd. author.<br/><a href="https://doi.org/10.1007/b138991">https://doi.org/10.1007/b138991</a><br/>Format:&#160;Electronic Resources<br/> Excimer Laser Technology ent://SD_ILS/0/SD_ILS:176783 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Basting, Dirk. editor.<br/><a href="https://doi.org/10.1007/b137894">https://doi.org/10.1007/b137894</a><br/>Format:&#160;Electronic Resources<br/> Digital Holography Digital Hologram Recording, Numerical Reconstruction, and Related Techniques ent://SD_ILS/0/SD_ILS:176844 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Schnars, Ulf. author.<br/><a href="https://doi.org/10.1007/b138284">https://doi.org/10.1007/b138284</a><br/>Format:&#160;Electronic Resources<br/> Measurement Uncertainties in Science and Technology ent://SD_ILS/0/SD_ILS:177492 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Grabe, Michael. author.<br/><a href="https://doi.org/10.1007/b138915">https://doi.org/10.1007/b138915</a><br/>Format:&#160;Electronic Resources<br/> Materials and processes in manufacturing ent://SD_ILS/0/SD_ILS:73509 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;DeGarmo, E. Paul<br/>Format:&#160;Books<br/> Manual of soil laboratory testing : effective stress tests ent://SD_ILS/0/SD_ILS:73677 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Head , K.H.<br/><a href="http://www.wiley.co.uk">http://www.wiley.co.uk</a><br/>Format:&#160;Books<br/> I. Ulusal &ouml;l&ccedil;&uuml;mbilim kongresi ent://SD_ILS/0/SD_ILS:64310 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;I. Ulusal &ouml;l&ccedil;&uuml;mbilim kongresi : bildiriler kitab&#305; : (19-20 Ekim 1995 : Eski&#351;ehir)<br/>Format:&#160;Books<br/> &Ouml;l&ccedil;me aletleri ve elektroniksel &ouml;l&ccedil;meler : Orta Dereceli End&uuml;striyel Teknik &Ouml;&#287;retim Okullar&#305; temel ders kitab&#305; ent://SD_ILS/0/SD_ILS:82544 2025-02-12T11:01:29Z 2025-02-12T11:01:29Z by&#160;Aksaray, M. Zeki<br/>Format:&#160;Books<br/>