Search Results for Spectrum analysis. - Narrowed by: Electronic circuits.SirsiDynix Enterprisehttp://librarycatalog.yyu.edu.tr/client/en_US/default/default/qu$003dSpectrum$002banalysis.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ps$003d300?dt=list2025-02-07T10:39:38ZAnalog Electronic Filters Theory, Design and Synthesisent://SD_ILS/0/SD_ILS:1606782025-02-07T10:39:38Z2025-02-07T10:39:38Zby Dimopoulos, Hercules G. author.<br/><a href="https://doi.org/10.1007/978-94-007-2190-6">https://doi.org/10.1007/978-94-007-2190-6</a><br/>Format: Electronic Resources<br/>Power Electronic Packaging Design, Assembly Process, Reliability and Modelingent://SD_ILS/0/SD_ILS:1397162025-02-07T10:39:38Z2025-02-07T10:39:38Zby Liu, Yong. author.<br/><a href="https://doi.org/10.1007/978-1-4614-1053-9">https://doi.org/10.1007/978-1-4614-1053-9</a><br/>Format: Electronic Resources<br/>Analog-to-Digital Conversionent://SD_ILS/0/SD_ILS:1731782025-02-07T10:39:38Z2025-02-07T10:39:38Zby Pelgrom, Marcel J.M. author.<br/><a href="https://doi.org/10.1007/978-90-481-8888-8">https://doi.org/10.1007/978-90-481-8888-8</a><br/>Format: Electronic Resources<br/>Inside NAND Flash Memoriesent://SD_ILS/0/SD_ILS:1674292025-02-07T10:39:38Z2025-02-07T10:39:38Zby Micheloni, Rino. author.<br/><a href="https://doi.org/10.1007/978-90-481-9431-5">https://doi.org/10.1007/978-90-481-9431-5</a><br/>Format: Electronic Resources<br/>Time-to-Digital Convertersent://SD_ILS/0/SD_ILS:1478922025-02-07T10:39:38Z2025-02-07T10:39:38Zby Henzler, Stephan. author.<br/><a href="https://doi.org/10.1007/978-90-481-8628-0">https://doi.org/10.1007/978-90-481-8628-0</a><br/>Format: Electronic Resources<br/>EMC of Analog Integrated Circuitsent://SD_ILS/0/SD_ILS:1600012025-02-07T10:39:38Z2025-02-07T10:39:38Zby Redouté, Jean-Michel. author.<br/><a href="https://doi.org/10.1007/978-90-481-3230-0">https://doi.org/10.1007/978-90-481-3230-0</a><br/>Format: Electronic Resources<br/>Advanced Power MOSFET Conceptsent://SD_ILS/0/SD_ILS:1652122025-02-07T10:39:38Z2025-02-07T10:39:38Zby Baliga, B. Jayant. author.<br/><a href="https://doi.org/10.1007/978-1-4419-5917-1">https://doi.org/10.1007/978-1-4419-5917-1</a><br/>Format: Electronic Resources<br/>Cellular Nanoscale Sensory Wave Computingent://SD_ILS/0/SD_ILS:1380142025-02-07T10:39:38Z2025-02-07T10:39:38Zby Baatar, Chagaan. editor.<br/><a href="https://doi.org/10.1007/978-1-4419-1011-0">https://doi.org/10.1007/978-1-4419-1011-0</a><br/>Format: Electronic Resources<br/>Fundamentals of III-V Semiconductor MOSFETsent://SD_ILS/0/SD_ILS:1395462025-02-07T10:39:38Z2025-02-07T10:39:38Zby Oktyabrsky, Serge. editor.<br/><a href="https://doi.org/10.1007/978-1-4419-1547-4">https://doi.org/10.1007/978-1-4419-1547-4</a><br/>Format: Electronic Resources<br/>The gm/ID Methodology, a sizing tool for low-voltage analog CMOS Circuits The semi-empirical and compact model approachesent://SD_ILS/0/SD_ILS:1363982025-02-07T10:39:38Z2025-02-07T10:39:38Zby Jespers, Paul. author.<br/><a href="https://doi.org/10.1007/978-0-387-47101-3">https://doi.org/10.1007/978-0-387-47101-3</a><br/>Format: Electronic Resources<br/>Liquid Crystal Display Drivers Techniques and Circuitsent://SD_ILS/0/SD_ILS:1732262025-02-07T10:39:38Z2025-02-07T10:39:38Zby Cristaldi, David J.R. author.