Arama Sonuçlarını Sınırlandır
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SpringerLink (Online service)
(25)
Beaurepaire, Eric. editor.
(2)
Bulou, Hervé. editor.
(2)
Cullis, A.G. editor.
(2)
Scheurer, Fabrice. editor.
(2)
Dil
Yayın Yılı
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Konu
Measurement Science and Instrumentation.
(25)
Measurement.
(25)
Spectroscopy.
(25)
Spectrum analysis.
(25)
Condensed Matter Physics.
(15)
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25 sonuç bulundu Arama sonuçlarına abone ol
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1. 
Astronomical Measurement A Concise Guide için kapak resmi
Astronomical Measurement A Concise Guide
by 
Lawrence, Andy. author.
https://doi.org/10.1007/978-3-642-39835-3
Format: 
Alıntı: 
Spectrum analysis.
2. 
Dynamic Pulsed-Field-Gradient NMR için kapak resmi
Dynamic Pulsed-Field-Gradient NMR
by 
Sørland, Geir Humborstad. author.
https://doi.org/10.1007/978-3-662-44500-6
Format: 
Alıntı: 
Spectrum analysis.
3. 
Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes için kapak resmi
Historical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes
by 
Yoshimura, Nagamitsu. author.
https://doi.org/10.1007/978-4-431-54448-7
Format: 
Alıntı: 
Spectrum analysis.
4. 
Dynamic Studies Through Control of Relaxation in NMR Spectroscopy için kapak resmi
Dynamic Studies Through Control of Relaxation in NMR Spectroscopy
by 
Salvi, Nicola. author.
https://doi.org/10.1007/978-3-319-06170-2
Format: 
Alıntı: 
Spectrum analysis.
5. 
Theoretical Concepts of X-Ray Nanoscale Analysis Theory and Applications için kapak resmi
Theoretical Concepts of X-Ray Nanoscale Analysis Theory and Applications
by 
Benediktovich, Andrei. author.
https://doi.org/10.1007/978-3-642-38177-5
Format: 
Alıntı: 
Spectrum analysis.
6. 
Fundamental Physics in Particle Traps için kapak resmi
Fundamental Physics in Particle Traps
by 
Quint, Wolfgang. editor.
https://doi.org/10.1007/978-3-642-45201-7
Format: 
Alıntı: 
Spectrum analysis.
7. 
Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications için kapak resmi
Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications
by 
Haschke, Michael. author.
https://doi.org/10.1007/978-3-319-04864-2
Format: 
Alıntı: 
Spectrum analysis.
8. 
Magnetism and Synchrotron Radiation: Towards the Fourth Generation Light Sources Proceedings of the 6th International School "Synchrotron Radiation and Magnetism", Mittelwihr (France), 2012 için kapak resmi
Magnetism and Synchrotron Radiation: Towards the Fourth Generation Light Sources Proceedings of the 6th International School "Synchrotron Radiation and Magnetism", Mittelwihr (France), 2012
by 
Beaurepaire, Eric. editor.
https://doi.org/10.1007/978-3-319-03032-6
Format: 
Alıntı: 
Spectrum analysis.
9. 
Acoustical Imaging Volume 31 için kapak resmi
Acoustical Imaging Volume 31
by 
Nowicki, Andrzej. editor.
https://doi.org/10.1007/978-94-007-2619-2
Format: 
Alıntı: 
Spectrum analysis.
10. 
Semiconductor Research Experimental Techniques için kapak resmi
Semiconductor Research Experimental Techniques
by 
Patane, Amalia. editor.
https://doi.org/10.1007/978-3-642-23351-7
Format: 
Alıntı: 
Spectrum analysis.
11. 
New Horizons of Applied Scanning Electron Microscopy için kapak resmi
New Horizons of Applied Scanning Electron Microscopy
by 
Shimizu, Kenichi. author.
https://doi.org/10.1007/978-3-642-03160-1
Format: 
Alıntı: 
Spectrum analysis.
