Search Results for Spectrum analysis.

1.

Electronic Properties of Graphene Heterostructures with Hexagonal Crystals

by

Wallbank, John R. author.

https://doi.org/10.1007/978-3-319-07722-2

Format:

Alıntı:

Spectrum analysis.

2.

Issues in Contemporary Oil Paint

by

Burnstock, Aviva. editor.

https://doi.org/10.1007/978-3-319-10100-2

Format:

Alıntı:

Spectrum analysis.

3.

Surface Microscopy with Low Energy Electrons

by

Bauer, Ernst. author.

https://doi.org/10.1007/978-1-4939-0935-3

Format:

Alıntı:

Spectrum analysis.

4.

In-situ Materials Characterization Across Spatial and Temporal Scales

by

Ziegler, Alexander. editor.

https://doi.org/10.1007/978-3-642-45152-2

Format:

Alıntı:

Spectrum analysis.

5.

Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications

by

Haschke, Michael. author.

https://doi.org/10.1007/978-3-319-04864-2

Format:

Alıntı:

Spectrum analysis.

6.

$Transmission Electron Microscopy and Diffractometry of Materials için kapak resmi$

Transmission Electron Microscopy and Diffractometry of Materials

by

Fultz, Brent. author.

https://doi.org/10.1007/978-3-642-29761-8

Format:

Alıntı:

Spectrum analysis.

7.

Theory of Bilayer Graphene Spectroscopy

by

Mucha-Kruczyński, Marcin. author.

https://doi.org/10.1007/978-3-642-30936-6

Format:

Alıntı:

Spectrum analysis.

8.

Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine

by

Fesenko, Olena. editor.

https://doi.org/10.1007/978-1-4614-7675-7

Format:

Alıntı:

Spectrum analysis.

9.

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science A User-Oriented Guide

by

Hofmann, Siegfried. author.

https://doi.org/10.1007/978-3-642-27381-0

Format:

Alıntı:

Spectrum analysis.

10.

New Horizons of Applied Scanning Electron Microscopy

by

Shimizu, Kenichi. author.

https://doi.org/10.1007/978-3-642-03160-1

Format:

Alıntı:

Spectrum analysis.

11.

Theoretical Surface Science A Microscopic Perspective

by

Groß, Axel. author.

https://doi.org/10.1007/978-3-540-68969-0

Format:

Alıntı:

Spectrum analysis.

12.

Surface and Interface Analysis An Electrochemists Toolbox

by

Holze, Rudolf. author.

https://doi.org/10.1007/978-3-540-49829-2

Format:

Alıntı:

Spectrum analysis.

13.

Angle and Spin Resolved Auger Emission Theory and Applications to Atoms and Molecules

by

Lohmann, Bernd. author.

https://doi.org/10.1007/978-3-540-74630-0

Format:

Alıntı:

Spectrum analysis.

14.

Applied Scanning Probe Methods XII Characterization

by

Bhushan, Bharat. editor.

https://doi.org/10.1007/978-3-540-85039-7

Format:

Alıntı:

Spectrum analysis.

15.

Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications

by

Bhushan, Bharat. editor.

https://doi.org/10.1007/978-3-540-85049-6

Format:

Alıntı:

Spectrum analysis.

16.

Solid State Theory An Introduction

by

Rössler, Ulrich. author.

https://doi.org/10.1007/978-3-540-92762-4

Format:

Alıntı:

Spectrum analysis.

17.

X-ray and Neutron Reflectivity Principles and Applications

by

Daillant, Jean. editor.

https://doi.org/10.1007/978-3-540-88588-7

Format:

Alıntı:

Spectrum analysis.

18.

Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques

by

Bhushan, Bharat. editor.

https://doi.org/10.1007/978-3-540-85037-3

Format:

Alıntı:

Spectrum analysis.

19.

$Transmission Electron Microscopy and Diffractometry of Materials için kapak resmi$

Transmission Electron Microscopy and Diffractometry of Materials

by

Fultz, Brent. author.

https://doi.org/10.1007/978-3-540-73886-2

Format:

Alıntı:

Spectrum analysis.

20.

Applied Scanning Probe Methods IX Characterization

by

Bhushan, Bharat. editor.

https://doi.org/10.1007/978-3-540-74083-4

Format:

Alıntı:

Spectrum analysis.

21.

Applied Scanning Probe Methods X Biomimetics and Industrial Applications

by

Bhushan, Bharat. editor.

https://doi.org/10.1007/978-3-540-74085-8

Format:

Alıntı:

Spectrum analysis.

22.

Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques

by

Bhushan, Bharat. editor.

https://doi.org/10.1007/978-3-540-74080-3

Format:

Alıntı:

Spectrum analysis.

23.

Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging Volume I Materials Physics - Materials Mechanics. Volume II Physical Design - Reliability and Packaging

by

Suhir, Ephraim. editor.

https://doi.org/10.1007/0-387-32989-7

Format:

Alıntı:

Spectrum analysis.

24.

Very High Resolution Photoelectron Spectroscopy

by

Hüfner, Stephan. editor.

https://doi.org/10.1007/3-540-68133-7

Format:

Alıntı:

Spectrum analysis.

25.

Light Scattering in Solids IX Novel Materials and Techniques

by

Cardona, Manuel. editor.

https://doi.org/10.1007/b14231

Format:

Alıntı:

Spectrum analysis.

26.

Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques

by

Bhushan, Bharat. editor.

https://doi.org/10.1007/978-3-540-37316-2

Format:

Alıntı:

Spectrum analysis.

27.

Fundamentals of Nanoscale Film Analysis

by

Alford, Terry L. author.

https://doi.org/10.1007/978-0-387-29261-8

Format:

Alıntı:

Spectrum analysis.

28.

Springer Handbook of Electronic and Photonic Materials

by

Kasap, Safa. editor.

https://doi.org/10.1007/978-0-387-29185-7

Format:

Alıntı:

Spectrum analysis.

29.

Surface-Enhanced Raman Scattering Physics and Applications

by

Kneipp, Katrin. editor.

https://doi.org/10.1007/3-540-33567-6

Format:

Alıntı:

Spectrum analysis.

30.

Applied Scanning Probe Methods III Characterization

by

Bhushan, Bharat. editor.

https://doi.org/10.1007/b138285

Format:

Alıntı:

Spectrum analysis.

31.

Applied Scanning Probe Methods IV Industrial Applications

by

Bhushan, Bharat. editor.

https://doi.org/10.1007/b138289

Format:

Alıntı:

Spectrum analysis.

32.

Neutron and X-ray Spectroscopy

by

Hippert, Françoise. editor.

https://doi.org/10.1007/1-4020-3337-0

Format:

Alıntı:

Spectrum analysis.

33.

Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques

by

Bhushan, Bharat. editor.

https://doi.org/10.1007/b139097

Format:

Alıntı:

Spectrum analysis.

34.

Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents

by

Foster, Adam. author.

https://doi.org/10.1007/0-387-37231-8

Format:

Alıntı:

Spectrum analysis.

35.

Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice.

by

Giannuzzi, Lucille A. editor.

https://doi.org/10.1007/b101190

Format:

Alıntı:

Spectrum analysis.

36.

Materials for Information Technology Devices, Interconnects and Packaging

by

Zschech, Ehrenfried. editor.

https://doi.org/10.1007/1-84628-235-7

Format:

Alıntı:

Spectrum analysis.

37.

Thin Films and Heterostructures for Oxide Electronics

by

Ogale, Satishchandra B. editor.

https://doi.org/10.1007/b136780

Format:

Alıntı:

Spectrum analysis.

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