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9 sonuç bulundu Arama sonuçlarına abone ol
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1. 
Optical Measurement of Surface Topography için kapak resmi
Optical Measurement of Surface Topography
by 
Leach, Richard. editor.
https://doi.org/10.1007/978-3-642-12012-1
Format: 
Alıntı: 
Optical Measurement of Surface Topography Leach, Richard. editor.
2. 
Characterisation of Ferroelectric Bulk Materials and Thin Films için kapak resmi
Characterisation of Ferroelectric Bulk Materials and Thin Films
by 
Cain, Markys G. editor.
https://doi.org/10.1007/978-1-4020-9311-1
Format: 
Alıntı: 
Springer Series in Measurement Science and Technology,
3. 
Studying Complex Surface Dynamical Systems Using Helium-3 Spin-Echo Spectroscopy için kapak resmi
Studying Complex Surface Dynamical Systems Using Helium-3 Spin-Echo Spectroscopy
by 
Lechner, Barbara A. J. author.
https://doi.org/10.1007/978-3-319-01180-6
Format: 
Alıntı: 
Measurement Science and Instrumentation.
4. 
Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications için kapak resmi
Laboratory Micro-X-Ray Fluorescence Spectroscopy Instrumentation and Applications
by 
Haschke, Michael. author.
https://doi.org/10.1007/978-3-319-04864-2
Format: 
Alıntı: 
Measurement Science and Instrumentation.
5. 
New Horizons of Applied Scanning Electron Microscopy için kapak resmi
New Horizons of Applied Scanning Electron Microscopy
by 
Shimizu, Kenichi. author.
https://doi.org/10.1007/978-3-642-03160-1
Format: 
Alıntı: 
Measurement Science and Instrumentation.
6. 
Surface and Interface Analysis An Electrochemists Toolbox için kapak resmi
Surface and Interface Analysis An Electrochemists Toolbox
by 
Holze, Rudolf. author.
https://doi.org/10.1007/978-3-540-49829-2
Format: 
Alıntı: 
Measurement Science and Instrumentation.
7. 
Very High Resolution Photoelectron Spectroscopy için kapak resmi
Very High Resolution Photoelectron Spectroscopy
by 
Hüfner, Stephan. editor.
https://doi.org/10.1007/3-540-68133-7
Format: 
Alıntı: 
Measurement Science and Instrumentation.
8. 
Nanoscale Devices - Fundamentals and Applications için kapak resmi
Nanoscale Devices - Fundamentals and Applications
by 
Gross, Rudolf. editor.
https://doi.org/10.1007/978-1-4020-5107-4
Format: 
Alıntı: 
Measurement Science and Instrumentation.
9. 
Integrated Chemical Microsensor Systems in CMOS Technology için kapak resmi
Integrated Chemical Microsensor Systems in CMOS Technology
by 
Hierlemann, Andreas. author.
https://doi.org/10.1007/b138987
Format: 
Alıntı: 
Measurement Science and Instrumentation.