12. 
Ion Beams in Nanoscience and Technology için kapak resmi
Ion Beams in Nanoscience and Technology
by 
Hellborg, Ragnar. editor.
https://doi.org/10.1007/978-3-642-00623-4
Format: 
Alıntı: 
Spectrum analysis.
13. 
Surface and Interface Analysis An Electrochemists Toolbox için kapak resmi
Surface and Interface Analysis An Electrochemists Toolbox
by 
Holze, Rudolf. author.
https://doi.org/10.1007/978-3-540-49829-2
Format: 
Alıntı: 
Spectrum analysis.
14. 
Explosives Detection using Magnetic and Nuclear Resonance Techniques için kapak resmi
Explosives Detection using Magnetic and Nuclear Resonance Techniques
by 
Fraissard, Jacques. editor.
https://doi.org/10.1007/978-90-481-3062-7
Format: 
Alıntı: 
Spectrum analysis.
15. 
Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK için kapak resmi
Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK
by 
Cullis, A.G. editor.
https://doi.org/10.1007/978-1-4020-8615-1
Format: 
Alıntı: 
Spectrum analysis.
16. 
Mid-Infrared Coherent Sources and Applications için kapak resmi
Mid-Infrared Coherent Sources and Applications
by 
Ebrahim-Zadeh, Majid. editor.
https://doi.org/10.1007/978-1-4020-6463-0
Format: 
Alıntı: 
Spectrum analysis.
17. 
Vacuum Technology Practice for Scientific Instruments için kapak resmi
Vacuum Technology Practice for Scientific Instruments
by 
Yoshimura, Nagamitsu. author.
https://doi.org/10.1007/978-3-540-74433-7
Format: 
Alıntı: 
Spectrum analysis.
18. 
Science of Microscopy için kapak resmi
Science of Microscopy
by 
Hawkes, P.W. editor.
https://doi.org/10.1007/978-0-387-49762-4
Format: 
Alıntı: 
Spectrum analysis.
19. 
Very High Resolution Photoelectron Spectroscopy için kapak resmi
Very High Resolution Photoelectron Spectroscopy
by 
Hüfner, Stephan. editor.
https://doi.org/10.1007/3-540-68133-7
Format: 
Alıntı: 
Spectrum analysis.
20. 
Square-Wave Voltammetry Theory and Application için kapak resmi
Square-Wave Voltammetry Theory and Application
by 
Mirceski, Valentin. author.
https://doi.org/10.1007/978-3-540-73740-7
Format: 
Alıntı: 
Spectrum analysis.
21. 
Magnetism: A Synchrotron Radiation Approach için kapak resmi
Magnetism: A Synchrotron Radiation Approach
by 
Beaurepaire, Eric. editor.
https://doi.org/10.1007/b11594864
Format: 
Alıntı: 
Spectrum analysis.
22. 
Radiation Detectors for Medical Applications için kapak resmi
Radiation Detectors for Medical Applications
by 
Tavernier, Stefaan. editor.
https://doi.org/10.1007/1-4020-5093-3
Format: 
Alıntı: 
Spectrum analysis.
23. 
Numerical and Practical Exercises in Thermoluminescence için kapak resmi
Numerical and Practical Exercises in Thermoluminescence
by 
Pagonis, Vasilis. author.
https://doi.org/10.1007/0-387-30090-2
Format: 
Alıntı: 
Spectrum analysis.
24. 
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK için kapak resmi
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
by 
Cullis, A.G. editor.
https://doi.org/10.1007/3-540-31915-8
Format: 
Alıntı: 
Spectrum analysis.
25. 
Parametric X-Ray Radiation in Crystals Theory, Experiment and Applications için kapak resmi
Parametric X-Ray Radiation in Crystals Theory, Experiment and Applications
by 
Baryshevsky, Vladimir G. author.
https://doi.org/10.1007/b95327
Format: 
Alıntı: 
Spectrum analysis.