<br/><a href="https://doi.org/10.1007/978-90-481-2255-4">https://doi.org/10.1007/978-90-481-2255-4</a><br/>Format: Electronic Resources<br/>Advanced Power Rectifier Conceptsent://SD_ILS/0/SD_ILS:1538182025-02-07T10:39:38Z2025-02-07T10:39:38Zby Baliga, B. Jayant. author.<br/><a href="https://doi.org/10.1007/978-0-387-75589-2">https://doi.org/10.1007/978-0-387-75589-2</a><br/>Format: Electronic Resources<br/>Planar Double-Gate Transistor From technology to circuitent://SD_ILS/0/SD_ILS:1558512025-02-07T10:39:38Z2025-02-07T10:39:38Zby Amara, Amara. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-9341-8">https://doi.org/10.1007/978-1-4020-9341-8</a><br/>Format: Electronic Resources<br/>Polarization Effects in Semiconductors From Ab Initio Theory to Device Applicationsent://SD_ILS/0/SD_ILS:1533002025-02-07T10:39:38Z2025-02-07T10:39:38Zby Wood, Colin. editor.<br/><a href="https://doi.org/10.1007/978-0-387-68319-5">https://doi.org/10.1007/978-0-387-68319-5</a><br/>Format: Electronic Resources<br/>Fundamentals of Power Semiconductor Devicesent://SD_ILS/0/SD_ILS:1531432025-02-07T10:39:38Z2025-02-07T10:39:38Zby Baliga, B. Jayant. author.<br/><a href="https://doi.org/10.1007/978-0-387-47314-7">https://doi.org/10.1007/978-0-387-47314-7</a><br/>Format: Electronic Resources<br/>Semiconductor Device Physics and Designent://SD_ILS/0/SD_ILS:1554722025-02-07T10:39:38Z2025-02-07T10:39:38Zby Mishra, Umesh. author.<br/><a href="https://doi.org/10.1007/978-1-4020-6481-4">https://doi.org/10.1007/978-1-4020-6481-4</a><br/>Format: Electronic Resources<br/>ESD Protection Device and Circuit Design for Advanced CMOS Technologiesent://SD_ILS/0/SD_ILS:1417242025-02-07T10:39:38Z2025-02-07T10:39:38Zby Semenov, Oleg. author.<br/><a href="https://doi.org/10.1007/978-1-4020-8301-3">https://doi.org/10.1007/978-1-4020-8301-3</a><br/>Format: Electronic Resources<br/>Physical Limitations of Semiconductor Devicesent://SD_ILS/0/SD_ILS:1365282025-02-07T10:39:38Z2025-02-07T10:39:38Zby Vashchenko, Vladislav A. author.<br/><a href="https://doi.org/10.1007/978-0-387-74514-5">https://doi.org/10.1007/978-0-387-74514-5</a><br/>Format: Electronic Resources<br/>Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologiesent://SD_ILS/0/SD_ILS:1401692025-02-07T10:39:38Z2025-02-07T10:39:38Zby Henzler, Stephan. author.<br/><a href="https://doi.org/10.1007/1-4020-5081-X">https://doi.org/10.1007/1-4020-5081-X</a><br/>Format: Electronic Resources<br/>Low Power VCO Design in CMOSent://SD_ILS/0/SD_ILS:1352822025-02-07T10:39:38Z2025-02-07T10:39:38Zby Tiebout, Marc. author.<br/><a href="https://doi.org/10.1007/3-540-29256-X">https://doi.org/10.1007/3-540-29256-X</a><br/>Format: Electronic Resources<br/>Fundamentals of Solid State Engineeringent://SD_ILS/0/SD_ILS:1361302025-02-07T10:39:38Z2025-02-07T10:39:38Zby Razeghi, Manijeh. author.<br/><a href="https://doi.org/10.1007/0-387-28751-5">https://doi.org/10.1007/0-387-28751-5</a><br/>Format: Electronic Resources<br/>Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UKent://SD_ILS/0/SD_ILS:1671492025-02-07T10:39:38Z2025-02-07T10:39:38Zby Cullis, A.G. editor.<br/><a href="https://doi.org/10.1007/3-540-31915-8">https://doi.org/10.1007/3-540-31915-8</a><br/>Format: Electronic Resources<br/>