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8 sonuç bulundu Arama sonuçlarına abone ol
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1. 
Measuring Signal Generators Theory & Design için kapak resmi
Measuring Signal Generators Theory & Design
by 
Rybin, Yu. K. author.
https://doi.org/10.1007/978-3-319-02833-0
Format: 
Alıntı: 
Measuring instruments.
2. 
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors için kapak resmi
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
by 
Im, Seongil. author.
https://doi.org/10.1007/978-94-007-6392-0
Format: 
Alıntı: 
Measuring instruments.
3. 
On-Chip Instrumentation Design and Debug for Systems on Chip için kapak resmi
On-Chip Instrumentation Design and Debug for Systems on Chip
by 
Stollon, Neal. author.
https://doi.org/10.1007/978-1-4419-7563-8
Format: 
Alıntı: 
Measuring instruments.
4. 
Electronic Circuits Handbook for Design and Application için kapak resmi
Electronic Circuits Handbook for Design and Application
by 
Tietze, Ulrich. author.
https://doi.org/10.1007/978-3-540-78655-9
Format: 
Alıntı: 
Measuring instruments.
5. 
True Visions The Emergence of Ambient Intelligence için kapak resmi
True Visions The Emergence of Ambient Intelligence
by 
Aarts, Emile H.L. editor.
https://doi.org/10.1007/978-3-540-28974-6
Format: 
Alıntı: 
Measuring instruments.
6. 
Precision Temperature Sensors in CMOS Technology için kapak resmi
Precision Temperature Sensors in CMOS Technology
by 
Pertijs, Micheal A.P. author.
https://doi.org/10.1007/1-4020-5258-8
Format: 
Alıntı: 
Measuring instruments.
7. 
Dynamic Characterisation of Analogue-to-Digital Converters için kapak resmi
Dynamic Characterisation of Analogue-to-Digital Converters
by 
Dallet, Dominique. editor.
https://doi.org/10.1007/b136458
Format: 
Alıntı: 
Measuring instruments.
8. 
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK için kapak resmi
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
by 
Cullis, A.G. editor.
https://doi.org/10.1007/3-540-31915-8
Format: 
Alıntı: 
Measuring instruments.
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