Search Results for Spectrum analysis. - Narrowed by: Electronic circuits. SirsiDynix Enterprise http://librarycatalog.yyu.edu.tr/client/en_US/default/default/qu$003dSpectrum$002banalysis.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ps$003d300?dt=list 2025-02-07T10:39:38Z Analog Electronic Filters Theory, Design and Synthesis ent://SD_ILS/0/SD_ILS:160678 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Dimopoulos, Hercules G. author.<br/><a href="https://doi.org/10.1007/978-94-007-2190-6">https://doi.org/10.1007/978-94-007-2190-6</a><br/>Format:&#160;Electronic Resources<br/> Power Electronic Packaging Design, Assembly Process, Reliability and Modeling ent://SD_ILS/0/SD_ILS:139716 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Liu, Yong. author.<br/><a href="https://doi.org/10.1007/978-1-4614-1053-9">https://doi.org/10.1007/978-1-4614-1053-9</a><br/>Format:&#160;Electronic Resources<br/> Analog-to-Digital Conversion ent://SD_ILS/0/SD_ILS:173178 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Pelgrom, Marcel J.M. author.<br/><a href="https://doi.org/10.1007/978-90-481-8888-8">https://doi.org/10.1007/978-90-481-8888-8</a><br/>Format:&#160;Electronic Resources<br/> Inside NAND Flash Memories ent://SD_ILS/0/SD_ILS:167429 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Micheloni, Rino. author.<br/><a href="https://doi.org/10.1007/978-90-481-9431-5">https://doi.org/10.1007/978-90-481-9431-5</a><br/>Format:&#160;Electronic Resources<br/> Time-to-Digital Converters ent://SD_ILS/0/SD_ILS:147892 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Henzler, Stephan. author.<br/><a href="https://doi.org/10.1007/978-90-481-8628-0">https://doi.org/10.1007/978-90-481-8628-0</a><br/>Format:&#160;Electronic Resources<br/> EMC of Analog Integrated Circuits ent://SD_ILS/0/SD_ILS:160001 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Redout&eacute;, Jean-Michel. author.<br/><a href="https://doi.org/10.1007/978-90-481-3230-0">https://doi.org/10.1007/978-90-481-3230-0</a><br/>Format:&#160;Electronic Resources<br/> Advanced Power MOSFET Concepts ent://SD_ILS/0/SD_ILS:165212 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Baliga, B. Jayant. author.<br/><a href="https://doi.org/10.1007/978-1-4419-5917-1">https://doi.org/10.1007/978-1-4419-5917-1</a><br/>Format:&#160;Electronic Resources<br/> Cellular Nanoscale Sensory Wave Computing ent://SD_ILS/0/SD_ILS:138014 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Baatar, Chagaan. editor.<br/><a href="https://doi.org/10.1007/978-1-4419-1011-0">https://doi.org/10.1007/978-1-4419-1011-0</a><br/>Format:&#160;Electronic Resources<br/> Fundamentals of III-V Semiconductor MOSFETs ent://SD_ILS/0/SD_ILS:139546 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Oktyabrsky, Serge. editor.<br/><a href="https://doi.org/10.1007/978-1-4419-1547-4">https://doi.org/10.1007/978-1-4419-1547-4</a><br/>Format:&#160;Electronic Resources<br/> The gm/ID Methodology, a sizing tool for low-voltage analog CMOS Circuits The semi-empirical and compact model approaches ent://SD_ILS/0/SD_ILS:136398 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Jespers, Paul. author.<br/><a href="https://doi.org/10.1007/978-0-387-47101-3">https://doi.org/10.1007/978-0-387-47101-3</a><br/>Format:&#160;Electronic Resources<br/> Liquid Crystal Display Drivers Techniques and Circuits ent://SD_ILS/0/SD_ILS:173226 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Cristaldi, David J.R. author.<br/><a href="https://doi.org/10.1007/978-90-481-2255-4">https://doi.org/10.1007/978-90-481-2255-4</a><br/>Format:&#160;Electronic Resources<br/> Advanced Power Rectifier Concepts ent://SD_ILS/0/SD_ILS:153818 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Baliga, B. Jayant. author.<br/><a href="https://doi.org/10.1007/978-0-387-75589-2">https://doi.org/10.1007/978-0-387-75589-2</a><br/>Format:&#160;Electronic Resources<br/> Planar Double-Gate Transistor From technology to circuit ent://SD_ILS/0/SD_ILS:155851 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Amara, Amara. editor.<br/><a href="https://doi.org/10.1007/978-1-4020-9341-8">https://doi.org/10.1007/978-1-4020-9341-8</a><br/>Format:&#160;Electronic Resources<br/> Polarization Effects in Semiconductors From Ab Initio Theory to Device Applications ent://SD_ILS/0/SD_ILS:153300 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Wood, Colin. editor.<br/><a href="https://doi.org/10.1007/978-0-387-68319-5">https://doi.org/10.1007/978-0-387-68319-5</a><br/>Format:&#160;Electronic Resources<br/> Fundamentals of Power Semiconductor Devices ent://SD_ILS/0/SD_ILS:153143 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Baliga, B. Jayant. author.<br/><a href="https://doi.org/10.1007/978-0-387-47314-7">https://doi.org/10.1007/978-0-387-47314-7</a><br/>Format:&#160;Electronic Resources<br/> Semiconductor Device Physics and Design ent://SD_ILS/0/SD_ILS:155472 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Mishra, Umesh. author.<br/><a href="https://doi.org/10.1007/978-1-4020-6481-4">https://doi.org/10.1007/978-1-4020-6481-4</a><br/>Format:&#160;Electronic Resources<br/> ESD Protection Device and Circuit Design for Advanced CMOS Technologies ent://SD_ILS/0/SD_ILS:141724 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Semenov, Oleg. author.<br/><a href="https://doi.org/10.1007/978-1-4020-8301-3">https://doi.org/10.1007/978-1-4020-8301-3</a><br/>Format:&#160;Electronic Resources<br/> Physical Limitations of Semiconductor Devices ent://SD_ILS/0/SD_ILS:136528 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Vashchenko, Vladislav A. author.<br/><a href="https://doi.org/10.1007/978-0-387-74514-5">https://doi.org/10.1007/978-0-387-74514-5</a><br/>Format:&#160;Electronic Resources<br/> Power Management of Digital Circuits in Deep Sub-Micron CMOS Technologies ent://SD_ILS/0/SD_ILS:140169 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Henzler, Stephan. author.<br/><a href="https://doi.org/10.1007/1-4020-5081-X">https://doi.org/10.1007/1-4020-5081-X</a><br/>Format:&#160;Electronic Resources<br/> Low Power VCO Design in CMOS ent://SD_ILS/0/SD_ILS:135282 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Tiebout, Marc. author.<br/><a href="https://doi.org/10.1007/3-540-29256-X">https://doi.org/10.1007/3-540-29256-X</a><br/>Format:&#160;Electronic Resources<br/> Fundamentals of Solid State Engineering ent://SD_ILS/0/SD_ILS:136130 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Razeghi, Manijeh. author.<br/><a href="https://doi.org/10.1007/0-387-28751-5">https://doi.org/10.1007/0-387-28751-5</a><br/>Format:&#160;Electronic Resources<br/> Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK ent://SD_ILS/0/SD_ILS:167149 2025-02-07T10:39:38Z 2025-02-07T10:39:38Z by&#160;Cullis, A.G. editor.<br/><a href="https://doi.org/10.1007/3-540-31915-8">https://doi.org/10.1007/3-540-31915-8</a><br/>Format:&#160;Electronic Resources<br/>